David A. Grosch

Person

Burlington, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Diversified exerciser and accelerator
- Patent number 9,535,113
- Issue date Jan 3, 2017
- International Business Machines Corporation
- David A. Grosch
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for margin testing integrated circuits using...
- Patent number 8,854,073
- Issue date Oct 7, 2014
- International Business Machines Corporation
- David A. Grosch
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing methods using well bias modification
- Patent number 7,759,960
- Issue date Jul 20, 2010
- International Business Machines Corporation
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing methods using well bias modification
- Patent number 7,564,256
- Issue date Jul 21, 2009
- International Business Machines Company
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing method using well bias modification
- Patent number 7,486,098
- Issue date Feb 3, 2009
- International Business Machines Corporation
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing methods using well bias modification
- Patent number 7,400,162
- Issue date Jul 15, 2008
- International Business Machines Corporation
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Burn in technique for chips containing different types of IC circuitry
- Patent number 6,122,760
- Issue date Sep 19, 2000
- International Business Machines Corporation
- David Alan Grosch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EFFICIENT METHODS AND APPARATUS FOR MARGIN TESTING INTEGRATED CIRCUITS
- Publication number 20130069678
- Publication date Mar 21, 2013
- International Business Machines Corporation
- David Grosch
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
- Publication number 20080211531
- Publication date Sep 4, 2008
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
- Publication number 20080211530
- Publication date Sep 4, 2008
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
- Publication number 20080036486
- Publication date Feb 14, 2008
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit testing methods using well bias modification
- Publication number 20060071653
- Publication date Apr 6, 2006
- Anne E. Gattiker
- G01 - MEASURING TESTING

David A. Grosch

Person

Patents Grantslast 30 patents

Diversified exerciser and accelerator

Methods and apparatus for margin testing integrated circuits using...

Integrated circuit testing methods using well bias modification

Integrated circuit testing methods using well bias modification

Integrated circuit testing method using well bias modification

Integrated circuit testing methods using well bias modification

Burn in technique for chips containing different types of IC circuitry

Patents Applicationslast 30 patents

EFFICIENT METHODS AND APPARATUS FOR MARGIN TESTING INTEGRATED CIRCUITS

INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION

INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION

INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION

Integrated circuit testing methods using well bias modification