David S. Hendrickson

Person

Los Gatos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,448,695
- Issue date Sep 20, 2022
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 10,677,843
- Issue date Jun 9, 2020
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Layout of contacts
- Patent number D875579
- Issue date Feb 18, 2020
- AEHR Test Systems
- Jovan Jovanovic
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Electronics tester with output circuits operable in voltage compens...
- Patent number 10,488,437
- Issue date Nov 26, 2019
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
Layout of contacts
- Patent number D850309
- Issue date Jun 4, 2019
- AEHR Test Systems
- Jovan Jovanovic
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Electronics tester with output circuits operable in voltage compens...
- Patent number 9,874,583
- Issue date Jan 23, 2018
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 9,250,291
- Issue date Feb 2, 2016
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Integrated feedthrough module
- Patent number 8,986,048
- Issue date Mar 24, 2015
- AEHR Test Systems
- David S. Hendrickson
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 8,228,085
- Issue date Jul 24, 2012
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Separate test electronics and blower modules in an apparatus for te...
- Patent number 7,969,175
- Issue date Jun 28, 2011
- AEHR Test Systems
- David S. Hendrickson
- G01 - MEASURING TESTING
Information Patent Grant
Connector
- Patent number D630166
- Issue date Jan 4, 2011
- AERH Test Systems
- Scott E. Lindsey
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Interface on an electronics connector
- Patent number D629760
- Issue date Dec 28, 2010
- AEHR Test Systems
- Scott E. Lindsey
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 7,800,382
- Issue date Sep 21, 2010
- AEHR Test Ststems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
System for burn-in testing of electronic devices
- Patent number 7,063,544
- Issue date Jun 20, 2006
- AEHR Test Systems
- Bradley R. Gunn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for burn-in testing of electronic devices
- Patent number 6,815,966
- Issue date Nov 9, 2004
- AEHR Test Systems
- Bradley R. Gunn
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250085337
- Publication date Mar 13, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250085338
- Publication date Mar 13, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...
- Publication number 20240410938
- Publication date Dec 12, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240402243
- Publication date Dec 5, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393387
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393388
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20220373595
- Publication date Nov 24, 2022
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20200256917
- Publication date Aug 13, 2020
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER WITH OUTPUT CIRCUITS OPERABLE IN VOLTAGE COMPENS...
- Publication number 20180106837
- Publication date Apr 19, 2018
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER WITH OUTPUT CIRCUITS OPERABLE IN VOLTAGE COMPENS...
- Publication number 20160109482
- Publication date Apr 21, 2016
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20160103179
- Publication date Apr 14, 2016
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20120280704
- Publication date Nov 8, 2012
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SEPARATE TEST ELECTRONICS AND BLOWER MODULES IN AN APPARATUS FOR TE...
- Publication number 20110256774
- Publication date Oct 20, 2011
- Aehr Test Systems
- David S. Hendrickson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20110006800
- Publication date Jan 13, 2011
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SEPARATE TEST ELECTRONICS AND BLOWER MODULES IN AN APPARATUS FOR TE...
- Publication number 20100283475
- Publication date Nov 11, 2010
- Aehr Test Systems
- David S. Hendrickson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20090160468
- Publication date Jun 25, 2009
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
System for burn-in testing of electronic devices
- Publication number 20050007137
- Publication date Jan 13, 2005
- Bradley R. Gunn
- G06 - COMPUTING CALCULATING COUNTING

David S. Hendrickson

Person

Patents Grantslast 30 patents

System for testing an integrated circuit of a device and its method...

System for testing an integrated circuit of a device and its method...

Layout of contacts

Electronics tester with output circuits operable in voltage compens...

Layout of contacts

Electronics tester with output circuits operable in voltage compens...

System for testing an integrated circuit of a device and its method...

Integrated feedthrough module

System for testing an integrated circuit of a device and its method...

Separate test electronics and blower modules in an apparatus for te...

Connector

Interface on an electronics connector

System for testing an integrated circuit of a device and its method...

System for burn-in testing of electronic devices

System for burn-in testing of electronic devices

Patents Applicationslast 30 patents

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

ELECTRONICS TESTER WITH OUTPUT CIRCUITS OPERABLE IN VOLTAGE COMPENS...

ELECTRONICS TESTER WITH OUTPUT CIRCUITS OPERABLE IN VOLTAGE COMPENS...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SEPARATE TEST ELECTRONICS AND BLOWER MODULES IN AN APPARATUS FOR TE...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SEPARATE TEST ELECTRONICS AND BLOWER MODULES IN AN APPARATUS FOR TE...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

System for burn-in testing of electronic devices