Derek C. Stoll

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Hopewell Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Providing a dynamic sampling plan for integrated metrology
- Patent number 7,577,537
- Issue date Aug 18, 2009
- International Business Machines Corporation
- Gary W. Behm
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and system for reducing the variation in film thickness on a...
- Patent number 7,509,186
- Issue date Mar 24, 2009
- International Business Machines Corporation
- Yue Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of providing a dynamic sampling plan for integrat...
- Patent number 7,398,172
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Gary W. Behm
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
PROVIDING A DYNAMIC SAMPLING PLAN FOR INTEGRATED METROLOGY
- Publication number 20080167830
- Publication date Jul 10, 2008
- International Business Machines Corporation
- Gary W. Behm
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR REDUCING THE VARIATION IN FILM THICKNESS ON A...
- Publication number 20080124818
- Publication date May 29, 2008
- International Business Machines Corporation
- Yue Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF PROVIDING A DYNAMIC SAMPLING PLAN FOR INTEGRAT...
- Publication number 20070282549
- Publication date Dec 6, 2007
- International Business Machines Corporation
- Gary W. Behm
- G05 - CONTROLLING REGULATING