Deepak A. Ramappa

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Simultaneous via and trench patterning using different etch rates
- Patent number 8,614,143
- Issue date Dec 24, 2013
- Texas Instruments Incorporated
- Makarand R. Kulkarni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch residue reduction by ash methodology
- Patent number 7,910,477
- Issue date Mar 22, 2011
- Texas Instruments Incorporated
- Jeannette Michelle Jacques
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures for testing and locating defects in integrated circuits
- Patent number 7,772,867
- Issue date Aug 10, 2010
- Texas Instruments Incorporated
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductive device fabricated using subliming materials to form...
- Patent number 7,601,629
- Issue date Oct 13, 2009
- Texas Instruments Incorporated
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to detect and predict metal silicide defects in a microelect...
- Patent number 7,443,189
- Issue date Oct 28, 2008
- Texas Instruments Incorporated
- Deepak A. Ramappa
- G01 - MEASURING TESTING
Information Patent Grant
System for ultraviolet atmospheric seed layer remediation
- Patent number 7,312,151
- Issue date Dec 25, 2007
- Texas Instruments Incorporated
- Aaron Frank
- B08 - CLEANING
Information Patent Grant
Post-polish treatment for inhibiting copper corrosion
- Patent number 7,268,073
- Issue date Sep 11, 2007
- Texas Instruments Incorporated
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for detecting structure dependent process defects
- Patent number 7,228,193
- Issue date Jun 5, 2007
- Texas Instruments Incorporated
- Richard L. Guldi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for remediating cross contamination in semiconductor manufac...
- Patent number 7,200,498
- Issue date Apr 3, 2007
- Texas Instruments Incorporated
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pretreatment for an electroplating process and an electroplating pr...
- Patent number 7,112,540
- Issue date Sep 26, 2006
- Texas Instruments Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for ultraviolet atmospheric seed layer remediation
- Patent number 7,015,568
- Issue date Mar 21, 2006
- Texas Instruments Incorporated
- Aaron Frank
- B08 - CLEANING
Information Patent Grant
System and method of evaluating gate oxide integrity for semiconduc...
- Patent number 6,963,206
- Issue date Nov 8, 2005
- Texas Instruments Incorporated
- Deepak A. Ramappa
- G01 - MEASURING TESTING
Information Patent Grant
System and method of evaluating gate oxide integrity for semiconduc...
- Patent number 6,812,050
- Issue date Nov 2, 2004
- Texas Instruments Incorporated
- Deepak A. Ramappa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SIMULTANEOUS VIA AND TRENCH PATTERNING USING DIFFERENT ETCH RATES
- Publication number 20100136781
- Publication date Jun 3, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Makarand R. Kulkarni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURES FOR TESTING AND LOCATING DEFECTS IN INTEGRATED CIRCUITS
- Publication number 20090212793
- Publication date Aug 27, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Application
Etch residue reduction by ash methodology
- Publication number 20090170221
- Publication date Jul 2, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Jeannette Michelle Jacques
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURES FOR E-BEAM TESTING OF SYSTEMATIC AND RANDOM DEFECTS...
- Publication number 20090102501
- Publication date Apr 23, 2009
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Application
Method for Manufacturing Microdevices or Integrated Circuits on Con...
- Publication number 20090087938
- Publication date Apr 2, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Deepak A. Ramappa
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD TO DETECT AND PREDICT METAL SILICIDE DEFECTS IN A MICROELECT...
- Publication number 20090017564
- Publication date Jan 15, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Deepak A. Ramappa
- G01 - MEASURING TESTING
Information Patent Application
DAMASCENE PROCESS HAVING RETAINED CAPPING LAYER THROUGH METALLIZATI...
- Publication number 20080299718
- Publication date Dec 4, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Ping Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inline method to detect and evaluate early failure rates of interco...
- Publication number 20070197020
- Publication date Aug 23, 2007
- Texas Instruments Inc.
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductive device fabricated using subliming materials to form...
- Publication number 20070141829
- Publication date Jun 21, 2007
- Texas Instruments, Incorporated
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for detecting structure dependent process defects
- Publication number 20070038325
- Publication date Feb 15, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Richard L. Guldi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method to detect and predict metal silicide defects in a microelect...
- Publication number 20060172443
- Publication date Aug 3, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Deepak A. Ramappa
- G01 - MEASURING TESTING
Information Patent Application
System for ultraviolet atmospheric seed layer remediation
- Publication number 20060113499
- Publication date Jun 1, 2006
- Aaron Frank
- B08 - CLEANING
Information Patent Application
Post-polish treatment for inhibiting copper corrosion
- Publication number 20060099804
- Publication date May 11, 2006
- Texas Instruments Inc.
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for remediating cross contamination in semiconductor manufac...
- Publication number 20050274805
- Publication date Dec 15, 2005
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pretreatment for an electroplating process and an electroplating pr...
- Publication number 20050164496
- Publication date Jul 28, 2005
- Texas Instruments, Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for ultraviolet atmospheric seed layer remediation
- Publication number 20050042886
- Publication date Feb 24, 2005
- Aaron Frank
- B08 - CLEANING
Information Patent Application
System and method of evaluating gate oxide integrity for semiconduc...
- Publication number 20050037525
- Publication date Feb 17, 2005
- Deepak A. Ramappa
- G01 - MEASURING TESTING

Deepak A. Ramappa

Person

Patents Grantslast 30 patents

Simultaneous via and trench patterning using different etch rates

Etch residue reduction by ash methodology

Structures for testing and locating defects in integrated circuits

Semiconductive device fabricated using subliming materials to form...

Method to detect and predict metal silicide defects in a microelect...

System for ultraviolet atmospheric seed layer remediation

Post-polish treatment for inhibiting copper corrosion

Methods for detecting structure dependent process defects

System for remediating cross contamination in semiconductor manufac...

Pretreatment for an electroplating process and an electroplating pr...

System for ultraviolet atmospheric seed layer remediation

System and method of evaluating gate oxide integrity for semiconduc...

System and method of evaluating gate oxide integrity for semiconduc...

Patents Applicationslast 30 patents

SIMULTANEOUS VIA AND TRENCH PATTERNING USING DIFFERENT ETCH RATES

STRUCTURES FOR TESTING AND LOCATING DEFECTS IN INTEGRATED CIRCUITS

Etch residue reduction by ash methodology

TEST STRUCTURES FOR E-BEAM TESTING OF SYSTEMATIC AND RANDOM DEFECTS...

Method for Manufacturing Microdevices or Integrated Circuits on Con...

METHOD TO DETECT AND PREDICT METAL SILICIDE DEFECTS IN A MICROELECT...

DAMASCENE PROCESS HAVING RETAINED CAPPING LAYER THROUGH METALLIZATI...

Inline method to detect and evaluate early failure rates of interco...

Semiconductive device fabricated using subliming materials to form...

Methods for detecting structure dependent process defects

Method to detect and predict metal silicide defects in a microelect...

System for ultraviolet atmospheric seed layer remediation

Post-polish treatment for inhibiting copper corrosion

System for remediating cross contamination in semiconductor manufac...

Pretreatment for an electroplating process and an electroplating pr...

System for ultraviolet atmospheric seed layer remediation

System and method of evaluating gate oxide integrity for semiconduc...