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Daisuke Fujita
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Ibaraki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Emitter, electron gun using same, and electronic device
Patent number
11,721,516
Issue date
Aug 8, 2023
National Institute for Materials Science
Han Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inductor comprising arrayed capacitors
Patent number
9,019,685
Issue date
Apr 28, 2015
National Institute for Materials Science
Satyajit Sahu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Graphene-coated member and process for producing same
Patent number
8,613,811
Issue date
Dec 24, 2013
National Institute for Materials Science
Daisuke Fujita
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Emitter, Electron Gun Using Same, and Electronic Device
Publication number
20220130634
Publication date
Apr 28, 2022
National Institute for Materials Science
Han Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
UNIVERSAL GEOMETRIC-MUSICAL LANGUAGE FOR BIG DATA PROCESSING IN AN...
Publication number
20200160174
Publication date
May 21, 2020
NATIONAL INSTITUTE FOR MATERIALS SCIENCE
Anirban BANDYOPADHYAY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HUMAN BRAIN LIKE INTELLIGENT DECISION-MAKING MACHINE
Publication number
20200160147
Publication date
May 21, 2020
NATIONAL INSTITUTE FOR MATERIALS SCIENCE
Anirban BANDYOPADHYAY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INDUCTOR COMPRISING ARRAYED CAPACITORS
Publication number
20130106538
Publication date
May 2, 2013
Satyajit Sahu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
GRAPHENE-COATED MEMBER AND PROCESS FOR PRODUCING SAME
Publication number
20110265918
Publication date
Nov 3, 2011
national institute for materials science
Daisuke Fujita
B82 - NANO-TECHNOLOGY
Information
Patent Application
Method of preparing silver nano-structure by means of scanning turn...
Publication number
20060248619
Publication date
Nov 2, 2006
Daisuke Fujita
G01 - MEASURING TESTING
Information
Patent Application
Optical fiber probe and scanning probe microscope provided with the...
Publication number
20030085351
Publication date
May 8, 2003
Ken Nakajima
G01 - MEASURING TESTING