TREA

David W. Henry

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  • Liberty, MO, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Series connector
    • Patent number 9,437,954
    • Issue date Sep 6, 2016
    • Interconnect Devices, Inc.
    • Timothy E. Marshall
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electrical probe with rotatable plunger
    • Patent number 9,209,548
    • Issue date Dec 8, 2015
    • Interconnect Devices, Inc.
    • David Wayne Henry
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Interconnect system
    • Patent number 8,575,953
    • Issue date Nov 5, 2013
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical connector with embedded shell layer
    • Patent number 8,506,307
    • Issue date Aug 13, 2013
    • Interconnect Devices, Inc.
    • David Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Adjustable test socket
    • Patent number 8,062,039
    • Issue date Nov 22, 2011
    • Interconnect Devices, Inc.
    • Jason W. Farris
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Adjustable test socket
    • Patent number 7,581,962
    • Issue date Sep 1, 2009
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe array wafer
    • Patent number 7,498,826
    • Issue date Mar 3, 2009
    • Interconnect Devices, Inc.
    • Eric L. Bogatin
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe with contact ring
    • Patent number 7,362,118
    • Issue date Apr 22, 2008
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe and test socket assembly
    • Patent number 6,424,166
    • Issue date Jul 23, 2002
    • David W. Henry
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRICAL PROBE WITH ROTATABLE PLUNGER
    • Publication number 20150280344
    • Publication date Oct 1, 2015
    • INTERCONNECT DEVICES, INC.
    • David Wayne Henry
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SERIES CONNECTOR
    • Publication number 20140322988
    • Publication date Oct 30, 2014
    • INTERCONNECT DEVICES, INC.
    • Timothy E. Marshall
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electrical Connector With Embedded Shell Layer
    • Publication number 20120142229
    • Publication date Jun 7, 2012
    • David Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    Interconnect System
    • Publication number 20110312229
    • Publication date Dec 22, 2011
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTERCONNECT SYSTEM
    • Publication number 20090289647
    • Publication date Nov 26, 2009
    • INTERCONNECT DEVICES, INC.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    ADJUSTABLE TEST SOCKET
    • Publication number 20090227125
    • Publication date Sep 10, 2009
    • INTERCONNECT DEVICES, INC.
    • Jason W. Farris
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe array wafer
    • Publication number 20080068034
    • Publication date Mar 20, 2008
    • Eric L. Bogatin
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe with contact ring
    • Publication number 20080048701
    • Publication date Feb 28, 2008
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    Adjustable test socket
    • Publication number 20070285106
    • Publication date Dec 13, 2007
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    Electrical contact spring probe with RF shielding
    • Publication number 20030042883
    • Publication date Mar 6, 2003
    • William E. Thurston
    • G01 - MEASURING TESTING