Daivid Suitwai Ma

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Cary, NC, US

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Patents Grantslast 30 patents

Information Patent Grant
Wordline gate contact for an MBIT transistor array layout
- Patent number 6,906,371
- Issue date Jun 14, 2005
- Infineon Technologies AG
- Daivid SuitWai Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer testing system
- Patent number 6,888,365
- Issue date May 3, 2005
- Infineon Technologies North America Corporation
- Daivid Suitwai Ma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor wafer testing system
- Publication number 20040051547
- Publication date Mar 18, 2004
- Daivid Suitwai Ma
- G01 - MEASURING TESTING