David L. DeMaris

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Layout assessment method and system
- Patent number 8,863,044
- Issue date Oct 14, 2014
- International Business Machines Corporation
- Nathalie Casati
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic wafer data sample planning and review
- Patent number 8,751,980
- Issue date Jun 10, 2014
- International Business Machines Corporation
- Nathalie Casati
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of optimization of a manufacturing process of an integrated...
- Patent number 8,667,427
- Issue date Mar 4, 2014
- International Business Machines Corporation
- David L DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optimization of a manufacturing process of an integrated circuit la...
- Patent number 8,661,370
- Issue date Feb 25, 2014
- International Business Machines Corporation
- David L DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for fast estimation of lithographic binding patterns in an i...
- Patent number 8,234,603
- Issue date Jul 31, 2012
- International Business Machines Corporation
- Saeed Bagheri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for testing pattern sensitive algorithms for semi...
- Patent number 8,201,132
- Issue date Jun 12, 2012
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Testing pattern sensitive algorithms for semiconductor design
- Patent number 7,685,544
- Issue date Mar 23, 2010
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for search and analysis of systematic defects in integrated...
- Patent number 7,552,417
- Issue date Jun 23, 2009
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for search and analysis of systematic defects in integrated...
- Patent number 7,415,695
- Issue date Aug 19, 2008
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
method for generating a set of test patterns for an optical proximi...
- Patent number 7,404,174
- Issue date Jul 22, 2008
- International Business Machines Corporation
- David L. DeMaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for testing pattern sensitive algorithms for semi...
- Patent number 7,353,472
- Issue date Apr 1, 2008
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for search and analysis of systematic defects in integrated...
- Patent number 7,284,230
- Issue date Oct 16, 2007
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC WAFER DATA SAMPLE PLANNING AND REVIEW
- Publication number 20140123083
- Publication date May 1, 2014
- International Business Machines Corporation
- Nathalie Casati
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF OPTIMIZATION OF A MANUFACTURING PROCESS OF AN INTEGRATED...
- Publication number 20120324406
- Publication date Dec 20, 2012
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF OPTIMIZATION OF A MANUFACTURING PROCESS OF AN INTEGRATED...
- Publication number 20120221984
- Publication date Aug 30, 2012
- International Business Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR FAST ESTIMATION OF LITHOGRAPHIC BINDING PATTERNS IN AN I...
- Publication number 20120017194
- Publication date Jan 19, 2012
- International Business Machines Corporation
- Saeed Bagheri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMI...
- Publication number 20100095254
- Publication date Apr 15, 2010
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FEATURE EXTRACTION THAT SUPPORTS PROGRESSIVELY REFINED SEARCH AND C...
- Publication number 20080320421
- Publication date Dec 25, 2008
- David L. Demaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTICAL PROXIMI...
- Publication number 20080247633
- Publication date Oct 9, 2008
- David L DeMaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...
- Publication number 20080232675
- Publication date Sep 25, 2008
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMICONDUCTOR DESIGN
- Publication number 20080104555
- Publication date May 1, 2008
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...
- Publication number 20070211933
- Publication date Sep 13, 2007
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for testing pattern sensitive algorithms for semi...
- Publication number 20070038970
- Publication date Feb 15, 2007
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTI...
- Publication number 20060023932
- Publication date Feb 2, 2006
- International Business Machines Corporation
- David L. DeMaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...
- Publication number 20050094863
- Publication date May 5, 2005
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING

David L. DeMaris

Person

Patents Grantslast 30 patents

Layout assessment method and system

Automatic wafer data sample planning and review

Method of optimization of a manufacturing process of an integrated...

Optimization of a manufacturing process of an integrated circuit la...

Method for fast estimation of lithographic binding patterns in an i...

System and method for testing pattern sensitive algorithms for semi...

Testing pattern sensitive algorithms for semiconductor design

System for search and analysis of systematic defects in integrated...

System for search and analysis of systematic defects in integrated...

method for generating a set of test patterns for an optical proximi...

System and method for testing pattern sensitive algorithms for semi...

System for search and analysis of systematic defects in integrated...

Patents Applicationslast 30 patents

AUTOMATIC WAFER DATA SAMPLE PLANNING AND REVIEW

METHOD OF OPTIMIZATION OF A MANUFACTURING PROCESS OF AN INTEGRATED...

METHOD OF OPTIMIZATION OF A MANUFACTURING PROCESS OF AN INTEGRATED...

METHOD FOR FAST ESTIMATION OF LITHOGRAPHIC BINDING PATTERNS IN AN I...

SYSTEM AND METHOD FOR TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMI...

FEATURE EXTRACTION THAT SUPPORTS PROGRESSIVELY REFINED SEARCH AND C...

SYSTEM FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTICAL PROXIMI...

SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...

TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMICONDUCTOR DESIGN

SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...

System and method for testing pattern sensitive algorithms for semi...

SYSTEM AND METHOD FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTI...

SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...