Membership
Tour
Register
Log in
Dan Vacar
Follow
Person
San Diego, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
In-situ characterization of a solid-state light source
Patent number
9,229,045
Issue date
Jan 5, 2016
Oracle America, Inc.
David K. McElfresh
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced characterization of electrical connection degradation
Patent number
8,140,277
Issue date
Mar 20, 2012
Oracle America, Inc.
David K. McElfresh
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for testing electrical interconnects with swit...
Patent number
7,982,468
Issue date
Jul 19, 2011
Oracle America, Inc.
Dan Vacar
G01 - MEASURING TESTING
Information
Patent Grant
Surface shape metric and method to quantify the surface shape of el...
Patent number
7,920,986
Issue date
Apr 5, 2011
Oracle America, Inc.
Dan Vacar
G01 - MEASURING TESTING
Information
Patent Grant
Characterizing the response of a device in a computer system to vib...
Patent number
7,890,278
Issue date
Feb 15, 2011
Oracle America, Inc.
Dan Vacar
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting multiple anomalies in a cluster...
Patent number
7,870,440
Issue date
Jan 11, 2011
Oracle America, Inc.
Dan Vacar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for testing electrical interconnects
Patent number
7,800,385
Issue date
Sep 21, 2010
Oracle America, Inc.
David K. McElfresh
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for performing a real-time root-cause analysis...
Patent number
7,680,624
Issue date
Mar 16, 2010
Sun Microsystems, Inc.
David K. McElfresh
G08 - SIGNALLING
Information
Patent Grant
Method and apparatus for monitoring the health of a computer system
Patent number
7,668,696
Issue date
Feb 23, 2010
Sun Microsystems, Inc.
Kenny C. Gross
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for dynamically adjusting the resolution of te...
Patent number
7,577,542
Issue date
Aug 18, 2009
Sun Microsystems, Inc.
Dan Vacar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Technique for diagnosing and screening optical interconnect light s...
Patent number
7,466,404
Issue date
Dec 16, 2008
Sun Microsystems, Inc.
Dan Vacar
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for proactive fault monitoring in interconnects
Patent number
7,353,431
Issue date
Apr 1, 2008
Sun Microsystems, Inc.
Leoncio D. Lopez
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Proactive fault monitoring of disk drives through phase-sensitive s...
Patent number
7,330,325
Issue date
Feb 12, 2008
Sun Microsystems, Inc.
Dan Vacar
G11 - INFORMATION STORAGE
Information
Patent Grant
Determining the quality and reliability of a component by monitorin...
Patent number
7,283,919
Issue date
Oct 16, 2007
Sun Microsystems, Inc.
Kenny C. Gross
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Characterizing degradation of components during reliability-evaluat...
Patent number
7,216,062
Issue date
May 8, 2007
Sun Microsystem, Inc.
Dan Vacar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reliability prediction for complex components
Patent number
7,184,932
Issue date
Feb 27, 2007
Sun Microsystems, Inc.
Leoncio D. Lopez
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detecting degradation of components during reliability-evaluation s...
Patent number
7,162,393
Issue date
Jan 9, 2007
Sun Microsystems, Inc.
Dan Vacar
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
ENHANCED CHARACTERIZATION OF ELECTRICAL CONNECTION DEGRADATION
Publication number
20100250158
Publication date
Sep 30, 2010
SUN MICROSYSTEMS, INC.
David K. McElfresh
G01 - MEASURING TESTING
Information
Patent Application
IN-SITU CHARACTERIZATION OF A SOLID-STATE LIGHT SOURCE
Publication number
20100121593
Publication date
May 13, 2010
SUN MICROSYSTEMS, INC.
David K. McElfresh
G01 - MEASURING TESTING
Information
Patent Application
Characterizing the response of a device in a computer system to vib...
Publication number
20100023280
Publication date
Jan 28, 2010
SUN MICROSYSTEMS, INC.
Dan Vacar
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING THE RELIABILITY OF AN INTERCONNECT
Publication number
20090326864
Publication date
Dec 31, 2009
SUN MICROSYSTEMS, INC.
David K. McElfresh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING MULTIPLE ANOMALIES IN A CLUSTER...
Publication number
20090234484
Publication date
Sep 17, 2009
SUN MICROSYSTEMS, INC.
Dan Vacar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHOD FOR TESTING ELECTRICAL INTERCONNECTS WITH SWIT...
Publication number
20090230977
Publication date
Sep 17, 2009
SUN MICROSYSTEMS, INC.
Dan Vacar
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR TESTING ELECTRICAL INTERCONNECTS
Publication number
20090230976
Publication date
Sep 17, 2009
SUN MICROSYSTEMS, INC.
David K. McElfresh
G01 - MEASURING TESTING
Information
Patent Application
SURFACE SHAPE METRIC AND METHOD TO QUANTIFY THE SURFACE SHAPE OF EL...
Publication number
20090228237
Publication date
Sep 10, 2009
SUN MICROSYSTEMS, INC.
Dan VACAR
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for monitoring the health of a computer system
Publication number
20080255807
Publication date
Oct 16, 2008
Kenny C. Gross
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for dynamically adjusting the resolution of te...
Publication number
20080252481
Publication date
Oct 16, 2008
Dan Vacar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method and apparatus for performing a real-time root-cause analysis...
Publication number
20080252441
Publication date
Oct 16, 2008
David K. McElfresh
G08 - SIGNALLING
Information
Patent Application
COMPONENT-ATTACH TEST VEHICLE
Publication number
20080061812
Publication date
Mar 13, 2008
SUN MICROSYSTEMS, INC.
David K. McElfresh
G01 - MEASURING TESTING
Information
Patent Application
PROACTIVE FAULT MONITORING OF DISK DRIVES THROUGH PHASE-SENSITIVE S...
Publication number
20070285821
Publication date
Dec 13, 2007
Dan Vacar
G11 - INFORMATION STORAGE
Information
Patent Application
DETERMINING THE QUALITY AND RELIABILITY OF A COMPONENT BY MONITORIN...
Publication number
20070208538
Publication date
Sep 6, 2007
Kenny C. Gross
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for proactive fault monitoring in interconnects
Publication number
20060282705
Publication date
Dec 14, 2006
Leoncio D. Lopez
G06 - COMPUTING CALCULATING COUNTING