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David B. Ruffner
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New York, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Colloidal fingerprints for soft materials using total holographic c...
Patent number
11,977,015
Issue date
May 7, 2024
New York University
David G. Grier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Holographic characterization of protein aggregates
Patent number
11,747,258
Issue date
Sep 5, 2023
New York University
David G. Grier
G01 - MEASURING TESTING
Information
Patent Grant
Holographic characterization of protein aggregates
Patent number
11,385,157
Issue date
Jul 12, 2022
New York University
David G. Grier
G01 - MEASURING TESTING
Information
Patent Grant
Holographic characterization of protein aggregates
Patent number
11,346,761
Issue date
May 31, 2022
New York University
David G. Grier
G01 - MEASURING TESTING
Information
Patent Grant
Colloidal fingerprints for soft materials using total holographic c...
Patent number
11,085,864
Issue date
Aug 10, 2021
New York University
David G. Grier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Colloidal fingerprints for soft materials using total holographic c...
Patent number
10,656,065
Issue date
May 19, 2020
New York University
David G. Grier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Holographic detection and characterization of large impurity partic...
Patent number
10,641,696
Issue date
May 5, 2020
New York University
David B. Ruffner
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HOLOGRAPHIC CHARACTERIZATION OF PROTEIN AGGREGATES
Publication number
20220326130
Publication date
Oct 13, 2022
NEW YORK UNIVERSITY
David G. GRIER
G01 - MEASURING TESTING
Information
Patent Application
COLLOIDAL FINGERPRINTS FOR SOFT MATERIALS USING TOTAL HOLOGRAPHIC C...
Publication number
20210364403
Publication date
Nov 25, 2021
NEW YORK UNIVERSITY
David G. GRIER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HOLOGRAPHIC CHARACTERIZATION OF PROTEIN AGGREGATES
Publication number
20210199551
Publication date
Jul 1, 2021
NEW YORK UNIVERSITY
David G. GRIER
G01 - MEASURING TESTING
Information
Patent Application
HOLOGRAPHIC CHARACTERIZATION USING HU MOMENTS
Publication number
20190234853
Publication date
Aug 1, 2019
SPHERYX, INC.
David B. RUFFNER
G01 - MEASURING TESTING
Information
Patent Application
HOLOGRAPHIC DETECTION AND CHARACTERIZATION OF LARGE IMPURITY PARTIC...
Publication number
20180252628
Publication date
Sep 6, 2018
NEW YORK UNIVERSITY
David B. RUFFNER
G01 - MEASURING TESTING
Information
Patent Application
COLLOIDAL FINGERPRINTS FOR SOFT MATERIALS USING TOTAL HOLOGRAPHIC C...
Publication number
20170307497
Publication date
Oct 26, 2017
NEW YORK UNIVERSITY
David G. GRIER
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL CONVEYORS
Publication number
20130194646
Publication date
Aug 1, 2013
NEW YORK UNIVERSITY
David B. Ruffner
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY