David Cheng

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for semiconductor processing
- Patent number 7,748,944
- Issue date Jul 6, 2010
- Crossing Automation, Inc.
- JB Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Indexing multiple test probe system and method
- Patent number 6,788,079
- Issue date Sep 7, 2004
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Multiple test probe system and method
- Patent number 6,653,853
- Issue date Nov 25, 2003
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Track width control of readback elements with ions implantation in...
- Patent number 6,483,672
- Issue date Nov 19, 2002
- International Business Machines Corporation
- Patrick Clinton Arnett
- G11 - INFORMATION STORAGE
Information Patent Grant
Dual cassette load lock
- Patent number 6,454,519
- Issue date Sep 24, 2002
- Applied Materials, Inc.
- Masato M. Toshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple test probe system
- Patent number 6,366,103
- Issue date Apr 2, 2002
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving magnetic recording at high data rates for wave...
- Patent number 6,288,858
- Issue date Sep 11, 2001
- International Business Machines Corporation
- Patrick Clinton Arnett
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for electroplating films on semiconductor wafers
- Patent number 6,280,581
- Issue date Aug 28, 2001
- David Cheng
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Method and apparatus for handling and testing wafers
- Patent number 6,249,342
- Issue date Jun 19, 2001
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for integrated wafer handling and testing
- Patent number 6,164,894
- Issue date Dec 26, 2000
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thickness of semiconductor subst...
- Patent number 6,154,041
- Issue date Nov 28, 2000
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for loading and unloading wafers from a wafer...
- Patent number 6,053,688
- Issue date Apr 25, 2000
- David Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for measuring surface topography
- Patent number 5,917,191
- Issue date Jun 29, 1999
- Koo; Ann F.
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring sheet resistance and thickness o...
- Patent number 5,914,611
- Issue date Jun 22, 1999
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Multiple chamber integrated process system
- Patent number 5,882,165
- Issue date Mar 16, 1999
- Applied Materials, Inc.
- Dan Maydan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Passive shield for CVD wafer processing which provides frontside ed...
- Patent number 5,851,299
- Issue date Dec 22, 1998
- Applied Materials, Inc.
- David Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dual cassette load lock
- Patent number 5,769,588
- Issue date Jun 23, 1998
- Applied Materials, Inc.
- Masato M. Toshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring surface topography
- Patent number 5,708,279
- Issue date Jan 13, 1998
- Koo; Ann F.
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the curvature of wafers with bea...
- Patent number 5,696,383
- Issue date Dec 9, 1997
- Koo; Ann F.
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring sheet resistance and thickness o...
- Patent number 5,691,648
- Issue date Nov 25, 1997
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method for transporting and testing wafers
- Patent number 5,670,888
- Issue date Sep 23, 1997
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for mapping the edge and other characteristics...
- Patent number 5,546,179
- Issue date Aug 13, 1996
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Beam spot position detector having a detector moving mechanism
- Patent number 5,532,499
- Issue date Jul 2, 1996
- Koo; Ann F.
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the curvature of wafers with a l...
- Patent number 5,523,582
- Issue date Jun 4, 1996
- Koo; Ann F.
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring film thickness
- Patent number 5,495,178
- Issue date Feb 27, 1996
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for cancelling cross-talk in signals from opti...
- Patent number 5,483,515
- Issue date Jan 9, 1996
- International Business Machines Corporation
- David C. Cheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for handling wafers
- Patent number 5,479,108
- Issue date Dec 26, 1995
- Cheng; David
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for finding wafer index marks and centers
- Patent number 5,452,078
- Issue date Sep 19, 1995
- Koo; Ann F.
- David Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Inductive current switching system with resonance
- Patent number 5,402,052
- Issue date Mar 28, 1995
- International Business Machines Corporation
- David C. Cheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for measuring stress in a film applied to surf...
- Patent number 5,369,286
- Issue date Nov 29, 1994
- Koo; Ann F.
- David Cheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR SEMICONDUCTOR PROCESSING
- Publication number 20100221915
- Publication date Sep 2, 2010
- J.B. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD AND APPARATUS FOR SEMCONDUCTOR PROCESSING
- Publication number 20080089774
- Publication date Apr 17, 2008
- J.B. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SEMICONDUCTOR PROCESSING
- Publication number 20080073031
- Publication date Mar 27, 2008
- J.B. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for semiconductor processing
- Publication number 20050194096
- Publication date Sep 8, 2005
- Crossing Automation, Inc.
- J.B. Price
- H01 - BASIC ELECTRIC ELEMENTS

David Cheng

Person

Patents Grantslast 30 patents

Method and apparatus for semiconductor processing

Indexing multiple test probe system and method

Multiple test probe system and method

Track width control of readback elements with ions implantation in...

Dual cassette load lock

Multiple test probe system

Method for improving magnetic recording at high data rates for wave...

Method and apparatus for electroplating films on semiconductor wafers

Method and apparatus for handling and testing wafers

Method and apparatus for integrated wafer handling and testing

Method and apparatus for measuring thickness of semiconductor subst...

Method and apparatus for loading and unloading wafers from a wafer...

Apparatus for measuring surface topography

Method and apparatus for measuring sheet resistance and thickness o...

Multiple chamber integrated process system

Passive shield for CVD wafer processing which provides frontside ed...

Dual cassette load lock

Method and apparatus for measuring surface topography

Method and apparatus for measuring the curvature of wafers with bea...

Method and apparatus for measuring sheet resistance and thickness o...

Method for transporting and testing wafers

Method and apparatus for mapping the edge and other characteristics...

Beam spot position detector having a detector moving mechanism

Method and apparatus for measuring the curvature of wafers with a l...

Method and apparatus for measuring film thickness

Apparatus and method for cancelling cross-talk in signals from opti...

Method and apparatus for handling wafers

Method and apparatus for finding wafer index marks and centers

Inductive current switching system with resonance

Method and apparatus for measuring stress in a film applied to surf...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR SEMICONDUCTOR PROCESSING

A METHOD AND APPARATUS FOR SEMCONDUCTOR PROCESSING

METHOD AND APPARATUS FOR SEMICONDUCTOR PROCESSING

Method and apparatus for semiconductor processing