Dennis R. Conti

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Compliant organic substrate assembly for rigid probes
- Patent number 11,561,243
- Issue date Jan 24, 2023
- International Business Machines Corporation
- David Audette
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect and tuning thereof
- Patent number 11,322,473
- Issue date May 3, 2022
- International Business Machines Corporation
- David Audette
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low force wafer test probe
- Patent number 11,029,334
- Issue date Jun 8, 2021
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester probe contact liner
- Patent number 11,009,545
- Issue date May 18, 2021
- International Business Machines Corporation
- Charles L. Arvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated circuit tester probe contact liner
- Patent number 10,670,653
- Issue date Jun 2, 2020
- International Business Machines Corporation
- Charles L. Arvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Low force wafer test probe with variable geometry
- Patent number 10,663,487
- Issue date May 26, 2020
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
Low force wafer test probe
- Patent number 10,444,260
- Issue date Oct 15, 2019
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
Low force wafer test probe with variable geometry
- Patent number 10,261,108
- Issue date Apr 16, 2019
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
Programmable active thermal control
- Patent number 9,152,517
- Issue date Oct 6, 2015
- International Business Machines Corporation
- Harold Chase
- G01 - MEASURING TESTING
Information Patent Grant
Device burn in utilizing voltage control
- Patent number 7,265,561
- Issue date Sep 4, 2007
- International Business Machines Corporation
- Dennis R. Conti
- G01 - MEASURING TESTING
Information Patent Grant
Applying parametric test patterns for high pin count ASICs on low p...
- Patent number 6,847,203
- Issue date Jan 25, 2005
- International Business Machines Corporation
- Dennis R. Conti
- G01 - MEASURING TESTING
Information Patent Grant
Segmented architecture for wafer test and burn-in
- Patent number 6,275,051
- Issue date Aug 14, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING
Information Patent Grant
Method for choosing replacement lines in a two dimensionally redund...
- Patent number 4,751,656
- Issue date Jun 14, 1988
- International Business Machines Corporation
- Dennis R. Conti
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
COMPLIANT ORGANIC SUBSTRATE ASSEMBLY FOR RIGID PROBES
- Publication number 20210080486
- Publication date Mar 18, 2021
- International Business Machines Corporation
- David Audette
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERCONNECT AND TUNING THEREOF
- Publication number 20210082860
- Publication date Mar 18, 2021
- International Business Machines Corporation
- David Audette
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT TESTER PROBE CONTACT LINER
- Publication number 20200209308
- Publication date Jul 2, 2020
- International Business Machines Corporation
- Charles L. Arvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LOW FORCE WAFER TEST PROBE
- Publication number 20190361048
- Publication date Nov 28, 2019
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTER PROBE CONTACT LINER
- Publication number 20190353702
- Publication date Nov 21, 2019
- Charles L. Arvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LOW FORCE WAFER TEST PROBE WITH VARIABLE GEOMETRY
- Publication number 20190195913
- Publication date Jun 27, 2019
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
PRESSING SOLDER BUMPS TO MATCH PROBE PROFILE DURING WAFER LEVEL TES...
- Publication number 20180358321
- Publication date Dec 13, 2018
- International Business Machines Corporation
- David M. Audette
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PRESSING SOLDER BUMPS TO MATCH PROBE PROFILE DURING WAFER LEVEL TES...
- Publication number 20180358322
- Publication date Dec 13, 2018
- International Business Machines Corporation
- David M. Audette
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PRESSING SOLDER BUMPS TO MATCH PROBE PROFILE DURING WAFER LEVEL TES...
- Publication number 20180358323
- Publication date Dec 13, 2018
- International Business Machines Corporation
- David M. Audette
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LOW FORCE WAFER TEST PROBE
- Publication number 20180017592
- Publication date Jan 18, 2018
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
LOW FORCE WAFER TEST PROBE WITH VARIABLE GEOMETRY
- Publication number 20180017596
- Publication date Jan 18, 2018
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE ACTIVE THERMAL CONTROL
- Publication number 20120272100
- Publication date Oct 25, 2012
- International Business Machines Corporation
- Harold Chase
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE BURN IN UTILIZING VOLTAGE CONTROL
- Publication number 20050068053
- Publication date Mar 31, 2005
- International Business Machines Corporation
- Dennis R. Conti
- G01 - MEASURING TESTING
Information Patent Application
APPLYING PARAMETRIC TEST PATTERNS FOR HIGH PIN COUNT ASICS ON LOW P...
- Publication number 20050001611
- Publication date Jan 6, 2005
- International Business Machines Corporation
- Dennis R. Conti
- G01 - MEASURING TESTING
Information Patent Application
Segmented architecture for wafer test & burn-in
- Publication number 20010050567
- Publication date Dec 13, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING

Dennis R. Conti

Person

Patents Grantslast 30 patents

Compliant organic substrate assembly for rigid probes

Interconnect and tuning thereof

Low force wafer test probe

Integrated circuit tester probe contact liner

Integrated circuit tester probe contact liner

Low force wafer test probe with variable geometry

Low force wafer test probe

Low force wafer test probe with variable geometry

Programmable active thermal control

Device burn in utilizing voltage control

Applying parametric test patterns for high pin count ASICs on low p...

Segmented architecture for wafer test and burn-in

Method for choosing replacement lines in a two dimensionally redund...

Patents Applicationslast 30 patents

COMPLIANT ORGANIC SUBSTRATE ASSEMBLY FOR RIGID PROBES

INTERCONNECT AND TUNING THEREOF

INTEGRATED CIRCUIT TESTER PROBE CONTACT LINER

LOW FORCE WAFER TEST PROBE

INTEGRATED CIRCUIT TESTER PROBE CONTACT LINER

LOW FORCE WAFER TEST PROBE WITH VARIABLE GEOMETRY

PRESSING SOLDER BUMPS TO MATCH PROBE PROFILE DURING WAFER LEVEL TES...

PRESSING SOLDER BUMPS TO MATCH PROBE PROFILE DURING WAFER LEVEL TES...

PRESSING SOLDER BUMPS TO MATCH PROBE PROFILE DURING WAFER LEVEL TES...

LOW FORCE WAFER TEST PROBE

LOW FORCE WAFER TEST PROBE WITH VARIABLE GEOMETRY

PROGRAMMABLE ACTIVE THERMAL CONTROL

DEVICE BURN IN UTILIZING VOLTAGE CONTROL

APPLYING PARAMETRIC TEST PATTERNS FOR HIGH PIN COUNT ASICS ON LOW P...

Segmented architecture for wafer test & burn-in