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David Bitauld

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Patents Grantslast 30 patents

  • Information Patent Grant

    Haptic feedback
    • Patent number 11,841,990
    • Issue date Dec 12, 2023
    • Nokia Technologies Oy
    • Zoran Radivojevic
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Apparatus with cantilever light guide
    • Patent number 11,828,592
    • Issue date Nov 28, 2023
    • Nokia Technologies Oy
    • David Bitauld
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Photoacoustic apparatus and methods
    • Patent number 11,561,206
    • Issue date Jan 24, 2023
    • Nokia Technologies Oy
    • David Bitauld
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and apparatus for trusted computing
    • Patent number 11,244,054
    • Issue date Feb 8, 2022
    • Nokia Technologies Oy
    • David Bitauld
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Fibre-based communication
    • Patent number 11,223,424
    • Issue date Jan 11, 2022
    • David Bitauld
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

  • Information Patent Application

    APPARATUS FOR INTEGRATING AN ELECTRONIC INTEGRATED CIRCUIT AND A PH...
    • Publication number 20230268249
    • Publication date Aug 24, 2023
    • Nokia Solutions and Networks Oy
    • Alexandre Shen
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD FOR MANUFACTURING A MIXED LAYER COMPRISING A SILICON WAVEGUI...
    • Publication number 20230168429
    • Publication date Jun 1, 2023
    • Commissariat A L'Energie Atomique et Aux Energies Alternatives
    • Stephane MALHOUITRE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD FOR ON-SILICON INTEGRATION OF A COMPONENT III-V AND ON-SILIC...
    • Publication number 20230145652
    • Publication date May 11, 2023
    • Commissariat A L'Energie Atomique et Aux Energies Alternatives
    • Delphine NEEL
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    PHOTONIC CHIP
    • Publication number 20230105346
    • Publication date Apr 6, 2023
    • Commissariat A L'Energie Atomique et Aux Energies Alternatives
    • Joan RAMIREZ
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    HAPTIC FEEDBACK
    • Publication number 20220187917
    • Publication date Jun 16, 2022
    • Nokia Technologies Oy
    • Zoran Radivojevic
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    FIBRE-BASED COMMUNICATION
    • Publication number 20210344426
    • Publication date Nov 4, 2021
    • Nokia Technologies Oy
    • David Bitauld
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    ARTIFICIAL NEURAL NETWORK
    • Publication number 20210192360
    • Publication date Jun 24, 2021
    • Nokia Technologies Oy
    • David Bitauld
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    ANONYMITY SYSTEM FOR GOODS DELIVERY
    • Publication number 20210192446
    • Publication date Jun 24, 2021
    • Nokia Technologies Oy
    • David Bitauld
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Photoacoustic Apparatus and Methods
    • Publication number 20210091534
    • Publication date Mar 25, 2021
    • Nokia Technologies Oy
    • David Bitauld
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOACOUSTIC APPARATUS AND METHODS
    • Publication number 20210003536
    • Publication date Jan 7, 2021
    • Nokia Technologies Oy
    • David Bitauld
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD AND APPARATUS FOR TRUSTED COMPUTING
    • Publication number 20200327230
    • Publication date Oct 15, 2020
    • Nokia Technologies Oy
    • David Bitauld
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    APPARATUS COMPRISING A CANTILEVER
    • Publication number 20200318943
    • Publication date Oct 8, 2020
    • Nokia Technologies Oy
    • David Bitauld
    • G01 - MEASURING TESTING