Daisuke Bizen

Person

Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam system and method for determining observation...
- Patent number 12,191,111
- Issue date Jan 7, 2025
- HITACHI HIGH-TECH CORPORATION
- Fumiya Ishizaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method
- Patent number 12,181,513
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Shota Mitsugi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 11,869,745
- Issue date Jan 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and control method
- Patent number 11,610,756
- Issue date Mar 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaori Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,456,150
- Issue date Sep 27, 2022
- HITACHI HIGH-TECH CORPORATION
- Kaori Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle beam apparatus
- Patent number 11,282,671
- Issue date Mar 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Uki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,211,224
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern cross-sectional shape estimation system and program
- Patent number 11,211,226
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and calculation method for three-dimen...
- Patent number 11,164,720
- Issue date Nov 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Kenji Yasui
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and sample observation method using sc...
- Patent number 11,011,348
- Issue date May 18, 2021
- HITACHI HIGH-TECH CORPORATION
- Daisuke Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 10,825,649
- Issue date Nov 3, 2020
- Hitachi, Ltd.
- Yasunari Sohda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning microscope with controlled variable measurement parameters
- Patent number 10,338,367
- Issue date Jul 2, 2019
- Hitachi, Ltd.
- Ryoko Araki
- G02 - OPTICS
Information Patent Grant
Scanning electron microscope and electron trajectory adjustment met...
- Patent number 10,262,830
- Issue date Apr 16, 2019
- Hitachi, Ltd.
- Daisuke Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,217,604
- Issue date Feb 26, 2019
- Hitachi High-Technologies Corporation
- Makoto Sakakibara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and method for controlling same
- Patent number 10,014,160
- Issue date Jul 3, 2018
- Hitachi High-Technologies Corporation
- Kaori Shirahata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, simulation method, and simulation device
- Patent number 9,966,225
- Issue date May 8, 2018
- Hitachi, Ltd.
- Daisuke Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern critical dimension measurement equipment and method for mea...
- Patent number 9,520,266
- Issue date Dec 13, 2016
- Hitachi High-Technologies Corporation
- Kaori Shirahata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and measuring method using the same
- Patent number 9,336,984
- Issue date May 10, 2016
- Hitachi High-Technologies Corporation
- Daisuke Bizen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240363306
- Publication date Oct 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE IMAGE OBSERVATION DEVICE AND METHOD
- Publication number 20240222065
- Publication date Jul 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection System
- Publication number 20240029994
- Publication date Jan 25, 2024
- Hitachi High-Tech Corporation
- Natsuki TSUNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Method
- Publication number 20230273254
- Publication date Aug 31, 2023
- Hitachi High-Tech Corporation
- Shota MITSUGI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20230253180
- Publication date Aug 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Daisuke BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CALCULATING ROUGHNES...
- Publication number 20230095456
- Publication date Mar 30, 2023
- HITACHI HIGH-TECH CORPORATION
- Daisuke BIZEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam System and Method For Determining Observation...
- Publication number 20220246394
- Publication date Aug 4, 2022
- Hitachi High-Tech Corporation
- Fumiya ISHIZAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220216032
- Publication date Jul 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220139667
- Publication date May 5, 2022
- Hitachi High-Tech Corporation
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD
- Publication number 20220115203
- Publication date Apr 14, 2022
- HITACHI HIGH-TECH CORPORATION
- Kaori BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measurement Method, Measurement System, and Computer-Readab...
- Publication number 20210404801
- Publication date Dec 30, 2021
- Ayumi DOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20210313140
- Publication date Oct 7, 2021
- Kaori BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210249221
- Publication date Aug 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Nobuhiro OKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN CROSS-SECTIONAL SHAPE ESTIMATION SYSTEM AND PROGRAM
- Publication number 20200321189
- Publication date Oct 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND CALCULATION METHOD FOR THREE-DIMEN...
- Publication number 20200234916
- Publication date Jul 23, 2020
- Hitachi High-Technologies Corporation
- Kenji YASUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle Beam Apparatus
- Publication number 20200185189
- Publication date Jun 11, 2020
- Hitachi High-Technologies Corporation
- Uki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SC...
- Publication number 20190348255
- Publication date Nov 14, 2019
- Hitachi High-Technologies Corporation
- Daisuke BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM DEVICE
- Publication number 20190295805
- Publication date Sep 26, 2019
- Hitachi, Ltd
- Yasunari SOHDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20180286629
- Publication date Oct 4, 2018
- Hitachi High-Technologies Corporation
- Makoto SAKAKIBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING MICROSCOPE
- Publication number 20180067294
- Publication date Mar 8, 2018
- Hitachi, Ltd
- Ryoko ARAKI
- G02 - OPTICS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND ELECTRON TRAJECTORY ADJUSTMENT MET...
- Publication number 20170263415
- Publication date Sep 14, 2017
- Hitachi, Ltd
- Daisuke BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, SIMULATION METHOD, AND SIMULATION DEVICE
- Publication number 20170213695
- Publication date Jul 27, 2017
- Hitachi, Ltd
- Daisuke BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR CONTROLLING SAME
- Publication number 20170186583
- Publication date Jun 29, 2017
- Hitachi High-Technologies Corporation
- Kaori Shirahata
- G01 - MEASURING TESTING
Information Patent Application
PATTERN CRITICAL DIMENSION MEASUREMENT EQUIPMENT AND METHOD FOR MEA...
- Publication number 20150041648
- Publication date Feb 12, 2015
- Hitachi High-Technologies Corporation
- Kaori Shirahata
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND MEASURING METHOD USING THE SAME
- Publication number 20140299767
- Publication date Oct 9, 2014
- Daisuke Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND LENGTH MEASURING METHOD USING THE...
- Publication number 20130292568
- Publication date Nov 7, 2013
- Daisuke Bizen
- G01 - MEASURING TESTING

Daisuke Bizen

Person

Patents Grantslast 30 patents

Charged particle beam system and method for determining observation...

Inspection method

Charged particle beam device

Charged particle beam apparatus and control method

Charged particle beam device

Charged-particle beam apparatus

Charged particle beam apparatus

Pattern cross-sectional shape estimation system and program

Scanning electron microscope and calculation method for three-dimen...

Scanning electron microscope and sample observation method using sc...

Electron beam device

Scanning microscope with controlled variable measurement parameters

Scanning electron microscope and electron trajectory adjustment met...

Charged particle beam apparatus

Scanning electron microscope and method for controlling same

Charged particle beam device, simulation method, and simulation device

Pattern critical dimension measurement equipment and method for mea...

Charged particle beam device and measuring method using the same

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

SAMPLE IMAGE OBSERVATION DEVICE AND METHOD

Inspection System

Inspection Method

CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CALCULATING ROUGHNES...

Charged Particle Beam System and Method For Determining Observation...

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD

Pattern Measurement Method, Measurement System, and Computer-Readab...

Charged Particle Beam Device

CHARGED PARTICLE BEAM APPARATUS

PATTERN CROSS-SECTIONAL SHAPE ESTIMATION SYSTEM AND PROGRAM

SCANNING ELECTRON MICROSCOPE AND CALCULATION METHOD FOR THREE-DIMEN...

Charged-Particle Beam Apparatus

SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SC...

ELECTRON BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS

SCANNING MICROSCOPE

SCANNING ELECTRON MICROSCOPE AND ELECTRON TRAJECTORY ADJUSTMENT MET...

CHARGED PARTICLE BEAM DEVICE, SIMULATION METHOD, AND SIMULATION DEVICE

SCANNING ELECTRON MICROSCOPE AND METHOD FOR CONTROLLING SAME

PATTERN CRITICAL DIMENSION MEASUREMENT EQUIPMENT AND METHOD FOR MEA...

CHARGED PARTICLE BEAM DEVICE AND MEASURING METHOD USING THE SAME

SCANNING ELECTRON MICROSCOPE AND LENGTH MEASURING METHOD USING THE...