Daniel J. Ayres

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Warren, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe tip and probe assembly
- Patent number 10,241,133
- Issue date Mar 26, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G05 - CONTROLLING REGULATING
Information Patent Grant
High impedance compliant probe tip
- Patent number 10,119,992
- Issue date Nov 6, 2018
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Grant
Circuit element with laser trimmed component
- Patent number 7,378,936
- Issue date May 27, 2008
- Tektronix, Inc.
- Devin Bingham
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Adapter usable with an electronic interconnect for high speed signa...
- Patent number 6,402,549
- Issue date Jun 11, 2002
- Tektronix, Inc.
- Daniel J. Ayres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic interconnect device for high speed signal and data trans...
- Patent number 6,402,565
- Issue date Jun 11, 2002
- Tektronix, Inc.
- William R. Pooley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adapter usable with an electronic interconnect for high speed signa...
- Patent number 6,379,183
- Issue date Apr 30, 2002
- Tektronix, Inc.
- Daniel J. Ayres
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE TIP AND PROBE ASSEMBLY
- Publication number 20180059139
- Publication date Mar 1, 2018
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE COMPLIANT PROBE TIP
- Publication number 20160291054
- Publication date Oct 6, 2016
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Application
Circuit element with laser trimmed component
- Publication number 20060290463
- Publication date Dec 28, 2006
- Devin Bingham
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR