TREA

Daiki ONO

Follow

Person

  • Yokohama-shi, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Resonance frequency detector and sensing device
    • Patent number 12,095,469
    • Issue date Sep 17, 2024
    • Kabushiki Kaisha Toshiba
    • Tetsuro Itakura
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 12,019,092
    • Issue date Jun 25, 2024
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,834,326
    • Issue date Dec 5, 2023
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,796,319
    • Issue date Oct 24, 2023
    • Kabushiki Kaisha Toshiba
    • Fumito Miyazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,680,800
    • Issue date Jun 20, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke Gando
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,656,079
    • Issue date May 23, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroki Hiraga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Capacitance detection device
    • Patent number 9,448,255
    • Issue date Sep 20, 2016
    • Kabushiki Kaisha Toshiba
    • Daiki Ono
    • G01 - MEASURING TESTING
  • Information Patent Grant

    MEMS device
    • Patent number 9,274,017
    • Issue date Mar 1, 2016
    • Kabushiki Kaisha Toshiba
    • Naofumi Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Delta/sigma modulator
    • Patent number 8,947,279
    • Issue date Feb 3, 2015
    • Kabushiki Kaisha Toshiba
    • Daiki Ono
    • H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240401949
    • Publication date Dec 5, 2024
    • Kabushiki Kaisha Toshiba
    • Hideaki MURASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240310404
    • Publication date Sep 19, 2024
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20240288270
    • Publication date Aug 29, 2024
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240060777
    • Publication date Feb 22, 2024
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240019248
    • Publication date Jan 18, 2024
    • Kabushiki Kaisha Toshiba
    • Hiroki HIRAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230288202
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND MOVABLE BODY
    • Publication number 20230288445
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    RESONANCE FREQUENCY DETECTOR AND SENSING DEVICE
    • Publication number 20230253972
    • Publication date Aug 10, 2023
    • Kabushiki Kaisha Toshiba
    • Tetsuro ITAKURA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230152099
    • Publication date May 18, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230152097
    • Publication date May 18, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    ATTITUDE ANGLE DERIVATION DEVICE AND ATTITUDE ANGLE SENSOR
    • Publication number 20230143243
    • Publication date May 11, 2023
    • Kabushiki Kaisha Toshiba
    • Daiki ONO
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHASE LOCKED LOOP AND SENSING DEVICE
    • Publication number 20230125664
    • Publication date Apr 27, 2023
    • Kabushiki Kaisha Toshiba
    • Tetsuro ITAKURA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230062441
    • Publication date Mar 2, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220326013
    • Publication date Oct 13, 2022
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220276052
    • Publication date Sep 1, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroki HIRAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220268583
    • Publication date Aug 25, 2022
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220259035
    • Publication date Aug 18, 2022
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20210381831
    • Publication date Dec 9, 2021
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    VARIABLE CAPACITANCE BANK DEVICE
    • Publication number 20160268052
    • Publication date Sep 15, 2016
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SENSOR AND SENSOR SYSTEM
    • Publication number 20160265986
    • Publication date Sep 15, 2016
    • Kabushiki Kaisha Toshiba
    • Daiki ONO
    • G01 - MEASURING TESTING
  • Information Patent Application

    PRESSURE SENSOR AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20150292970
    • Publication date Oct 15, 2015
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    CAPACITANCE DETECTION DEVICE
    • Publication number 20150233972
    • Publication date Aug 20, 2015
    • Kabushiki Kaisha Toshiba
    • Daiki ONO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEMS DEVICE
    • Publication number 20150068314
    • Publication date Mar 12, 2015
    • Kabushiki Kaisha Toshiba
    • Naofumi NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    DELTA/SIGMA MODULATOR
    • Publication number 20150009054
    • Publication date Jan 8, 2015
    • Kabushiki Kaisha Toshiba
    • Daiki ONO
    • H03 - BASIC ELECTRONIC CIRCUITRY