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4513418 | Bardell, Jr. et al. | Apr 1985 | |
5255229 | Tanaka et al. | Oct 1993 | |
5297087 | Porter | Mar 1994 | |
5375091 | Berry, Jr. et al. | Dec 1994 | |
5381373 | Ohsawa | Jan 1995 | |
5390129 | Rhodes | Feb 1995 | |
5424988 | McClure et al. | Jun 1995 | |
5535164 | Adams et al. | Jul 1996 | |
5557573 | McClure | Sep 1996 | |
5563833 | Adams et al. | Oct 1996 | |
5577051 | McClure | Nov 1996 | |
5590079 | Lee et al. | Dec 1996 | |
5592422 | McClure | Jan 1997 | |
5610866 | McClure | Mar 1997 | |
5615164 | Kirihata et al. | Mar 1997 | |
5619462 | McClure | Apr 1997 | |
5629943 | McClure | May 1997 | |
5633877 | Shephard, III et al. | May 1997 | |
5638331 | Cha et al. | Jun 1997 | |
5654925 | Koh et al. | Aug 1997 | |
5657282 | Lee | Aug 1997 | |
5659551 | Huott et al. | Aug 1997 | |
5668770 | Itoh et al. | Sep 1997 |
Entry |
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IBM Technical Disclosure Bulletin, "Well-Controlled Ratio Logic Circuit", vol. 40, No. 03, Mar. 1997. pp. 117-119. |
IBM Technical Disclosure Bulletin, "Computer Memory Testing Using a Specialized Checkerboard Test", vol. 38, No. 08, Aug. 1995, p. 311. |
IBM Technical Disclosure Bulletin, "Wafer Level Test and Burn-In", vol. 34, No. 8, Jan. 1992. pp. 401-404. |