San Carlos, CA, US
Information
Patent Grant
Affymetrix, Inc.
Daniel M. Bartell
G01 - MEASURING TESTING
Information
Patent Grant
Affymetrix, Inc.
Daniel M. Bartell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Affymetrix, Inc.
Daniel M. Bartell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Affymetrix, Inc.
Peter Fiekowsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Affymetrix, Inc.
Peter Fiekowsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AFFYMETRIX, INC.
Peter Fiekowsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AFFYMETRIX, INC.
David R. Smith
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AFFYMETRIX, INC.
Peter Fiekowsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AFFYMETRIX, INC.
Xiaojun Di
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AFFYMETRIX, INC.
Daniel M. Bartell
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
AFFYMETRIX, INC., a California corporation
Peter Fiekowsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AFFYMETRIX, INC., a California corporation
Peter Fiekowsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Affymetrix, Inc., a Corporation Organized under the laws of Delaware
Daniel M. Bartell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Affymetrix, INC. A corporation organized under the laws of Delaware
Daniel M. Bartell
B82 - NANO-TECHNOLOGY
Information
Patent Application
AFFYMETRIX, INC.
Derek Bernhart
G01 - MEASURING TESTING
Information
Patent Application
Daniel M. Bartell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Daniel M. Bartell
B82 - NANO-TECHNOLOGY
