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Daniel Gene Smith
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Tucson, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Metrology for additive manufacturing
Patent number
12,203,745
Issue date
Jan 21, 2025
Nikon Corporation
Eric Peter Goodwin
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Spatially filtered talbot interferometer for wafer distortion measu...
Patent number
12,104,891
Issue date
Oct 1, 2024
Daniel Gene Smith
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of a change in a geometrical characteristic and/or posi...
Patent number
11,982,521
Issue date
May 14, 2024
Nikon Corporation
Daniel Gene Smith
G01 - MEASURING TESTING
Information
Patent Grant
Optical objective for operation in EUV spectral region
Patent number
11,934,105
Issue date
Mar 19, 2024
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Grant
Optical objective for operation in EUV spectral region
Patent number
11,899,371
Issue date
Feb 13, 2024
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Grant
Optical assembly, method for producing data in the same, and method...
Patent number
11,578,969
Issue date
Feb 14, 2023
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Grant
Illumination system with curved 1d-patterned mask for use in EUV-ex...
Patent number
11,300,884
Issue date
Apr 12, 2022
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Grant
Euv lithography system for dense line patterning
Patent number
11,099,483
Issue date
Aug 24, 2021
Nikon Corporation
Donis G. Flagello
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
High-resolution position encoder with image sensor and encoded targ...
Patent number
11,061,338
Issue date
Jul 13, 2021
NIKON CORPORATION
Jonathan Kyle Wells
G01 - MEASURING TESTING
Information
Patent Grant
Illumination system with flat 1D-patterned mask for use in EUV-expo...
Patent number
11,054,745
Issue date
Jul 6, 2021
Nikon Corporation
Daniel Gene Smith
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Compensation for Goos-Hanchen error in autofocus systems
Patent number
10,928,187
Issue date
Feb 23, 2021
Nikon Corporation
Daniel Gene Smith
G01 - MEASURING TESTING
Information
Patent Grant
EUV lithography system for dense line patterning
Patent number
10,890,849
Issue date
Jan 12, 2021
Nikon Corporation
Donis G. Flagello
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical assembly, method for producing data in the same, and method...
Patent number
10,837,763
Issue date
Nov 17, 2020
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Grant
Autofocus system and method
Patent number
10,794,689
Issue date
Oct 6, 2020
Nikon Corporation
Daniel Gene Smith
G01 - MEASURING TESTING
Information
Patent Grant
Extreme ultraviolet lithography system that utilizes pattern stitching
Patent number
10,747,117
Issue date
Aug 18, 2020
Nikon Corporation
Michael B. Binnard
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Correction of errors caused by ambient non-uniformities in a fringe...
Patent number
10,719,017
Issue date
Jul 21, 2020
Nikon Corporation
Eric Peter Goodwin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Illumination device for optimizing polarization in an illumination...
Patent number
10,690,317
Issue date
Jun 23, 2020
Nikon Corporation
Daniel Gene Smith
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Extreme ultraviolet lithography system that utilizes pattern stitching
Patent number
10,295,911
Issue date
May 21, 2019
Nikon Corporation
Michael B. Binnard
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Eighth wave corner cube retarder for laser radar
Patent number
10,197,668
Issue date
Feb 5, 2019
Nikon Corporatin
Daniel Gene Smith
G02 - OPTICS
Information
Patent Grant
Laser radar with remote local oscillator
Patent number
10,180,496
Issue date
Jan 15, 2019
Nikon Corporation
Daniel G. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Radar systems with dual fiber coupled lasers
Patent number
10,139,492
Issue date
Nov 27, 2018
Nikon Corporation
Mina A. Rezk
G01 - MEASURING TESTING
Information
Patent Grant
Correction of errors caused by ambient non-uniformities in a fringe...
Patent number
9,977,343
Issue date
May 22, 2018
Nikon Corporation
Eric Peter Goodwin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Compact laser radar corner cube
Patent number
9,964,745
Issue date
May 8, 2018
Nikon Corporation
Daniel G. Smith
G02 - OPTICS
Information
Patent Grant
High order focus in laser radar tooling ball measurements
Patent number
9,864,204
Issue date
Jan 9, 2018
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Grant
Compensation for Goos-Hanchen error in autofocus systems
Patent number
9,816,805
Issue date
Nov 14, 2017
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Grant
Autofocus system and method
Patent number
9,810,530
Issue date
Nov 7, 2017
Nikon Corporation
Daniel Gene Smith
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Illumination device for optimizing polarization in an illumination...
Patent number
9,732,934
Issue date
Aug 15, 2017
Nikon Corporation
Daniel Gene Smith
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Scan mirrors for laser radar
Patent number
9,638,799
Issue date
May 2, 2017
Nikon Corporation
Eric Peter Goodwin
G02 - OPTICS
Information
Patent Grant
Apparatus, optical assembly, method for inspection or measurement o...
Patent number
9,625,368
Issue date
Apr 18, 2017
Nikon Corporation
Eric Peter Goodwin
G01 - MEASURING TESTING
Information
Patent Grant
Radar systems with dual fiber coupled lasers
Patent number
9,618,619
Issue date
Apr 11, 2017
Nikon Corporation
Mina A. Rezk
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS FOR LARGE-SCALE OPTICAL MANUFACTURING
Publication number
20240367257
Publication date
Nov 7, 2024
Nikon Corporation
Daniel Gene SMITH
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE
Publication number
20230296368
Publication date
Sep 21, 2023
Nikon Corporation
Eric Peter Goodwin
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DELAY SYSTEM
Publication number
20230015748
Publication date
Jan 19, 2023
Nikon Corporation
Daniel Gene SMITH
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
CURVED RETICLE BY MECHANICAL AND PHASE BENDING ALONG ORTHOGONAL AXES
Publication number
20220357666
Publication date
Nov 10, 2022
Nikon Corporation
Donis G. Flagello
G02 - OPTICS
Information
Patent Application
E-BEAM POSITION TRACKER
Publication number
20220293390
Publication date
Sep 15, 2022
Nikon Corporation
Jacek Kazimierz Tyminski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ADDITIVE MANUFACTURING SYSTEM WITH LOCALIZED CONTROLLED ENVIRONMENT
Publication number
20220288855
Publication date
Sep 15, 2022
Nikon Corporation
Alton Hugh Phillips
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
METROLOGY FOR ADDITIVE MANUFACTURING
Publication number
20220252392
Publication date
Aug 11, 2022
Nikon Corporation
Eric Peter Goodwin
B22 - CASTING POWDER METALLURGY
Information
Patent Application
LASER RADAR
Publication number
20220082697
Publication date
Mar 17, 2022
Nikon Corporation
Anthony SLOTWINSKI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ASSEMBLY, METHOD FOR PRODUCING DATA IN THE SAME, AND METHOD...
Publication number
20210025697
Publication date
Jan 28, 2021
Nikon Corporation
Daniel Gene Smith
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT OF A CHANGE IN A GEOMETRICAL CHARACTERISTIC AND/OR POSI...
Publication number
20200232786
Publication date
Jul 23, 2020
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Application
OPTICAL OBJECTIVE FOR OPERATION IN EUV SPECTRAL REGION
Publication number
20200117099
Publication date
Apr 16, 2020
Daniel Gene Smith
G02 - OPTICS
Information
Patent Application
ILLUMINATION SYSTEM WITH CURVED 1D-PATTERNED MASK FOR USE IN EUV-EX...
Publication number
20200073251
Publication date
Mar 5, 2020
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Application
ILLUMINATION SYSTEM WITH FLAT 1D-PATTERNED MASK FOR USE IN EUV-EXPO...
Publication number
20200057373
Publication date
Feb 20, 2020
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Application
EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEM THAT UTILIZES PATTERN STITCHING
Publication number
20190235393
Publication date
Aug 1, 2019
Nikon Corporation
Michael B. Binnard
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
AUTOFOCUS SYSTEM AND METHOD
Publication number
20190107388
Publication date
Apr 11, 2019
Nikon Corporation
Daniel Gene Smith
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
CORRECTION OF ERRORS CAUSED BY AMBIENT NON-UNIFORMITIES IN A FRINGE...
Publication number
20180231899
Publication date
Aug 16, 2018
Nikon Corporation
Eric Peter Goodwin
G02 - OPTICS
Information
Patent Application
HIGH-RESOLUTION POSITION ENCODER WITH IMAGE SENSOR AND ENCODED TARG...
Publication number
20180217510
Publication date
Aug 2, 2018
Nikon Corporation
J. Kyle Wells
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
COMPENSATION FOR GOOS-HANCHEN ERROR IN AUTOFOCUS SYSTEMS
Publication number
20180038682
Publication date
Feb 8, 2018
Daniel Gene Smith
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ASSEMBLY, METHOD FOR PRODUCING DATA IN THE SAME, AND METHOD...
Publication number
20180031367
Publication date
Feb 1, 2018
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Application
AUTOFOCUS SYSTEM AND METHOD
Publication number
20180031368
Publication date
Feb 1, 2018
Nikon Corporation
Daniel Gene Smith
G01 - MEASURING TESTING
Information
Patent Application
EUV LITHOGRAPHY SYSTEM FOR DENSE LINE PATTERNING
Publication number
20170336715
Publication date
Nov 23, 2017
Nikon Corporation
Donis G. Flagello
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EUV LITHOGRAPHY SYSTEM FOR DENSE LINE PATTERNING
Publication number
20170336716
Publication date
Nov 23, 2017
Nikon Corporation
Donis G. Flagello
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEM THAT UTILIZES PATTERN STITCHING
Publication number
20170336720
Publication date
Nov 23, 2017
Nikon Corporation
Michael B. Binnard
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ILLUMINATION DEVICE FOR OPTIMIZING POLARIZATION IN AN ILLUMINATION...
Publication number
20170328538
Publication date
Nov 16, 2017
Nikon Corporation
Daniel Gene Smith
F21 - LIGHTING
Information
Patent Application
RADAR SYSTEMS WITH DUAL FIBER COUPLED LASERS
Publication number
20170168143
Publication date
Jun 15, 2017
Nikon Corporation
Mina A. Rezk
G01 - MEASURING TESTING
Information
Patent Application
HIGH ORDER FOCUS IN LASER RADAR TOOLING BALL MEASUREMENTS
Publication number
20160246063
Publication date
Aug 25, 2016
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Application
EIGHTH WAVE CORNER CUBE RETARDER FOR LASER RADAR
Publication number
20160209496
Publication date
Jul 21, 2016
Nikon Corporation
Daniel Gene Smith
G02 - OPTICS
Information
Patent Application
INTERFEROMETRIC LEVEL SENSOR
Publication number
20160025480
Publication date
Jan 28, 2016
Nikon Corporation
Eric Peter Goodwin
G01 - MEASURING TESTING
Information
Patent Application
SCAN MIRRORS FOR LASER RADAR
Publication number
20150355327
Publication date
Dec 10, 2015
NIKON METROLOGY N.V.
Eric Peter Goodwin
G02 - OPTICS
Information
Patent Application
RADAR SYSTEMS WITH DUAL FIBER COUPLED LASERS
Publication number
20150268344
Publication date
Sep 24, 2015
NIKON METROLOGY N.V.
Mina A. Rezk
G01 - MEASURING TESTING