Membership
Tour
Register
Log in
Derek Matthew Kita
Follow
Person
Cambridge, MA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
High-performance on-chip spectrometers and spectrum analyzers
Patent number
11,885,677
Issue date
Jan 30, 2024
Massachusetts Institute of Technology
Derek Kita
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for Raman spectroscopy
Patent number
11,885,684
Issue date
Jan 30, 2024
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Grant
Chip-scale optical coherence tomography engine
Patent number
11,564,565
Issue date
Jan 31, 2023
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Grant
Miniaturized Fourier-transform Raman spectrometer systems and methods
Patent number
11,313,725
Issue date
Apr 26, 2022
Massachusetts Institute of Technology
Tian Gu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for Raman spectroscopy
Patent number
11,041,759
Issue date
Jun 22, 2021
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Grant
High-performance on-chip spectrometers and spectrum analyzers
Patent number
10,983,003
Issue date
Apr 20, 2021
Massachusetts Institute of Technology
Derek Kita
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, systems, and methods for on-chip spectroscopy using opti...
Patent number
10,852,190
Issue date
Dec 1, 2020
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Grant
Miniaturized Fourier-transform Raman spectrometer systems and methods
Patent number
10,718,668
Issue date
Jul 21, 2020
Massachusetts Institute of Technology
Tian Gu
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for spectral imaging
Patent number
10,571,335
Issue date
Feb 25, 2020
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, systems, and methods for on-chip spectroscopy using opti...
Patent number
10,386,237
Issue date
Aug 20, 2019
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for spectral imaging
Patent number
10,240,980
Issue date
Mar 26, 2019
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, systems, and methods for on-chip spectroscopy using opti...
Patent number
10,006,809
Issue date
Jun 26, 2018
Massachusetts Institute of Technology
Juejun Hu
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
Chip-Scale Optical Coherence Tomography Engine
Publication number
20210307603
Publication date
Oct 7, 2021
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR RAMAN SPECTROSCOPY
Publication number
20210262860
Publication date
Aug 26, 2021
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Application
High-Performance On-Chip Spectrometers and Spectrum Analyzers
Publication number
20210239526
Publication date
Aug 5, 2021
Massachusetts Institute of Technology
Derek Kita
G01 - MEASURING TESTING
Information
Patent Application
MINIATURIZED FOURIER-TRANSFORM RAMAN SPECTROMETER SYSTEMS AND METHODS
Publication number
20210025756
Publication date
Jan 28, 2021
Massachusetts Institute of Technology
Tian GU
G01 - MEASURING TESTING
Information
Patent Application
High-Performance On-Chip Spectrometers and Spectrum Analyzers
Publication number
20200256728
Publication date
Aug 13, 2020
Massachusetts Institute of Technology
Derek Kita
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR RAMAN SPECTROSCOPY
Publication number
20200003619
Publication date
Jan 2, 2020
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Application
Apparatus, Systems, and Methods for On-Chip Spectroscopy Using Opti...
Publication number
20190331529
Publication date
Oct 31, 2019
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Spectral Imaging
Publication number
20190285473
Publication date
Sep 19, 2019
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Application
MINIATURIZED FOURIER-TRANSFORM RAMAN SPECTROMETER SYSTEMS AND METHODS
Publication number
20190049300
Publication date
Feb 14, 2019
Tian GU
G01 - MEASURING TESTING
Information
Patent Application
Apparatus, Systems, and Methods for On-Chip Spectroscopy Using Opti...
Publication number
20180274981
Publication date
Sep 27, 2018
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Spectral Imaging
Publication number
20170299434
Publication date
Oct 19, 2017
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Application
Apparatus, Systems, and Methods for On-Chip Spectroscopy Using Opti...
Publication number
20170227399
Publication date
Aug 10, 2017
Juejun Hu
G02 - OPTICS