David RAFFERTY

Person

Webster, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Chemical analysis instrument with multi-purpose pump
- Patent number 10,229,824
- Issue date Mar 12, 2019
- 1ST Detect Corporation
- Michael Spencer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometers having real time ion isolation signal generators
- Patent number 9,870,912
- Issue date Jan 16, 2018
- 1st Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting organic and inorganic explosives
- Patent number 9,804,141
- Issue date Oct 31, 2017
- 1ST Detect Corporation
- Guido Fridolin Verbeck
- G01 - MEASURING TESTING
Information Patent Grant
Introducing an analyte into a chemical analyzer
- Patent number 9,599,547
- Issue date Mar 21, 2017
- 1ST Detect Corporation
- David Rafferty
- G01 - MEASURING TESTING
Information Patent Grant
Ionization within ion trap using photoionization and electron ioniz...
- Patent number 9,570,282
- Issue date Feb 14, 2017
- 1ST Detect Corporation
- Abrar Riaz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass dependent automatic gain control for mass spectrometer
- Patent number 9,472,388
- Issue date Oct 18, 2016
- 1ST Detect Corporation
- James Wylde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Preconcentrating a sample in a preconcentrator evacuated to substan...
- Patent number 9,451,364
- Issue date Sep 20, 2016
- 1ST Detect Corporation
- David Rafferty
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Grant
Evacuating a sample chamber
- Patent number 9,312,112
- Issue date Apr 12, 2016
- 1ST Detect Corporation
- David Rafferty
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for calibrating mass spectrometers
- Patent number 9,299,545
- Issue date Mar 29, 2016
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for applying end cap DC bias in ion traps
- Patent number 9,214,321
- Issue date Dec 15, 2015
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap with radial opening in ring electrode
- Patent number 9,214,325
- Issue date Dec 15, 2015
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrum noise cancellation by alternating inverted synchronou...
- Patent number 9,196,467
- Issue date Nov 24, 2015
- 1ST Detect Corporation
- David Rafferty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometer ion trap having asymmetric end cap apertures
- Patent number 9,082,599
- Issue date Jul 14, 2015
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic gain control with defocusing lens
- Patent number 9,035,244
- Issue date May 19, 2015
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for calibrating mass spectrometers
- Patent number 8,975,573
- Issue date Mar 10, 2015
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass dependent automatic gain control for mass spectrometer
- Patent number 8,969,794
- Issue date Mar 3, 2015
- 1ST Detect Corporation
- James Wylde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer having an external detector
- Patent number 8,946,624
- Issue date Feb 3, 2015
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Introducing an analyte into a chemical analyzer
- Patent number 8,784,737
- Issue date Jul 22, 2014
- 1ST Detect Corporation
- David Rafferty
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for adjusting a mass spectrometer output
- Patent number 8,754,361
- Issue date Jun 17, 2014
- David Rafferty
- G01 - MEASURING TESTING
Information Patent Grant
End cap voltage control of ion traps
- Patent number 8,704,168
- Issue date Apr 22, 2014
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer ion trap having asymmetric end cap apertures
- Patent number 8,610,055
- Issue date Dec 17, 2013
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
End cap voltage control of ion traps
- Patent number 8,334,506
- Issue date Dec 18, 2012
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Driving a mass spectrometer ion trap or mass filter
- Patent number 7,973,277
- Issue date Jul 5, 2011
- 1ST Detect Corporation
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETERS HAVING REAL TIME ION ISOLATION SIGNAL GENERATORS
- Publication number 20170133214
- Publication date May 11, 2017
- 1ST DETECT CORPORATION
- David RAFFERTY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING ORGANIC AND INORGANIC EXPLOSIVES
- Publication number 20150330961
- Publication date Nov 19, 2015
- 1ST DETECT CORPORATION
- Guido Fridolin VERBECK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CALIBRATING MASS SPECTROMETERS
- Publication number 20150235826
- Publication date Aug 20, 2015
- 1ST DETECT CORPORATION
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS DEPENDENT AUTOMATIC GAIN CONTROL FOR MASS SPECTROMETER
- Publication number 20150228468
- Publication date Aug 13, 2015
- 1ST DETECT CORPORATION
- James Wylde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTRODUCING AN ANALYTE INTO A CHEMICAL ANALYZER
- Publication number 20150010442
- Publication date Jan 8, 2015
- David Rafferty
- G01 - MEASURING TESTING
Information Patent Application
MASS DEPENDENT AUTOMATIC GAIN CONTROL FOR MASS SPECTROMETER
- Publication number 20140299760
- Publication date Oct 9, 2014
- 1ST DETECT CORPORATION
- James Wylde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION WITHIN ION TRAP USING PHOTOIONIZATION AND ELECTRON IONIZ...
- Publication number 20140264010
- Publication date Sep 18, 2014
- 1ST DETECT CORPORATION
- Abrar RIAZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap with Radial Opening in Ring Electrode
- Publication number 20140264006
- Publication date Sep 18, 2014
- 1ST DETECT CORPORATION
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER HAVING AN EXTERNAL DETECTOR
- Publication number 20140264013
- Publication date Sep 18, 2014
- 1ST DETECT CORPORATION
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CALIBRATING MASS SPECTROMETERS
- Publication number 20140252215
- Publication date Sep 11, 2014
- 1ST DETECT CORPORATION
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTRUM NOISE CANCELLATION BY ALTERNATING INVERTED SYNCHRONOU...
- Publication number 20140252220
- Publication date Sep 11, 2014
- 1st Detect Corporation
- David Rafferty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC GAIN CONTROL WITH DEFOCUSING LENS
- Publication number 20140252222
- Publication date Sep 11, 2014
- 1ST DETECT CORPORATION
- David RAFFERTY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER ION TRAP HAVING ASYMMETRIC END CAP APERTURES
- Publication number 20140252224
- Publication date Sep 11, 2014
- 1ST DETECT CORPORATION
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR APPLYING END CAP DC BIAS IN ION TRAPS
- Publication number 20140252219
- Publication date Sep 11, 2014
- 1ST DETECT CORPORATION
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHEMICAL ANALYSIS INSTRUMENT WITH MULTI-PURPOSE PUMP
- Publication number 20140250977
- Publication date Sep 11, 2014
- 1st Detect Corporation
- Michael Spencer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCED PRESSURE LIQUID SAMPLING
- Publication number 20140190245
- Publication date Jul 10, 2014
- David Rafferty
- G01 - MEASURING TESTING
Information Patent Application
End Cap Voltage Control of Ion Traps
- Publication number 20130099137
- Publication date Apr 25, 2013
- 1ST DETECT CORPORATION
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRECONCENTRATING A SAMPLE
- Publication number 20120270334
- Publication date Oct 25, 2012
- 1ST DETECT CORPORATION
- Pedro Ojeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Introducing An Analyte Into A Chemical Analyzer
- Publication number 20120223226
- Publication date Sep 6, 2012
- 1ST DETECT CORPORATION
- David Rafferty
- G01 - MEASURING TESTING
Information Patent Application
Evacuating a Sample Chamber
- Publication number 20120180576
- Publication date Jul 19, 2012
- 1ST DETECT CORPORATION
- David Rafferty
- G01 - MEASURING TESTING
Information Patent Application
DRIVING A MASS SPECTROMETER ION TRAP OR MASS FILTER
- Publication number 20090294657
- Publication date Dec 3, 2009
- SPACEHAB, INC.
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
END CAP VOLTAGE CONTROL OF ION TRAPS
- Publication number 20090146054
- Publication date Jun 11, 2009
- SPACEHAB, INC.
- David Rafferty
- H01 - BASIC ELECTRIC ELEMENTS

David RAFFERTY

Person

Patents Grantslast 30 patents

Chemical analysis instrument with multi-purpose pump

Mass spectrometers having real time ion isolation signal generators

Method for detecting organic and inorganic explosives

Introducing an analyte into a chemical analyzer

Ionization within ion trap using photoionization and electron ioniz...

Mass dependent automatic gain control for mass spectrometer

Preconcentrating a sample in a preconcentrator evacuated to substan...

Evacuating a sample chamber

Systems and methods for calibrating mass spectrometers

Methods and systems for applying end cap DC bias in ion traps

Ion trap with radial opening in ring electrode

Mass spectrum noise cancellation by alternating inverted synchronou...

Mass spectrometer ion trap having asymmetric end cap apertures

Automatic gain control with defocusing lens

Systems and methods for calibrating mass spectrometers

Mass dependent automatic gain control for mass spectrometer

Mass spectrometer having an external detector

Introducing an analyte into a chemical analyzer

Systems and methods for adjusting a mass spectrometer output

End cap voltage control of ion traps

Mass spectrometer ion trap having asymmetric end cap apertures

End cap voltage control of ion traps

Driving a mass spectrometer ion trap or mass filter

Patents Applicationslast 30 patents

MASS SPECTROMETERS HAVING REAL TIME ION ISOLATION SIGNAL GENERATORS

METHOD FOR DETECTING ORGANIC AND INORGANIC EXPLOSIVES

SYSTEMS AND METHODS FOR CALIBRATING MASS SPECTROMETERS

MASS DEPENDENT AUTOMATIC GAIN CONTROL FOR MASS SPECTROMETER

INTRODUCING AN ANALYTE INTO A CHEMICAL ANALYZER

MASS DEPENDENT AUTOMATIC GAIN CONTROL FOR MASS SPECTROMETER

IONIZATION WITHIN ION TRAP USING PHOTOIONIZATION AND ELECTRON IONIZ...

Ion Trap with Radial Opening in Ring Electrode

MASS SPECTROMETER HAVING AN EXTERNAL DETECTOR

SYSTEMS AND METHODS FOR CALIBRATING MASS SPECTROMETERS

MASS SPECTRUM NOISE CANCELLATION BY ALTERNATING INVERTED SYNCHRONOU...

AUTOMATIC GAIN CONTROL WITH DEFOCUSING LENS

MASS SPECTROMETER ION TRAP HAVING ASYMMETRIC END CAP APERTURES

METHODS AND SYSTEMS FOR APPLYING END CAP DC BIAS IN ION TRAPS

CHEMICAL ANALYSIS INSTRUMENT WITH MULTI-PURPOSE PUMP

REDUCED PRESSURE LIQUID SAMPLING

End Cap Voltage Control of Ion Traps

PRECONCENTRATING A SAMPLE

Introducing An Analyte Into A Chemical Analyzer

Evacuating a Sample Chamber

DRIVING A MASS SPECTROMETER ION TRAP OR MASS FILTER

END CAP VOLTAGE CONTROL OF ION TRAPS