David Charles McClure

Person

Carrollton, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
MEMS gyroscope control circuit
- Patent number 12,111,158
- Issue date Oct 8, 2024
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
- Patent number 11,719,540
- Issue date Aug 8, 2023
- STMicroelectronics, Inc.
- Yamu Hu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
MEMS gyroscope control circuit
- Patent number 11,662,205
- Issue date May 30, 2023
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
MEMS accelerometer self-test using an active mobile mass deflection...
- Patent number 11,320,452
- Issue date May 3, 2022
- STMicroelectronics, Inc.
- Yamu Hu
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
- Patent number 11,255,670
- Issue date Feb 22, 2022
- STMicroelectronics, Inc.
- Yamu Hu
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope control circuit
- Patent number 11,175,138
- Issue date Nov 16, 2021
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
Test mode circuitry for a programmable tamper detection circuit
- Patent number 8,827,165
- Issue date Sep 9, 2014
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Grant
Robust SRAM memory cell capacitor plate voltage generator
- Patent number 8,654,574
- Issue date Feb 18, 2014
- STMicroelectronics, Inc.
- Kevin K. Walsh
- G11 - INFORMATION STORAGE
Information Patent Grant
Robust SRAM memory cell capacitor plate voltage generator
- Patent number 8,482,964
- Issue date Jul 9, 2013
- STMicroelectronics, Inc.
- Kevin K. Walsh
- G11 - INFORMATION STORAGE
Information Patent Grant
Test mode circuitry for a programmable tamper detection circuit
- Patent number 7,978,095
- Issue date Jul 12, 2011
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Grant
Battery monitor circuit and method for battery tamper detection
- Patent number 7,830,124
- Issue date Nov 9, 2010
- STMicroelectronics, Inc.
- David McClure
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Threshold personalization testmode
- Patent number 7,825,704
- Issue date Nov 2, 2010
- STMicroelectronics, Inc.
- David McClure
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital-to-analog converter circuit and method
- Patent number 7,724,172
- Issue date May 25, 2010
- STMicroelectronics, Inc.
- David C. McClure
- G01 - MEASURING TESTING
Information Patent Grant
Programmable SRAM source bias scheme for use with switchable SRAM p...
- Patent number 7,688,669
- Issue date Mar 30, 2010
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM with switchable power supply sets of voltages
- Patent number 7,623,405
- Issue date Nov 24, 2009
- STMicroelectronics, Inc.
- Mark A. Lysinger
- G11 - INFORMATION STORAGE
Information Patent Grant
Power-on reset circuit
- Patent number 7,504,870
- Issue date Mar 17, 2009
- STMicroelectronics, Inc.
- David McClure
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test mode and test method for a temperature tamper detection circuit
- Patent number 7,443,176
- Issue date Oct 28, 2008
- STMicroelectronics, Inc.
- David C. McClure
- G01 - MEASURING TESTING
Information Patent Grant
Reset ramp control
- Patent number 7,411,433
- Issue date Aug 12, 2008
- STMicroelectronics, Inc.
- David Charles McClure
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Voltage translating control structure
- Patent number 7,368,947
- Issue date May 6, 2008
- STMicroelectronics, Inc.
- David Charles McClure
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature tamper detection circuit and method
- Patent number 7,362,248
- Issue date Apr 22, 2008
- STMicroelectronics, Inc.
- David C. McClure
- G01 - MEASURING TESTING
Information Patent Grant
ESD bonding pad
- Patent number 7,333,310
- Issue date Feb 19, 2008
- STMicroelectronics, Inc.
- David Charles McClure
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Battery protection device
- Patent number 7,327,544
- Issue date Feb 5, 2008
- STMicroelectronics, Inc.
- David C. McClure
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Tamper memory cell
- Patent number 7,224,600
- Issue date May 29, 2007
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Grant
Reset initialization
- Patent number 7,208,987
- Issue date Apr 24, 2007
- STMicroelectronics, Inc.
- David Charles McClure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and circuit for switchover between a primary and a secondary...
- Patent number 7,132,767
- Issue date Nov 7, 2006
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock distribution providing optimal delay
- Patent number 7,084,688
- Issue date Aug 1, 2006
- STMicroelectronics, Inc.
- David McClure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Regulator circuitry and method
- Patent number 7,064,534
- Issue date Jun 20, 2006
- STMicroelectronics, Inc.
- David C. McClure
- G05 - CONTROLLING REGULATING
Information Patent Grant
Voltage regulator with stress mode
- Patent number 7,012,417
- Issue date Mar 14, 2006
- STMicroelectronics, Inc.
- David C. McClure
- G05 - CONTROLLING REGULATING
Information Patent Grant
Memory circuit and method for corrupting stored data
- Patent number 6,990,011
- Issue date Jan 24, 2006
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for detecting the state of a switch
- Patent number 6,903,584
- Issue date Jun 7, 2005
- STMicroelectronics, Inc.
- Rong Yin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT
- Publication number 20230314138
- Publication date Oct 5, 2023
- STMicroelectronics, Inc.
- Yamu HU
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
- Publication number 20230273024
- Publication date Aug 31, 2023
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
- Publication number 20220128360
- Publication date Apr 28, 2022
- STMicroelectronics, Inc.
- Yamu HU
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
- Publication number 20220034659
- Publication date Feb 3, 2022
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS ACCELEROMETER SELF-TEST USING AN ACTIVE MOBILE MASS DEFLECTION...
- Publication number 20200408805
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Yamu HU
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
- Publication number 20200408525
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
- Publication number 20200408524
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Yamu HU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ROBUST SRAM MEMORY CELL CAPACITOR PLATE VOLTAGE GENERATOR
- Publication number 20130182523
- Publication date Jul 18, 2013
- STMicroelectronics S.A.
- Kevin K. Walsh
- G11 - INFORMATION STORAGE
Information Patent Application
TEST MODE CIRCUITRY FOR A PROGRAMMABLE TAMPER DETECTION CIRCUIT
- Publication number 20110148620
- Publication date Jun 23, 2011
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Application
ROBUST SRAM MEMORY CELL CAPACITOR PLATE VOLTAGE GENERATOR
- Publication number 20100165709
- Publication date Jul 1, 2010
- STMicroelectronics, Inc.
- Kevin K. Walsh
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAMMABLE SRAM SOURCE BIAS SCHEME FOR USE WITH SWITCHABLE SRAM P...
- Publication number 20080198678
- Publication date Aug 21, 2008
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Application
SRAM WITH SWITCHABLE POWER SUPPLY SETS OF VOLTAGES
- Publication number 20080198679
- Publication date Aug 21, 2008
- STMicroelectronics, Inc.
- Mark A. Lysinger
- G11 - INFORMATION STORAGE
Information Patent Application
DIGITAL-TO-ANALOG CONVERTER CIRCUIT AND METHOD
- Publication number 20080191917
- Publication date Aug 14, 2008
- STMicroelectronics, Inc.
- David C. McClure
- G01 - MEASURING TESTING
Information Patent Application
Battery Monitor Circuit
- Publication number 20070257640
- Publication date Nov 8, 2007
- STMicroelectronics, Inc.
- David McClure
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
THRESHOLD PERSONALIZATION TESTMODE
- Publication number 20070236268
- Publication date Oct 11, 2007
- STMicroelectronics, Inc.
- David McClure
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOW VOLTAGE OUTPUT CIRCUIT
- Publication number 20070236262
- Publication date Oct 11, 2007
- STMicroelectronics, Inc.
- David McClure
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Power-On Reset Circuit
- Publication number 20070236840
- Publication date Oct 11, 2007
- STMicroelectronics, Inc.
- David McClure
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Temperature tamper detection circuit and method
- Publication number 20070146056
- Publication date Jun 28, 2007
- STMicroelectronics, Inc.
- David C. McClure
- G01 - MEASURING TESTING
Information Patent Application
Test mode circuitry for a programmable tamper detection circuit
- Publication number 20070115122
- Publication date May 24, 2007
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Application
Test mode and test method for a temperature tamper detection circuit
- Publication number 20070115032
- Publication date May 24, 2007
- STMicroelectronics, Inc.
- David C. McClure
- G01 - MEASURING TESTING
Information Patent Application
Clock distribution providing optimal delay
- Publication number 20060044039
- Publication date Mar 2, 2006
- David McClure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tamper memory cell
- Publication number 20050152177
- Publication date Jul 14, 2005
- STMicroelectronics, Inc.
- David C. McClure
- G11 - INFORMATION STORAGE
Information Patent Application
Battery protection device
- Publication number 20050134229
- Publication date Jun 23, 2005
- David C. McClure
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Reset ramp control
- Publication number 20050134346
- Publication date Jun 23, 2005
- David Charles McClure
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ESD bonding pad
- Publication number 20050134240
- Publication date Jun 23, 2005
- David Charles McClure
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reset initialization
- Publication number 20050134345
- Publication date Jun 23, 2005
- David Charles McClure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Voltage translating control structure
- Publication number 20050134356
- Publication date Jun 23, 2005
- David Charles McClure
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Regulator circuitry and method
- Publication number 20050088152
- Publication date Apr 28, 2005
- STMicroelectronics, Inc.
- David C. McClure
- G05 - CONTROLLING REGULATING
Information Patent Application
Chip enabled voltage regulator
- Publication number 20050088222
- Publication date Apr 28, 2005
- STMicroelectronics, Inc.
- David C. McClure
- G05 - CONTROLLING REGULATING
Information Patent Application
Voltage regulator with stress mode
- Publication number 20050083028
- Publication date Apr 21, 2005
- David C. McClure
- G05 - CONTROLLING REGULATING

David Charles McClure

Person

Patents Grantslast 30 patents

MEMS gyroscope control circuit

MEMS gyroscope self-test using a technique for deflection of the se...

MEMS gyroscope control circuit

MEMS accelerometer self-test using an active mobile mass deflection...

MEMS gyroscope self-test using a technique for deflection of the se...

MEMS gyroscope control circuit

Test mode circuitry for a programmable tamper detection circuit

Robust SRAM memory cell capacitor plate voltage generator

Robust SRAM memory cell capacitor plate voltage generator

Test mode circuitry for a programmable tamper detection circuit

Battery monitor circuit and method for battery tamper detection

Threshold personalization testmode

Digital-to-analog converter circuit and method

Programmable SRAM source bias scheme for use with switchable SRAM p...

SRAM with switchable power supply sets of voltages

Power-on reset circuit

Test mode and test method for a temperature tamper detection circuit

Reset ramp control

Voltage translating control structure

Temperature tamper detection circuit and method

ESD bonding pad

Battery protection device

Tamper memory cell

Reset initialization

Method and circuit for switchover between a primary and a secondary...

Clock distribution providing optimal delay

Regulator circuitry and method

Voltage regulator with stress mode

Memory circuit and method for corrupting stored data

Circuit and method for detecting the state of a switch

Patents Applicationslast 30 patents

MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT

MEMS GYROSCOPE CONTROL CIRCUIT

MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...

MEMS GYROSCOPE CONTROL CIRCUIT

MEMS ACCELEROMETER SELF-TEST USING AN ACTIVE MOBILE MASS DEFLECTION...

MEMS GYROSCOPE CONTROL CIRCUIT

MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...

ROBUST SRAM MEMORY CELL CAPACITOR PLATE VOLTAGE GENERATOR

TEST MODE CIRCUITRY FOR A PROGRAMMABLE TAMPER DETECTION CIRCUIT

ROBUST SRAM MEMORY CELL CAPACITOR PLATE VOLTAGE GENERATOR

PROGRAMMABLE SRAM SOURCE BIAS SCHEME FOR USE WITH SWITCHABLE SRAM P...

SRAM WITH SWITCHABLE POWER SUPPLY SETS OF VOLTAGES

DIGITAL-TO-ANALOG CONVERTER CIRCUIT AND METHOD

Battery Monitor Circuit

THRESHOLD PERSONALIZATION TESTMODE

LOW VOLTAGE OUTPUT CIRCUIT

Power-On Reset Circuit

Temperature tamper detection circuit and method

Test mode circuitry for a programmable tamper detection circuit

Test mode and test method for a temperature tamper detection circuit

Clock distribution providing optimal delay

Tamper memory cell

Battery protection device

Reset ramp control

ESD bonding pad

Reset initialization

Voltage translating control structure

Regulator circuitry and method

Chip enabled voltage regulator

Voltage regulator with stress mode