Daisuke KOIZUMI

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wireless environment evaluation method and wireless communicaton sy...
- Patent number 10,681,735
- Issue date Jun 9, 2020
- Nippon Telegraph and Telephone Corporation
- Akiyoshi Inoki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Tray in combination with electronic component attaching tool attach...
- Patent number 8,671,557
- Issue date Mar 18, 2014
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
IC socket with attached electronic component
- Patent number 8,051,554
- Issue date Nov 8, 2011
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Component for testing device for electronic component and testing m...
- Patent number 7,977,961
- Issue date Jul 12, 2011
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Contactor and test method using contactor
- Patent number 7,825,676
- Issue date Nov 2, 2010
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Contactor for electronic components and test method using the same
- Patent number 7,518,388
- Issue date Apr 14, 2009
- Fujitsu Microelectronics Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component attaching tool
- Patent number 7,430,798
- Issue date Oct 7, 2008
- Fujitsu Limited
- Daisuke Koizumi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Contactor having contact electrodes of metal springs embedded in a...
- Patent number 7,403,024
- Issue date Jul 22, 2008
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Contactor for electronic components and test method using the same
- Patent number 7,309,996
- Issue date Dec 18, 2007
- Fujitsu Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Contactor for testing miniaturized devices and components
- Patent number 6,927,343
- Issue date Aug 9, 2005
- Fujitsu Limited
- Naoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method of attaching electronic component and electronic component a...
- Patent number 6,924,174
- Issue date Aug 2, 2005
- Fujitsu Limited
- Daisuke Koizumi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Contactor for testing semiconductor device and manufacturing method...
- Patent number 6,791,345
- Issue date Sep 14, 2004
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and method of testing wafer having a plurality of semico...
- Patent number 6,774,650
- Issue date Aug 10, 2004
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and method of testing wafer having a plurality of semico...
- Patent number 6,563,330
- Issue date May 13, 2003
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate test device and method
- Patent number 6,410,354
- Issue date Jun 25, 2002
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Attachment structure of semiconductor device socket
- Patent number 6,203,332
- Issue date Mar 20, 2001
- Fujitsu Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WIRELESS ENVIRONMENT EVALUATION METHOD AND WIRELESS COMMUNICATON SY...
- Publication number 20190059107
- Publication date Feb 21, 2019
- Nippon Telegraph and Telephone Corporation
- Akiyoshi INOKI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF ATTACHING ELECTRONIC COMPONENT AND ELECTRONIC COMPONENT A...
- Publication number 20120005883
- Publication date Jan 12, 2012
- FUJITSU SEMICONDUCTOR LIMITED
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
COMPONENT FOR TESTING DEVICE FOR ELECTRONIC COMPONENT AND TESTING M...
- Publication number 20090302876
- Publication date Dec 10, 2009
- Fujitsu Microelectronics Limited
- Daisuke KOIZUMI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ATTACHING ELECTRONIC COMPONENT AND ELECTRONIC COMPONENT A...
- Publication number 20080299790
- Publication date Dec 4, 2008
- FUJITSU LIMITED
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Contactor and test method using contactor
- Publication number 20070252608
- Publication date Nov 1, 2007
- FUJITSU LIMITED
- Daisuke Koizumi
- G01 - MEASURING TESTING
Information Patent Application
Method of attaching electronic component and electronic component a...
- Publication number 20050204551
- Publication date Sep 22, 2005
- FUJITSU LIMITED
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Contactor for testing semiconductor device and manufacturing method...
- Publication number 20040266272
- Publication date Dec 30, 2004
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Contactor for electronic components and test method using the same
- Publication number 20040239357
- Publication date Dec 2, 2004
- FUJITSU LIMITED
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Application
Method of attaching electronic component and electronic component a...
- Publication number 20040055150
- Publication date Mar 25, 2004
- FUJITSU LIMITED
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Probe card and method of testing wafer having a plurality of semico...
- Publication number 20030160626
- Publication date Aug 28, 2003
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Contactor for testing miniaturized devices and components
- Publication number 20030127246
- Publication date Jul 10, 2003
- FUJITSU LIMITED
- Naoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Contactor for testing semiconductor device and manufacturing method...
- Publication number 20020105347
- Publication date Aug 8, 2002
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor substrate test device and method
- Publication number 20020031849
- Publication date Mar 14, 2002
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING

Daisuke KOIZUMI

Person

Patents Grantslast 30 patents

Wireless environment evaluation method and wireless communicaton sy...

Tray in combination with electronic component attaching tool attach...

IC socket with attached electronic component

Component for testing device for electronic component and testing m...

Contactor and test method using contactor

Contactor for electronic components and test method using the same

Electronic component attaching tool

Contactor having contact electrodes of metal springs embedded in a...

Contactor for electronic components and test method using the same

Contactor for testing miniaturized devices and components

Method of attaching electronic component and electronic component a...

Contactor for testing semiconductor device and manufacturing method...

Probe card and method of testing wafer having a plurality of semico...

Probe card and method of testing wafer having a plurality of semico...

Semiconductor substrate test device and method

Attachment structure of semiconductor device socket

Patents Applicationslast 30 patents

WIRELESS ENVIRONMENT EVALUATION METHOD AND WIRELESS COMMUNICATON SY...

METHOD OF ATTACHING ELECTRONIC COMPONENT AND ELECTRONIC COMPONENT A...

COMPONENT FOR TESTING DEVICE FOR ELECTRONIC COMPONENT AND TESTING M...

METHOD OF ATTACHING ELECTRONIC COMPONENT AND ELECTRONIC COMPONENT A...

Contactor and test method using contactor

Method of attaching electronic component and electronic component a...

Contactor for testing semiconductor device and manufacturing method...

Contactor for electronic components and test method using the same

Method of attaching electronic component and electronic component a...

Probe card and method of testing wafer having a plurality of semico...

Contactor for testing miniaturized devices and components

Contactor for testing semiconductor device and manufacturing method...

Semiconductor substrate test device and method