David A. Soltz

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Photonic degradation monitoring for semiconductor devices
- Patent number 10,804,843
- Issue date Oct 13, 2020
- SunPower Corporation
- Xiuwen Tu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
High throughput system for photovoltaic UV degradation testing
- Patent number 10,476,432
- Issue date Nov 12, 2019
- SunPower Corporation
- David Aitan Soltz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photonic degradation monitoring for semiconductor devices
- Patent number 10,230,329
- Issue date Mar 12, 2019
- SunPower Corporation
- Xiuwen Tu
- G01 - MEASURING TESTING
Information Patent Grant
Photonic degradation monitoring for semiconductor devices
- Patent number 9,564,854
- Issue date Feb 7, 2017
- SunPower Corporation
- Xiuwen Tu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Inline inspection of photovoltaics for electrical defects
- Patent number 8,427,185
- Issue date Apr 23, 2013
- KLA-Tencor Corporation
- George H. Zapalac
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and apparatus for detecting and passivating defects in thin...
- Patent number 8,318,239
- Issue date Nov 27, 2012
- Solopower, Inc.
- Bulent M. Basol
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and apparatus to remove a segment of a thin film solar cell...
- Patent number 8,318,240
- Issue date Nov 27, 2012
- Solopower, Inc.
- Geordie Zapalac
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Inline inspection of photovoltaics for electrical defects
- Patent number 7,906,972
- Issue date Mar 15, 2011
- KLA-Tencor Corporation
- George H. Zapalac, Jr.
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Inline inspection of photovoltaics for electrical defects
- Patent number 7,649,365
- Issue date Jan 19, 2010
- KLA-Tencor Corporation
- George H. Zapalac, Jr.
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Integrated segmented scintillation detector
- Patent number 7,560,703
- Issue date Jul 14, 2009
- KLA-Tencor Corporation
- David A. Soltz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for reducing alteration of a specimen during an...
- Patent number 7,394,067
- Issue date Jul 1, 2008
- KLA-Tencor Technologies Corp.
- David Soltz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems configured to reduce distortion of a resist during a metrol...
- Patent number 7,304,302
- Issue date Dec 4, 2007
- KLA-Tencor Technologies Corp.
- Peter Nunan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for preparing a copper containing substrate for...
- Patent number 7,148,073
- Issue date Dec 12, 2006
- KLA-Tencor Technologies Corp.
- David Soltz
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Site stepping for electron beam micro analysis
- Patent number 7,115,866
- Issue date Oct 3, 2006
- KLA-Tencor Technologies, Inc.
- Roger Kroeze
- G01 - MEASURING TESTING
Information Patent Grant
Capping layer to impede atom ejection
- Patent number 7,049,590
- Issue date May 23, 2006
- KLA-Tencor Technologies Corporation
- David Aitan Soltz
- G01 - MEASURING TESTING
Information Patent Grant
High contrast inspection and review of magnetic media and heads
- Patent number 6,936,816
- Issue date Aug 30, 2005
- KLA-Tencor Technologies Corporation
- Marian Mankos
- G11 - INFORMATION STORAGE
Information Patent Grant
High contrast inspection and review of magnetic media and heads
- Patent number 6,759,654
- Issue date Jul 6, 2004
- KLA-Tencor Technologies Corporation
- Marian Mankos
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PHOTONIC DEGRADATION MONITORING FOR SEMICONDUCTOR DEVICES
- Publication number 20190273467
- Publication date Sep 5, 2019
- SunPower Corporation
- Xiuwen Tu
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT SYSTEM FOR PHOTOVOLTAIC UV DEGRADATION TESTING
- Publication number 20180041165
- Publication date Feb 8, 2018
- SunPower Corporation
- David Aitan Soltz
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPROACHES FOR SOLAR CELL MARKING AND TRACKING
- Publication number 20170278990
- Publication date Sep 28, 2017
- David Aitan Soltz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTONIC DEGRADATION MONITORING FOR SEMICONDUCTOR DEVICES
- Publication number 20170149383
- Publication date May 25, 2017
- Xiuwen Tu
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC DEGRADATION MONITORING FOR SEMICONDUCTOR DEVICES
- Publication number 20160329864
- Publication date Nov 10, 2016
- Xiuwen Tu
- G01 - MEASURING TESTING
Information Patent Application
REDUCING UNEQUAL BIASING IN SOLAR CELL TESTING
- Publication number 20150318822
- Publication date Nov 5, 2015
- Xiuwen Tu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS
- Publication number 20110133750
- Publication date Jun 9, 2011
- KLA-Tencor Corporation
- George H. Zapalac, Jr.
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD AND APPARATUS TO REMOVE A SEGMENT OF A THIN FILM SOLAR CELL...
- Publication number 20100178716
- Publication date Jul 15, 2010
- SoloPower, Inc.
- Geordie Zapalac
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
METHOD AND APPARATUS FOR DETECTING AND PASSIVATING DEFECTS IN THIN...
- Publication number 20100124600
- Publication date May 20, 2010
- Bulent M. Basol
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS
- Publication number 20100079147
- Publication date Apr 1, 2010
- KLA-Tencor Corporation
- George H. Zapalac, Jr.
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
High contrast inspection and review of magnetic media and heads
- Publication number 20040200960
- Publication date Oct 14, 2004
- Marian Mankos
- G01 - MEASURING TESTING
Information Patent Application
HIGH CONTRAST INSPECTION AND REVIEW OF MAGNETIC MEDIA AND HEADS
- Publication number 20040129877
- Publication date Jul 8, 2004
- Marian Mankos
- G01 - MEASURING TESTING

David A. Soltz

Person

Patents Grantslast 30 patents

Photonic degradation monitoring for semiconductor devices

High throughput system for photovoltaic UV degradation testing

Photonic degradation monitoring for semiconductor devices

Photonic degradation monitoring for semiconductor devices

Inline inspection of photovoltaics for electrical defects

Method and apparatus for detecting and passivating defects in thin...

Method and apparatus to remove a segment of a thin film solar cell...

Inline inspection of photovoltaics for electrical defects

Inline inspection of photovoltaics for electrical defects

Integrated segmented scintillation detector

Systems and methods for reducing alteration of a specimen during an...

Systems configured to reduce distortion of a resist during a metrol...

Methods and systems for preparing a copper containing substrate for...

Site stepping for electron beam micro analysis

Capping layer to impede atom ejection

High contrast inspection and review of magnetic media and heads

High contrast inspection and review of magnetic media and heads

Patents Applicationslast 30 patents

PHOTONIC DEGRADATION MONITORING FOR SEMICONDUCTOR DEVICES

HIGH THROUGHPUT SYSTEM FOR PHOTOVOLTAIC UV DEGRADATION TESTING

APPROACHES FOR SOLAR CELL MARKING AND TRACKING

PHOTONIC DEGRADATION MONITORING FOR SEMICONDUCTOR DEVICES

PHOTONIC DEGRADATION MONITORING FOR SEMICONDUCTOR DEVICES

REDUCING UNEQUAL BIASING IN SOLAR CELL TESTING

INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS

METHOD AND APPARATUS TO REMOVE A SEGMENT OF A THIN FILM SOLAR CELL...

METHOD AND APPARATUS FOR DETECTING AND PASSIVATING DEFECTS IN THIN...

INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS

High contrast inspection and review of magnetic media and heads

HIGH CONTRAST INSPECTION AND REVIEW OF MAGNETIC MEDIA AND HEADS