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Derek Hullinger
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Orem, UT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Vibration noise shield in a semiconductor sensor
Patent number
8,766,396
Issue date
Jul 1, 2014
Moxtek, Inc.
Keith Decker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Small x-ray tube with electron beam control optics
Patent number
8,761,344
Issue date
Jun 24, 2014
Moxtek, Inc.
David Reynolds
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor MOS entrance window for radiation detectors
Patent number
8,698,091
Issue date
Apr 15, 2014
Moxtek, Inc.
Keith W. Decker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Variable ring width SDD
Patent number
8,314,468
Issue date
Nov 20, 2012
Moxtek, Inc.
Derek Hullinger
G01 - MEASURING TESTING
Information
Patent Grant
Alternate 4-terminal JFET geometry to reduce gate to source capacit...
Patent number
8,058,674
Issue date
Nov 15, 2011
Moxtek, Inc.
Derek Hullinger
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
VIBRATION NOISE SHIELD IN A SEMICONDUCTOR SENSOR
Publication number
20140124905
Publication date
May 8, 2014
MOXTEK, INC.
Keith Decker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SMALL X-RAY TUBE WITH ELECTRON BEAM CONTROL OPTICS
Publication number
20130170623
Publication date
Jul 4, 2013
David Reynolds
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR MOS ENTRANCE WINDOW FOR RADIATION DETECTORS
Publication number
20120313195
Publication date
Dec 13, 2012
Keith W. Decker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ALTERNATE 4-TERMINAL JFET GEOMETRY TO REDUCE GATE TO SOURCE CAPACIT...
Publication number
20110079824
Publication date
Apr 7, 2011
Derek Hullinger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VARIABLE RING WIDTH SDD
Publication number
20100314706
Publication date
Dec 16, 2010
Derek Hullinger
G01 - MEASURING TESTING