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David VerNon Blackham
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Santa Rosa, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Determining operating characteristics of signal generator using mea...
Patent number
9,632,122
Issue date
Apr 25, 2017
Keysight Technologies, Inc.
Loren C. Betts
G01 - MEASURING TESTING
Information
Patent Grant
Differential vector network analyzer
Patent number
7,545,150
Issue date
Jun 9, 2009
Agilent Technologies, Inc.
Keith F. Anderson
G01 - MEASURING TESTING
Information
Patent Grant
Impedance analyzer
Patent number
7,161,358
Issue date
Jan 9, 2007
Agilent Technologies, Inc.
Hassan Tanbakuchi
G01 - MEASURING TESTING
Information
Patent Grant
VNA and method for addressing transmission line effects in VNA meas...
Patent number
7,148,702
Issue date
Dec 12, 2006
Agilent Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Method for implementing TRL calibration in VNA
Patent number
7,124,049
Issue date
Oct 17, 2006
Agilent Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Power calibration for multi-port vector network analyzer (VNA)
Patent number
7,061,254
Issue date
Jun 13, 2006
Agilent Technologies, Inc.
Robert Edward Shoulders
G01 - MEASURING TESTING
Information
Patent Grant
Network analyzer applying loss compensation using port extensions a...
Patent number
7,054,780
Issue date
May 30, 2006
Agilent Technologies, Inc.
Joel Dunsmore
G01 - MEASURING TESTING
Information
Patent Grant
Multiport calibration simplification using the “unknown thru” method
Patent number
7,019,536
Issue date
Mar 28, 2006
Agilent Technologies, Inc.
Keith F. Anderson
G01 - MEASURING TESTING
Information
Patent Grant
Noise measurement system and method
Patent number
7,010,443
Issue date
Mar 7, 2006
Agilent Technologies, Inc.
Shigetsune Torin
G01 - MEASURING TESTING
Information
Patent Grant
Vector network analyzer mixer calibration using the unknown thru ca...
Patent number
6,995,571
Issue date
Feb 7, 2006
Agilent Technologies, Inc.
James C. Liu
G01 - MEASURING TESTING
Information
Patent Grant
Compensating for unequal load and source match in vector network an...
Patent number
6,836,743
Issue date
Dec 28, 2004
Agilent Technologies, Inc.
David V. Blackham
G01 - MEASURING TESTING
Information
Patent Grant
System and method for determining measurement errors of a testing d...
Patent number
6,823,276
Issue date
Nov 23, 2004
Agilent Technologies, Inc.
David V. Blackham
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for efficient measurement of reciprocal multip...
Patent number
6,396,285
Issue date
May 28, 2002
Agilent Technologies, Inc.
David VerNon Blackham
G01 - MEASURING TESTING
Information
Patent Grant
Removing effects of adapters present during vector network analyzer...
Patent number
6,188,968
Issue date
Feb 13, 2001
Agilent Technologies Inc.
David VerNon Blackham
G01 - MEASURING TESTING
Information
Patent Grant
Error correction method for reflection measurements of reciprocal d...
Patent number
6,060,888
Issue date
May 9, 2000
Hewlett-Packard Company
David V. Blackham
G01 - MEASURING TESTING
Information
Patent Grant
Error correction method for transmission measurements in vector net...
Patent number
5,748,000
Issue date
May 5, 1998
Hewlett-Packard Company
David Vernon Blackham
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETERMINING OPERATING CHARACTERISTICS OF SIGNAL GENERATOR USING MEA...
Publication number
20150369849
Publication date
Dec 24, 2015
Keysight Technologies, Inc.
Loren C. Betts
G01 - MEASURING TESTING
Information
Patent Application
Differential Vector Network Analyzer
Publication number
20080204041
Publication date
Aug 28, 2008
Keith F. Anderson
G01 - MEASURING TESTING
Information
Patent Application
N-port signal separation apparatus with improved frequency selectiv...
Publication number
20080020726
Publication date
Jan 24, 2008
David V. Blackham
G01 - MEASURING TESTING
Information
Patent Application
VNA and method for addressing transmission line effects in VNA meas...
Publication number
20060226856
Publication date
Oct 12, 2006
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMPLEMENTING TRL CALIBRATION IN VNA
Publication number
20060161369
Publication date
Jul 20, 2006
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
Network analyzer applying loss compensation using port extensions a...
Publication number
20060074582
Publication date
Apr 6, 2006
Joel Dunsmore
G01 - MEASURING TESTING
Information
Patent Application
Noise measurement system and method
Publication number
20050096859
Publication date
May 5, 2005
Shigetsune Torin
G01 - MEASURING TESTING
Information
Patent Application
System and method for determining measurement errors of a testing d...
Publication number
20040199350
Publication date
Oct 7, 2004
David V. Blackham
G01 - MEASURING TESTING
Information
Patent Application
Modeling pin depths associated with coaxial standards
Publication number
20040162713
Publication date
Aug 19, 2004
David VerNon Blackham
G06 - COMPUTING CALCULATING COUNTING