David T. Wei

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Malibu, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Using a polaron interaction zone as an interface to integrate a pla...
- Patent number 7,495,230
- Issue date Feb 24, 2009
- California Institute of Technology
- David T. Wei
- G01 - MEASURING TESTING
Information Patent Grant
Utilizing an integrated plasmon detector to measure a metal deposit...
- Patent number 7,297,966
- Issue date Nov 20, 2007
- California Institute of Technology
- David T. Wei
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for ion beam sputter deposition of thin films
- Patent number 6,190,511
- Issue date Feb 20, 2001
- David T. Wei
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for fabricating multi-layer optical films
- Patent number RE32849
- Issue date Jan 31, 1989
- Litton Systems, Inc.
- David T. Wei
- 204 - Chemistry: electrical and wave energy
Information Patent Grant
Method for fabricating multi-layer optical films
- Patent number 4,142,958
- Issue date Mar 6, 1979
- Litton Systems, Inc.
- David T. Wei
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
Using a polaron interaction zone as an interface to integrate a pla...
- Publication number 20060170926
- Publication date Aug 3, 2006
- David T. Wei
- G01 - MEASURING TESTING
Information Patent Application
Utilizing an integrated plasmon detector to measure a metal deposit...
- Publication number 20060050280
- Publication date Mar 9, 2006
- David T. Wei
- G01 - MEASURING TESTING