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David J. Griffiths
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South Sutton, NH, US
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last 30 patents
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Patent Grant
Prober for testing light-emitting devices on a wafer
Patent number
6,734,959
Issue date
May 11, 2004
Labsphere, Inc.
David J. Griffiths
G01 - MEASURING TESTING
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Patent Grant
Method of and apparatus for bispectral fluorescence colorimetry
Patent number
6,278,521
Issue date
Aug 21, 2001
Labsphere, Inc.
Joseph Jablonski
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Prober for testing light-emitting devices on a wafer
Publication number
20030020897
Publication date
Jan 30, 2003
David J. Griffiths
G01 - MEASURING TESTING