David B. Lavo

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Santa Cruz, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for diagnosing bridging faults in integrated circuits
- Patent number 6,560,736
- Issue date May 6, 2003
- The Regents of the University of California
- F. Joel Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Method for diagnosing bridging faults in integrated circuits
- Patent number 6,202,181
- Issue date Mar 13, 2001
- The Regents of the University of California
- F. Joel Ferguson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for diagnosing bridging faults in integrated circuits
- Publication number 20010003427
- Publication date Jun 14, 2001
- F. Joel Ferguson
- G01 - MEASURING TESTING