Daigo Fukuma

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample analyzer and computer program product
- Patent number 11,921,106
- Issue date Mar 5, 2024
- Sysmex Corporation
- Takaaki Nagai
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Sample testing method for automated control of sample retesting
- Patent number 11,635,442
- Issue date Apr 25, 2023
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Blood analyzer, blood analyzing method, and program
- Patent number 11,635,382
- Issue date Apr 25, 2023
- Sysmex Corporation
- Osamu Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Sample testing system with automated control of sample retesting
- Patent number 11,630,115
- Issue date Apr 18, 2023
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and computer program product
- Patent number 11,415,575
- Issue date Aug 16, 2022
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and computer program product
- Patent number 10,401,350
- Issue date Sep 3, 2019
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and computer program product
- Patent number 10,401,351
- Issue date Sep 3, 2019
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus and rack
- Patent number 10,234,364
- Issue date Mar 19, 2019
- SYSMEX CORPORATION
- Takaaki Nagai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample analyzer and computer program product
- Patent number 10,209,244
- Issue date Feb 19, 2019
- Sysmex Corporation
- Takaaki Nagai
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Sample analyzer and computer program product
- Patent number 10,151,746
- Issue date Dec 11, 2018
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and computer program product
- Patent number 9,933,414
- Issue date Apr 3, 2018
- SYSMEX CORPORATION
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer
- Patent number 9,816,983
- Issue date Nov 14, 2017
- SYSMEX CORPORATION
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus and rack
- Patent number 9,733,161
- Issue date Aug 15, 2017
- SYSMEX CORPORATION
- Takaaki Nagai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample processing apparatus
- Patent number 9,638,610
- Issue date May 2, 2017
- SYSMEX CORPORATION
- Takaaki Nagai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Specimen analysis system, specimen analyzer, and specimen analysis...
- Patent number 9,618,363
- Issue date Apr 11, 2017
- Sysmex Corporation
- Tetsuya Oda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Sample analyzer, sample analyzing method, and sample analyzing system
- Patent number 9,513,282
- Issue date Dec 6, 2016
- Sysmex Corporation
- Takuma Katou
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus and measurement unit
- Patent number 9,417,254
- Issue date Aug 16, 2016
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Information management apparatus and sample testing apparatus that...
- Patent number 9,285,379
- Issue date Mar 15, 2016
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample testing apparatus
- Patent number 9,268,914
- Issue date Feb 23, 2016
- Sysmex Corporation
- Yuichi Hamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample processing apparatus and cleaning method
- Patent number 9,217,750
- Issue date Dec 22, 2015
- Sysmex Corporation
- Masaharu Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus and method for controlling a sample pro...
- Patent number 9,164,110
- Issue date Oct 20, 2015
- Sysmex Corporation
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus and sample processing method
- Patent number 9,134,333
- Issue date Sep 15, 2015
- Sysmex Corporation
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer, sample transportation method, and computer program product
- Patent number 9,134,331
- Issue date Sep 15, 2015
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and computer program product
- Patent number 8,968,661
- Issue date Mar 3, 2015
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer
- Patent number 8,968,653
- Issue date Mar 3, 2015
- Sysmex Corporation
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Grant
Sample testing system with automated control of sample retesting
- Patent number 8,956,569
- Issue date Feb 17, 2015
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and sample analyzing method
- Patent number 8,945,470
- Issue date Feb 3, 2015
- SYSMEX CORPORATION
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and information writing method
- Patent number 8,894,931
- Issue date Nov 25, 2014
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus and a method of controlling a sample pr...
- Patent number 8,889,069
- Issue date Nov 18, 2014
- Sysmex Corporation
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Grant
Sample testing system and transporting apparatus
- Patent number 8,883,078
- Issue date Nov 11, 2014
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MANAGEMENT METHOD, INFORMATION PROCESSING APPARATUS, INFORMATION MA...
- Publication number 20230393166
- Publication date Dec 7, 2023
- SYSMEX CORPORATION
- ATSUSHI SHIRAKAMI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
TRANSPORT METHOD, CONTROL METHOD, AND ANALYSIS SYSTEM
- Publication number 20230384336
- Publication date Nov 30, 2023
- SYSMEX CORPORATION
- Atsushi KUMAGAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR APPLYING CONTROL REFERENCE VALUE TO SPECIMEN ANALYZER, S...
- Publication number 20230273609
- Publication date Aug 31, 2023
- SYSMEX CORPORATION
- Kei SHIRASUNA
- G05 - CONTROLLING REGULATING
Information Patent Application
SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING
- Publication number 20230243858
- Publication date Aug 3, 2023
- SYSMEX CORPORATION
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
BLOOD ANALYZER, BLOOD ANALYZING METHOD, AND PROGRAM
- Publication number 20230089109
- Publication date Mar 23, 2023
- SYSMEX CORPORATION
- Osamu KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20220170912
- Publication date Jun 2, 2022
- SYSMEX CORPORATION
- Takaaki Nagai
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING
- Publication number 20220170952
- Publication date Jun 2, 2022
- SYSMEX CORPORATION
- Yuichi Hamada
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING
- Publication number 20210325413
- Publication date Oct 21, 2021
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20190339258
- Publication date Nov 7, 2019
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING
Information Patent Application
Sample Analyzer and Computer Program Product
- Publication number 20190219568
- Publication date Jul 18, 2019
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20190170733
- Publication date Jun 6, 2019
- SYSMEX CORPORATION
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20190107533
- Publication date Apr 11, 2019
- SYSMEX CORPORATION
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
BLOOD ANALYZER, BLOOD ANALYZING METHOD, AND PROGRAM
- Publication number 20190049383
- Publication date Feb 14, 2019
- SYSMEX CORPORATION
- Osamu KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20180188236
- Publication date Jul 5, 2018
- SYSMEX CORPORATION
- Takaaki Nagai
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
BLOOD SAMPLE TESTING APPARATUS AND BLOOD SAMPLE TESTING METHOD
- Publication number 20180088021
- Publication date Mar 29, 2018
- SYSMEX CORPORATION
- Tetsuya ODA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND RACK
- Publication number 20170363521
- Publication date Dec 21, 2017
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER
- Publication number 20150192573
- Publication date Jul 9, 2015
- SYSMEX CORPORATION
- Daigo FUKUMA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND RACK
- Publication number 20150185120
- Publication date Jul 2, 2015
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS
- Publication number 20150185119
- Publication date Jul 2, 2015
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20150132791
- Publication date May 14, 2015
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20150125900
- Publication date May 7, 2015
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING
- Publication number 20150118757
- Publication date Apr 30, 2015
- Sysmex Corporation
- Yuichi HAMADA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYSIS SYSTEM, SPECIMEN ANALYZER, AND SPECIMEN ANALYSIS...
- Publication number 20130317773
- Publication date Nov 28, 2013
- SYSMEX CORPORATION
- Tetsuya ODA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND SAMPLE ANALYZING SYSTEM
- Publication number 20130262143
- Publication date Oct 3, 2013
- SYSMEX CORPORATION
- Takuma KATOU
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20130252276
- Publication date Sep 26, 2013
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND METHOD FOR CONTROLLING A SAMPLE PRO...
- Publication number 20130160533
- Publication date Jun 27, 2013
- SYSMEX CORPORATION
- Daigo FUKUMA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND METHOD FOR CONTROLING A SAMPLE ANALYZER
- Publication number 20130079921
- Publication date Mar 28, 2013
- SYSMEX CORPORATION
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND A METHOD OF CONTROLLING A SAMPLE PR...
- Publication number 20130079919
- Publication date Mar 28, 2013
- SYSMEX CORPORATION
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER
- Publication number 20130065317
- Publication date Mar 14, 2013
- SYSMEX CORPORATION
- Daigo FUKUMA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND DATA PROCESSING APPARATUS
- Publication number 20120283975
- Publication date Nov 8, 2012
- Daigo Fukuma
- G01 - MEASURING TESTING

Daigo Fukuma

Person

Patents Grantslast 30 patents

Sample analyzer and computer program product

Sample testing method for automated control of sample retesting

Blood analyzer, blood analyzing method, and program

Sample testing system with automated control of sample retesting

Sample analyzer and computer program product

Sample analyzer and computer program product

Sample analyzer and computer program product

Sample processing apparatus and rack

Sample analyzer and computer program product

Sample analyzer and computer program product

Sample analyzer and computer program product

Sample analyzer

Sample processing apparatus and rack

Sample processing apparatus

Specimen analysis system, specimen analyzer, and specimen analysis...

Sample analyzer, sample analyzing method, and sample analyzing system

Analysis apparatus and measurement unit

Information management apparatus and sample testing apparatus that...

Sample testing apparatus

Sample processing apparatus and cleaning method

Sample processing apparatus and method for controlling a sample pro...

Sample processing apparatus and sample processing method

Analyzer, sample transportation method, and computer program product

Sample analyzer and computer program product

Sample analyzer

Sample testing system with automated control of sample retesting

Sample analyzer and sample analyzing method

Sample analyzer and information writing method

Sample processing apparatus and a method of controlling a sample pr...

Sample testing system and transporting apparatus

Patents Applicationslast 30 patents

MANAGEMENT METHOD, INFORMATION PROCESSING APPARATUS, INFORMATION MA...

TRANSPORT METHOD, CONTROL METHOD, AND ANALYSIS SYSTEM

METHOD FOR APPLYING CONTROL REFERENCE VALUE TO SPECIMEN ANALYZER, S...

SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING

BLOOD ANALYZER, BLOOD ANALYZING METHOD, AND PROGRAM

SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT

SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING

SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING

SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT

Sample Analyzer and Computer Program Product

SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT

SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT

BLOOD ANALYZER, BLOOD ANALYZING METHOD, AND PROGRAM

SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT

BLOOD SAMPLE TESTING APPARATUS AND BLOOD SAMPLE TESTING METHOD

SAMPLE PROCESSING APPARATUS AND RACK

SAMPLE ANALYZER

SAMPLE PROCESSING APPARATUS AND RACK

SAMPLE PROCESSING APPARATUS

SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT

SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT

SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING

SPECIMEN ANALYSIS SYSTEM, SPECIMEN ANALYZER, AND SPECIMEN ANALYSIS...

SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND SAMPLE ANALYZING SYSTEM

SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT

SAMPLE PROCESSING APPARATUS AND METHOD FOR CONTROLLING A SAMPLE PRO...

SAMPLE ANALYZER AND METHOD FOR CONTROLING A SAMPLE ANALYZER

SAMPLE PROCESSING APPARATUS AND A METHOD OF CONTROLLING A SAMPLE PR...

SAMPLE ANALYZER

SAMPLE ANALYZER AND DATA PROCESSING APPARATUS