Daisuke Kato

Person

Kamakura-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device
- Patent number 7,414,907
- Issue date Aug 19, 2008
- Kabushiki Kaisha Toshiba
- Yasuyuki Kajitani
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 7,251,176
- Issue date Jul 31, 2007
- Kabushiki Kaisha Toshiba
- Yasuyuki Kajitani
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 7,102,947
- Issue date Sep 5, 2006
- Kabushiki Kaisha Toshiba
- Yasuyuki Kajitani
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor storage device formed to optimize test technique and...
- Patent number 7,079,432
- Issue date Jul 18, 2006
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor storage device formed to optimize test technique and...
- Patent number 6,876,588
- Issue date Apr 5, 2005
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 6,856,561
- Issue date Feb 15, 2005
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having redundancy system
- Patent number 6,834,016
- Issue date Dec 21, 2004
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor storage device formed to optimize test technique and...
- Patent number 6,741,509
- Issue date May 25, 2004
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Sense amplifier control circuit of semiconductor memory device
- Patent number 6,674,678
- Issue date Jan 6, 2004
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having redundancy system
- Patent number 6,646,932
- Issue date Nov 11, 2003
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having redundancy system
- Patent number 6,603,689
- Issue date Aug 5, 2003
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 6,552,960
- Issue date Apr 22, 2003
- Kabushiki Kaisha Toshiba
- Yutaka Shirai
- G11 - INFORMATION STORAGE
Information Patent Grant
Sense amplifier control circuit of semiconductor memory device
- Patent number 6,496,435
- Issue date Dec 17, 2002
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device having fuses and fuse latch...
- Patent number 6,373,772
- Issue date Apr 16, 2002
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device of shared sense amplifier system
- Patent number 6,343,038
- Issue date Jan 29, 2002
- Kabushiki Kaisha Toshiba
- Eiichi Makino
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device having fuses and fuse latch...
- Patent number 6,272,061
- Issue date Aug 7, 2001
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with simultaneously activated elements...
- Patent number 6,055,197
- Issue date Apr 25, 2000
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 6,021,061
- Issue date Feb 1, 2000
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with redundancy control circuits
- Patent number 5,991,211
- Issue date Nov 23, 1999
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
MOS semiconductor device with memory cells each having storage capa...
- Patent number 5,969,998
- Issue date Oct 19, 1999
- Kabushiki Kaisha Toshiba
- Yukihito Oowaki
- G11 - INFORMATION STORAGE
Information Patent Grant
MOS semiconductor device with memory cells each having storage capa...
- Patent number 5,870,339
- Issue date Feb 9, 1999
- Kabushiki Kaisha Toshiba
- Yukihito Oowaki
- G11 - INFORMATION STORAGE
Information Patent Grant
MOS semiconductor device with memory cells each having storage capa...
- Patent number 5,638,329
- Issue date Jun 10, 1997
- Kabushiki Kaisha Toshiba
- Yukihito Oowaki
- G11 - INFORMATION STORAGE
Information Patent Grant
MOS semiconductor device with memory cells each having storage capa...
- Patent number 5,426,604
- Issue date Jun 20, 1995
- Kabushiki Kaisha Toshiba
- Yukihito Oowaki
- G11 - INFORMATION STORAGE
Information Patent Grant
MOS semiconductor device with memory cells each having storage capa...
- Patent number 5,299,154
- Issue date Mar 29, 1994
- Kabushiki Kaisha Toshiba
- Yukihito Oowaki
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY DEVICE WITH COLUMN TO BE SELECTED BY BIT LINE...
- Publication number 20080031065
- Publication date Feb 7, 2008
- Yasuyuki Kajitani
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Memory Device
- Publication number 20070258303
- Publication date Nov 8, 2007
- Yasuyuki Kajitani
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20060256625
- Publication date Nov 16, 2006
- Yasuyuki Kajitani
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device with column to be selected by bit line...
- Publication number 20060171226
- Publication date Aug 3, 2006
- Yasuyuki Kajitani
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20050226081
- Publication date Oct 13, 2005
- Yasuyuki Kajitani
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor storage device formed to optimize test technique and...
- Publication number 20050122802
- Publication date Jun 9, 2005
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor storage device formed to optimize test technique and...
- Publication number 20040062134
- Publication date Apr 1, 2004
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20040057309
- Publication date Mar 25, 2004
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device having redundancy system
- Publication number 20030206452
- Publication date Nov 6, 2003
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Application
Sense amplifier control circuit of semiconductor memory device
- Publication number 20030031071
- Publication date Feb 13, 2003
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20020179943
- Publication date Dec 5, 2002
- Yutaka Shirai
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20020181303
- Publication date Dec 5, 2002
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor storage device formed to optimize test technique and...
- Publication number 20020114198
- Publication date Aug 22, 2002
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device having redundancy system
- Publication number 20020093860
- Publication date Jul 18, 2002
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE
Information Patent Application
Sense amplifier control circuit of semiconductor memory device
- Publication number 20020089888
- Publication date Jul 11, 2002
- Daisuke Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
semiconductor integrated circuit device having fuses and fuse latch...
- Publication number 20010030901
- Publication date Oct 18, 2001
- Kabushiki Kaisha Toshiba
- Daisuke Kato
- G11 - INFORMATION STORAGE

Daisuke Kato

Person

Patents Grantslast 30 patents

Semiconductor memory device

Semiconductor memory device

Semiconductor memory device

Semiconductor storage device formed to optimize test technique and...

Semiconductor storage device formed to optimize test technique and...

Semiconductor memory device

Semiconductor memory device having redundancy system

Semiconductor storage device formed to optimize test technique and...

Sense amplifier control circuit of semiconductor memory device

Semiconductor memory device having redundancy system

Semiconductor memory device having redundancy system

Semiconductor integrated circuit device

Sense amplifier control circuit of semiconductor memory device

Semiconductor integrated circuit device having fuses and fuse latch...

Semiconductor memory device of shared sense amplifier system

Semiconductor integrated circuit device having fuses and fuse latch...

Semiconductor memory device with simultaneously activated elements...

Semiconductor memory device

Semiconductor memory device with redundancy control circuits

MOS semiconductor device with memory cells each having storage capa...

MOS semiconductor device with memory cells each having storage capa...

MOS semiconductor device with memory cells each having storage capa...

MOS semiconductor device with memory cells each having storage capa...

MOS semiconductor device with memory cells each having storage capa...

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY DEVICE WITH COLUMN TO BE SELECTED BY BIT LINE...

Semiconductor Memory Device

Semiconductor memory device

Semiconductor memory device with column to be selected by bit line...

Semiconductor memory device

Semiconductor storage device formed to optimize test technique and...

Semiconductor storage device formed to optimize test technique and...

Semiconductor memory device

Semiconductor memory device having redundancy system

Sense amplifier control circuit of semiconductor memory device

Semiconductor integrated circuit device

Semiconductor memory device

Semiconductor storage device formed to optimize test technique and...

Semiconductor memory device having redundancy system

Sense amplifier control circuit of semiconductor memory device

semiconductor integrated circuit device having fuses and fuse latch...