David L. Harmon

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Isolated zener diode, an integrated circuit incorporating multiple...
- Patent number 8,796,108
- Issue date Aug 5, 2014
- International Business Machines Corporation
- Frederick G. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolated Zener diode
- Patent number 8,492,866
- Issue date Jul 23, 2013
- International Business Machines Corporation
- Frederick G. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film resistors and methods of manufacture
- Patent number 8,486,796
- Issue date Jul 16, 2013
- International Business Machines Corporation
- David L. Harmon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-electro-mechanical-system temperature sensor
- Patent number 8,480,302
- Issue date Jul 9, 2013
- International Business Machines Corporation
- Jason P. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of performance of a conductive wire in a multilayered s...
- Patent number 7,511,378
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of assessing potential for charging damage in SOI designs an...
- Patent number 7,132,318
- Issue date Nov 7, 2006
- International Business Machines Corporation
- Henry A. Bonges, III
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhancement of performance of a conductive wire in a multilayered s...
- Patent number 7,096,450
- Issue date Aug 22, 2006
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of assessing potential for charging damage in SOI designs an...
- Patent number 7,067,886
- Issue date Jun 27, 2006
- International Business Machines Corporation
- Henry A. Bonges, III
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective removal of vertical portions of a film
- Patent number 6,139,647
- Issue date Oct 31, 2000
- International Business Machines Corporation
- Michael David Armacost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective removal of vertical portions of a film
- Patent number 5,767,017
- Issue date Jun 16, 1998
- International Business Machines Corporation
- Michael David Armacost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective deposition process
- Patent number 5,714,798
- Issue date Feb 3, 1998
- International Business Machines Corp.
- Michael David Armacost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench mask for forming deep trenches in a semiconductor substrate,...
- Patent number 5,686,345
- Issue date Nov 11, 1997
- International Business Machines Corporation
- David Laurant Harmon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective deposition process
- Patent number 5,618,379
- Issue date Apr 8, 1997
- International Business Machines Corporation
- Michael D. Armacost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorinated silicon nitride films
- Patent number 5,539,154
- Issue date Jul 23, 1996
- International Business Machines Corporation
- Son V. Nguyen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fluorinated silicon nitride films
- Patent number 5,462,812
- Issue date Oct 31, 1995
- Son V. Nguyen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Low temperature plasma oxidation process
- Patent number 5,412,246
- Issue date May 2, 1995
- International Business Machines Corporation
- David M. Dobuzinsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low temperature plasma oxidation process
- Patent number 5,330,935
- Issue date Jul 19, 1994
- International Business Machines Corporation
- David M. Dobuzinsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reactive ion etching buffer mask
- Patent number 5,298,790
- Issue date Mar 29, 1994
- International Business Machines Corporation
- David L. Harmon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma enhanced CVD process for fluorinated silicon nitride films
- Patent number 5,204,138
- Issue date Apr 20, 1993
- International Business Machines Corporation
- Son V. Nguyen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Reactive ion etching buffer mask
- Patent number 5,118,384
- Issue date Jun 2, 1992
- International Business Machines Corporation
- David L. Harmon
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ISOLATED ZENER DIODE, AN INTEGRATED CIRCUIT INCORPORATING MULTIPLE...
- Publication number 20130299938
- Publication date Nov 14, 2013
- Frederick G. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOLATED ZENER DIODE
- Publication number 20130175656
- Publication date Jul 11, 2013
- International Business Machines Corporation
- Frederick G. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN FILM RESISTORS AND METHODS OF MANUFACTURE
- Publication number 20120126370
- Publication date May 24, 2012
- International Business Machines Corporation
- David L. HARMON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO-ELECTRO-MECHANICAL-SYSTEM TEMPERATURE SENSOR
- Publication number 20120076172
- Publication date Mar 29, 2012
- International Business Machines Corporation
- Jason P. Gill
- G01 - MEASURING TESTING
Information Patent Application
Enhancement of performance of a conductive wire in a multilayered s...
- Publication number 20060226142
- Publication date Oct 12, 2006
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of assessing potential for charging damage in SOI designs an...
- Publication number 20050098799
- Publication date May 12, 2005
- Henry A. Bonges
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ASSESSING POTENTIAL FOR CHARGING DAMAGE IN SOI DESIGNS AN...
- Publication number 20050093072
- Publication date May 5, 2005
- International Business Machines Corporation
- Henry A. Bonges
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCEMENT OF PERFORMANCE OF A CONDUCTIVE WIRE IN A MULTILAYERED S...
- Publication number 20040262031
- Publication date Dec 30, 2004
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING

David L. Harmon

Person

Patents Grantslast 30 patents

Isolated zener diode, an integrated circuit incorporating multiple...

Isolated Zener diode

Thin film resistors and methods of manufacture

Micro-electro-mechanical-system temperature sensor

Enhancement of performance of a conductive wire in a multilayered s...

Method of assessing potential for charging damage in SOI designs an...

Enhancement of performance of a conductive wire in a multilayered s...

Method of assessing potential for charging damage in SOI designs an...

Selective removal of vertical portions of a film

Selective removal of vertical portions of a film

Selective deposition process

Trench mask for forming deep trenches in a semiconductor substrate,...

Selective deposition process

Fluorinated silicon nitride films

Fluorinated silicon nitride films

Low temperature plasma oxidation process

Low temperature plasma oxidation process

Reactive ion etching buffer mask

Plasma enhanced CVD process for fluorinated silicon nitride films

Reactive ion etching buffer mask

Patents Applicationslast 30 patents

ISOLATED ZENER DIODE, AN INTEGRATED CIRCUIT INCORPORATING MULTIPLE...

ISOLATED ZENER DIODE

THIN FILM RESISTORS AND METHODS OF MANUFACTURE

MICRO-ELECTRO-MECHANICAL-SYSTEM TEMPERATURE SENSOR

Enhancement of performance of a conductive wire in a multilayered s...

Method of assessing potential for charging damage in SOI designs an...

METHOD OF ASSESSING POTENTIAL FOR CHARGING DAMAGE IN SOI DESIGNS AN...

ENHANCEMENT OF PERFORMANCE OF A CONDUCTIVE WIRE IN A MULTILAYERED S...