David S. Kurtz

Person

State College, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for thin film thickness mapping
- Patent number 6,909,772
- Issue date Jun 21, 2005
- Hypernex, Inc.
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for rapid grain size analysis of polycrystalli...
- Patent number 6,882,739
- Issue date Apr 19, 2005
- Hypernex, Inc.
- David S. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for thin film thickness mapping
- Patent number 6,792,075
- Issue date Sep 14, 2004
- Hypernex, Inc.
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for quantitative phase analysis of textured po...
- Patent number 6,678,347
- Issue date Jan 13, 2004
- Hypernex, Inc.
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for texture analysis on semiconductor wafers
- Patent number 6,301,330
- Issue date Oct 9, 2001
- Hypernex, Inc.
- David S. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Photo-sensor fiber-optic stress analysis system
- Patent number 6,058,160
- Issue date May 2, 2000
- Hypernex, Inc.
- David S. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for rapid in-situ X-ray stress measurement during thermal...
- Patent number 5,848,122
- Issue date Dec 8, 1998
- Advanced Technology Materials, Inc.
- David S. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Photo-sensor fiber-optic stress analysis system
- Patent number 5,828,724
- Issue date Oct 27, 1998
- Advanced Technology Materials, Inc.
- David S. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Large angle solid state position sensitive x-ray detector system
- Patent number 5,784,432
- Issue date Jul 21, 1998
- The Penn State Research Foundation
- David S. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Large angle solid state position sensitive x-ray detector system
- Patent number 5,724,401
- Issue date Mar 3, 1998
- The Penn State Research Foundation
- David S. Kurtz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for thin film thickness mapping
- Publication number 20040170249
- Publication date Sep 2, 2004
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THIN FILM THICKNESS MAPPING
- Publication number 20040047447
- Publication date Mar 11, 2004
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for rapid grain size analysis of polycrystalli...
- Publication number 20030012334
- Publication date Jan 16, 2003
- David S. Kurtz
- G01 - MEASURING TESTING

David S. Kurtz

Person

Patents Grantslast 30 patents

Method and apparatus for thin film thickness mapping

Method and apparatus for rapid grain size analysis of polycrystalli...

Method and apparatus for thin film thickness mapping

Method and apparatus for quantitative phase analysis of textured po...

Apparatus and method for texture analysis on semiconductor wafers

Photo-sensor fiber-optic stress analysis system

Apparatus for rapid in-situ X-ray stress measurement during thermal...

Photo-sensor fiber-optic stress analysis system

Large angle solid state position sensitive x-ray detector system

Large angle solid state position sensitive x-ray detector system

Patents Applicationslast 30 patents

Method and apparatus for thin film thickness mapping

METHOD AND APPARATUS FOR THIN FILM THICKNESS MAPPING

Method and apparatus for rapid grain size analysis of polycrystalli...