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Craig Hall
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Allen, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Simple scatterometry structure for Si recess etch control
Patent number
9,006,001
Issue date
Apr 14, 2015
Texas Instruments Incorporated
Vladimir Alexeevich Ukraintsev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods to selectively protect NMOS regions, PMOS regions, and gate...
Patent number
7,514,309
Issue date
Apr 7, 2009
Texas Instruments Incorporated
Seetharaman Sridhar
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Simple Scatterometry Structure for Si Recess Etch Control
Publication number
20090159937
Publication date
Jun 25, 2009
TEXAS INSTRUMENTS INCORPORATED
Vladimir Alexeevich Ukraintsev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRENCH ISOLATION STRUCTURE AND METHOD OF MANUFACTURE THEREFOR
Publication number
20080283935
Publication date
Nov 20, 2008
TEXAS INSTRUMENTS INCORPORATED
Seetharaman Sridhar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for reducing polysilicon gate defects in semiconductor devices
Publication number
20080248640
Publication date
Oct 9, 2008
Texas Instruments Inc.
Yiming Gu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods to selectively protect NMOS regions, PMOS regions, and gate...
Publication number
20070020839
Publication date
Jan 25, 2007
TEXAS INSTRUMENTS INCORPORATED
Seetharaman Sridhar
H01 - BASIC ELECTRIC ELEMENTS