David M. Stashower

Person

Los Gatos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reusable test chip for inline probing of three dimensionally arrang...
- Patent number 8,362,480
- Issue date Jan 29, 2013
- PDF Solutions, Inc.
- Christopher Hess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for product yield prediction
- Patent number 7,673,262
- Issue date Mar 2, 2010
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,373,625
- Issue date May 13, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,356,800
- Issue date Apr 8, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,174,521
- Issue date Feb 6, 2007
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Extraction method of defect density and size distributions
- Patent number 7,024,642
- Issue date Apr 4, 2006
- PDF Solutions, Inc.
- Christopher Hess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for product yield prediction
- Patent number 6,901,564
- Issue date May 31, 2005
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction using device and pro...
- Patent number 6,795,952
- Issue date Sep 21, 2004
- PDF Solutions, Inc.
- Brian E. Stine
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
System And Method For Product Yield Prediction
- Publication number 20080282210
- Publication date Nov 13, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20070118242
- Publication date May 24, 2007
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20060277506
- Publication date Dec 7, 2006
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20050158888
- Publication date Jul 21, 2005
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Extraction method of defect density and size distributions
- Publication number 20040094762
- Publication date May 20, 2004
- Christopher Hess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for product yield prediction
- Publication number 20030145292
- Publication date Jul 31, 2003
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING

David M. Stashower

Person

Patents Grantslast 30 patents

Reusable test chip for inline probing of three dimensionally arrang...

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

Extraction method of defect density and size distributions

System and method for product yield prediction

System and method for product yield prediction using device and pro...

Patents Applicationslast 30 patents

System And Method For Product Yield Prediction

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

Extraction method of defect density and size distributions

System and method for product yield prediction