Dennis M. Adderton

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Video training system
- Patent number 7,920,165
- Issue date Apr 5, 2011
- Dennis M. Adderton
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dynamic activation for an atomic force microscope and method of use...
- Patent number 7,204,131
- Issue date Apr 17, 2007
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic activation for an atomic force microscope and method of use...
- Patent number 7,036,357
- Issue date May 2, 2006
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Active probe for an atomic force microscope and method for use thereof
- Patent number 7,017,398
- Issue date Mar 28, 2006
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Three-axis sensor assembly for use in an elastomeric material
- Patent number 6,951,143
- Issue date Oct 4, 2005
- Michelin Recherche et Technique S.A.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method to compensate for stress in a microcantilever
- Patent number 6,941,823
- Issue date Sep 13, 2005
- Veeco Instruments Inc.
- Jonathan W. Lai
- G01 - MEASURING TESTING
Information Patent Grant
Active probe for an atomic force microscope and method of use thereof
- Patent number 6,810,720
- Issue date Nov 2, 2004
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic activation for an atomic force microscope and method of use...
- Patent number 6,672,144
- Issue date Jan 6, 2004
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Tire sensor and method
- Patent number 6,637,276
- Issue date Oct 28, 2003
- Michelin Recherche et Technique S.A.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Active probe for an atomic force microscope and method of use thereof
- Patent number 6,530,266
- Issue date Mar 11, 2003
- NanoDevices, Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
AFM with referenced or differential height measurement
- Patent number 6,279,389
- Issue date Aug 28, 2001
- NanoDevices, Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AFM with referenced or differential height measurement
- Patent number 6,196,061
- Issue date Mar 6, 2001
- NanoDevices, Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Active probe for an atomic force microscope and method of use thereof
- Patent number 6,189,374
- Issue date Feb 20, 2001
- NanoDevices, Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Capacitance atomic force microscopes and methods of operating such...
- Patent number 6,172,506
- Issue date Jan 9, 2001
- Veeco Instruments Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope for measuring properties of dielectric and...
- Patent number 5,874,734
- Issue date Feb 23, 1999
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Kinetic Interface
- Publication number 20090303179
- Publication date Dec 10, 2009
- Daniel J Overholt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Video training system
- Publication number 20070069977
- Publication date Mar 29, 2007
- Dennis M. Adderton
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
Dynamic activation for an atomic force microscope and method of use...
- Publication number 20060191329
- Publication date Aug 31, 2006
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Rapid thermal chemical vapor deposition apparatus and method
- Publication number 20050109280
- Publication date May 26, 2005
- Xiangqun S. Chen
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Active probe for an atomic force microscope and method for use thereof
- Publication number 20050066714
- Publication date Mar 31, 2005
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Dynamic activation for an atomic force microscope and method of use...
- Publication number 20040255651
- Publication date Dec 23, 2004
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus of carbon nanotube fabrication
- Publication number 20040053440
- Publication date Mar 18, 2004
- First Nano, Inc.
- Jonathan W. Lai
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Method and apparatus of carbon nanotube fabrication
- Publication number 20040037767
- Publication date Feb 26, 2004
- First Nano, Inc.
- Dennis M. Adderton
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Active probe for an atomic force microscope and method of use thereof
- Publication number 20030094036
- Publication date May 22, 2003
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Tire sensor and method
- Publication number 20020092364
- Publication date Jul 18, 2002
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Dynamic activation for an atomic force microscope and method of use...
- Publication number 20020062684
- Publication date May 30, 2002
- Nanodevices, Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY

Dennis M. Adderton

Person

Patents Grantslast 30 patents

Video training system

Dynamic activation for an atomic force microscope and method of use...

Dynamic activation for an atomic force microscope and method of use...

Active probe for an atomic force microscope and method for use thereof

Three-axis sensor assembly for use in an elastomeric material

Apparatus and method to compensate for stress in a microcantilever

Active probe for an atomic force microscope and method of use thereof

Dynamic activation for an atomic force microscope and method of use...

Tire sensor and method

Active probe for an atomic force microscope and method of use thereof

AFM with referenced or differential height measurement

AFM with referenced or differential height measurement

Active probe for an atomic force microscope and method of use thereof

Capacitance atomic force microscopes and methods of operating such...

Atomic force microscope for measuring properties of dielectric and...

Patents Applicationslast 30 patents

Kinetic Interface

Video training system

Dynamic activation for an atomic force microscope and method of use...

Rapid thermal chemical vapor deposition apparatus and method

Active probe for an atomic force microscope and method for use thereof

Dynamic activation for an atomic force microscope and method of use...

Method and apparatus of carbon nanotube fabrication

Method and apparatus of carbon nanotube fabrication

Active probe for an atomic force microscope and method of use thereof

Tire sensor and method

Dynamic activation for an atomic force microscope and method of use...