Membership
Tour
Register
Log in
David F. Heidel
Follow
Person
Mahopac, NY, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
In-line stacking of transistors for soft error rate hardening
Patent number
9,165,917
Issue date
Oct 20, 2015
GLOBALFOUNDRIES Inc.
Ethan H. Cannon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detecting chip alterations with light emission
Patent number
9,075,106
Issue date
Jul 7, 2015
International Business Machines Corporation
Kerry Bernstein
G01 - MEASURING TESTING
Information
Patent Grant
Method and structure to reduce soft error rate susceptibility in se...
Patent number
8,362,600
Issue date
Jan 29, 2013
International Business Machines Corporation
Cyril Cabral
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
On-chip jitter measurement circuit
Patent number
7,791,330
Issue date
Sep 7, 2010
International Business Machines Corporation
David F. Heidel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Measuring and predicting VLSI chip reliability and failure
Patent number
7,480,882
Issue date
Jan 20, 2009
International Business Machines Corporation
Peilin Song
G01 - MEASURING TESTING
Information
Patent Grant
On-chip jitter measurement circuit
Patent number
7,439,724
Issue date
Oct 21, 2008
International Business Machines Corporation
David F. Heidel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for accelerated detection of transient particle i...
Patent number
7,084,660
Issue date
Aug 1, 2006
International Business Machines Corporation
Jerry D. Ackaret
G01 - MEASURING TESTING
Information
Patent Grant
Method of self programmed built in self test
Patent number
6,230,290
Issue date
May 8, 2001
International Business Machines Corporation
David F. Heidel
G11 - INFORMATION STORAGE
Information
Patent Grant
Image processing methods for the optical detection of dynamic error...
Patent number
6,172,512
Issue date
Jan 9, 2001
International Business Machines Corporation
Richard James Evans
G01 - MEASURING TESTING
Information
Patent Grant
Self programmed built in self test
Patent number
6,108,798
Issue date
Aug 22, 2000
International Business Machines Corporation
David F. Heidel
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
Method And Structure To Reduce Soft Error Rate Susceptibility In Se...
Publication number
20110175211
Publication date
Jul 21, 2011
International Business Machines Corporation
Cyril Cabral, JR.
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detecting Chip Alterations with Light Emission
Publication number
20110026806
Publication date
Feb 3, 2011
International Business Machines Corporation
Kerry Bernstein
G01 - MEASURING TESTING
Information
Patent Application
IN-LINE STACKING OF TRANSISTORS FOR SOFT ERROR RATE HARDENING
Publication number
20100301446
Publication date
Dec 2, 2010
International Business Machines Corporation
Ethan H. Cannon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ON-CHIP JITTER MEASUREMENT CIRCUIT
Publication number
20080284477
Publication date
Nov 20, 2008
David F. Heidel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
On-chip jitter measurement circuit
Publication number
20050036578
Publication date
Feb 17, 2005
International Business Machines Corporation
David F. Heidel
H04 - ELECTRIC COMMUNICATION TECHNIQUE