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Daniel Grodensky
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Haifa, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Low power, high resolution solid state LIDAR circuit having a modul...
Patent number
10,281,322
Issue date
May 7, 2019
Intel Corporation
Jonathan K Doylend
G02 - OPTICS
Information
Patent Grant
Low power, high resolution solid state LIDAR circuit
Patent number
9,823,118
Issue date
Nov 21, 2017
Intel Corporation
Jonathan K Doylend
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONTROLLING MEANS FOR A LIGHT DETECTION AND RANGING SYSTEM AND NON-...
Publication number
20240151836
Publication date
May 9, 2024
Intel Corporation
Liron AIN-KEDEM
G01 - MEASURING TESTING
Information
Patent Application
PACKAGE WITH MULTIPLE PHOTONIC INTEGRATED CIRCUIT DIES OPTICALLY CO...
Publication number
20230318247
Publication date
Oct 5, 2023
Intel Corporation
Eleanor Patricia Paras RABADAM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SILICON PHOTONIC SYSTEMS FOR LIDAR APPLICATIONS
Publication number
20220404474
Publication date
Dec 22, 2022
Intel Corporation
Eleanor Patricia Paras Rabadam
G02 - OPTICS
Information
Patent Application
ELECTRICAL AND PHOTONIC INTEGRATED CIRCUITS ARCHITECTURE
Publication number
20220390562
Publication date
Dec 8, 2022
Guiyun Bai
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PHOTONIC INTEGRATED CIRCUIT, LIGHT DETECTION AND RANGING SYSTEM AND...
Publication number
20220342078
Publication date
Oct 27, 2022
Intel Corporation
George RAKULJIC
G01 - MEASURING TESTING
Information
Patent Application
LOW POWER, HIGH RESOLUTION SOLID STATE LIDAR CIRCUIT
Publication number
20180156661
Publication date
Jun 7, 2018
Intel Corporation
Jonathan K. Doylend
G02 - OPTICS
Information
Patent Application
OPTICAL SENSOR SHIELD
Publication number
20170288067
Publication date
Oct 5, 2017
Intel Corporation
Arnon Hirshberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Low power, high resolution solid state lidar circuit
Publication number
20170184450
Publication date
Jun 29, 2017
Intel Corporation
Jonathan K. Doylend
G01 - MEASURING TESTING