Derren Neylon Dunn

Person

Sandy Hook, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Predictive multi-stage modelling for complex process control
- Patent number 11,568,101
- Issue date Jan 31, 2023
- International Business Machines Corporation
- Scott Halle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrical mask validation
- Patent number 11,288,429
- Issue date Mar 29, 2022
- International Business Machines Corporation
- Daniel Corliss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic generation of via patterns with coordinate-based recurren...
- Patent number 10,990,747
- Issue date Apr 27, 2021
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor structure for optical validation
- Patent number 10,921,715
- Issue date Feb 16, 2021
- International Business Machines Corporation
- Daniel Corliss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Co-optimization of lithographic and etching processes with compleme...
- Patent number 10,768,532
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Jing Sha
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask process aware calibration using mask pattern fidelity inspections
- Patent number 10,725,454
- Issue date Jul 28, 2020
- International Business Machines Corporation
- Ravi K. Bonam
- G05 - CONTROLLING REGULATING
Information Patent Grant
Generative adversarial networks for generating physical design layo...
- Patent number 10,706,200
- Issue date Jul 7, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generative adversarial networks for generating physical design layo...
- Patent number 10,699,055
- Issue date Jun 30, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Space exploration with Bayesian inference
- Patent number 10,678,971
- Issue date Jun 9, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modeling post-lithography stochastic critical dimension variation w...
- Patent number 10,657,420
- Issue date May 19, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrical mask validation
- Patent number 10,650,111
- Issue date May 12, 2020
- International Business Machines Corporation
- Daniel Corliss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coordinates-based variational autoencoder for generating synthetic...
- Patent number 10,621,301
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coordinates-based generative adversarial networks for generating sy...
- Patent number 10,606,975
- Issue date Mar 31, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic generation of via patterns with coordinate-based recurren...
- Patent number 10,599,807
- Issue date Mar 24, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating synthetic layout patterns by feedforward neural network...
- Patent number 10,592,635
- Issue date Mar 17, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Co-modeling post-lithography critical dimensions and post-etch crit...
- Patent number 10,579,764
- Issue date Mar 3, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical mask validation
- Patent number 10,429,743
- Issue date Oct 1, 2019
- International Business Machines Corporation
- Daniel Corliss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern improvement in multiprocess patterning
- Patent number 9,087,739
- Issue date Jul 21, 2015
- International Business Machines Corporation
- Derren N. Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern improvement in multiprocess patterning
- Patent number 9,034,562
- Issue date May 19, 2015
- International Business Machines Corporation
- Derren Neylon Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
MEEF reduction by elongation of square shapes
- Patent number 7,975,246
- Issue date Jul 5, 2011
- International Business Machines Corporation
- Derren Neylon Dunn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Structure to improve adhesion between top CVD low-k dielectric and...
- Patent number 7,402,532
- Issue date Jul 22, 2008
- International Business Machines Corporation
- Lawrence A. Clevenger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
PE-ALD of TaN diffusion barrier region on low-k materials
- Patent number 7,211,507
- Issue date May 1, 2007
- International Business Machines Corporation
- Derren N. Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure to improve adhesion between top CVD low-k dielectric and...
- Patent number 7,102,232
- Issue date Sep 5, 2006
- International Business Machines Corporation
- Lawrence A. Clevenger
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ENABLING DEVICE SECURITY BY DESIGN ENUMERATION SELECTIVE TARGETING
- Publication number 20230177218
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Scott David Halle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Predictive Multi-Stage Modelling for Complex Process Control
- Publication number 20210049241
- Publication date Feb 18, 2021
- International Business Machines Corporation
- Scott Halle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process Optimization by Clamped Monte Carlo Distribution
- Publication number 20210049242
- Publication date Feb 18, 2021
- International Business Machines Corporation
- Scott Halle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC GENERATION OF VIA PATTERNS WITH COORDINATE-BASED RECURREN...
- Publication number 20200159983
- Publication date May 21, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK PROCESS AWARE CALIBRATION USING MASK PATTERN FIDELITY INSPECTIONS
- Publication number 20200150629
- Publication date May 14, 2020
- International Business Machines Corporation
- Ravi K. Bonam
- G05 - CONTROLLING REGULATING
Information Patent Application
ELECTRICAL MASK VALIDATION
- Publication number 20200143098
- Publication date May 7, 2020
- International Business Machines Corporation
- Daniel Corliss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN SPACE EXPLORATION WITH BAYESIAN INFERENCE
- Publication number 20200026807
- Publication date Jan 23, 2020
- International Business Machines Corporation
- Jing SHA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODELING POST-LITHOGRAPHY STOCHASTIC CRITICAL DIMENSION VARIATION W...
- Publication number 20200026962
- Publication date Jan 23, 2020
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COORDINATES-BASED VARIATIONAL AUTOENCODER FOR GENERATING SYNTHETIC...
- Publication number 20190377848
- Publication date Dec 12, 2019
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CO-MODELING POST-LITHOGRAPHY CRITICAL DIMENSIONS AND POST-ETCH CRIT...
- Publication number 20190377847
- Publication date Dec 12, 2019
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATIVE ADVERSARIAL NETWORKS FOR GENERATING PHYSICAL DESIGN LAYO...
- Publication number 20190377849
- Publication date Dec 12, 2019
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COORDINATES-BASED GENERATIVE ADVERSARIAL NETWORKS FOR GENERATING SY...
- Publication number 20190370431
- Publication date Dec 5, 2019
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC GENERATION OF VIA PATTERNS WITH COORDINATE-BASED RECURREN...
- Publication number 20190370434
- Publication date Dec 5, 2019
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING SYNTHETIC LAYOUT PATTERNS BY FEEDFORWARD NEURAL NETWORK...
- Publication number 20190370435
- Publication date Dec 5, 2019
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATIVE ADVERSARIAL NETWORKS FOR GENERATING PHYSICAL DESIGN LAYO...
- Publication number 20190370432
- Publication date Dec 5, 2019
- International Business Machines Corporation
- Jing Sha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CO-OPTIMIZATION OF LITHOGRAPHIC AND ETCHING PROCESSES WITH COMPLEME...
- Publication number 20190354022
- Publication date Nov 21, 2019
- International Business Machines Corporation
- Jing SHA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR STRUCTURE FOR OPTICAL VALIDATION
- Publication number 20190346773
- Publication date Nov 14, 2019
- International Business Machines Corporation
- Daniel Corliss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MASK VALIDATION
- Publication number 20190163071
- Publication date May 30, 2019
- International Business Machines Corporation
- Daniel Corliss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRICAL MASK VALIDATION
- Publication number 20190163857
- Publication date May 30, 2019
- International Business Machines Corporation
- Daniel Corliss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Improvement in Multiprocess Patterning
- Publication number 20140162380
- Publication date Jun 12, 2014
- International Business Machines Corporation
- Derren Neylon Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Improvement in Multiprocess Patterning
- Publication number 20110091815
- Publication date Apr 21, 2011
- International Business Machines Corporation
- Derren N. Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEEF REDUCTION BY ELONGATION OF SQUARE SHAPES
- Publication number 20100042967
- Publication date Feb 18, 2010
- International Business Machines Corporation
- Derren N. Dunn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Contact Level Mask Layouts By Introducing Anisotropic Sub-Resolutio...
- Publication number 20090191468
- Publication date Jul 30, 2009
- International Business Machines Corporation
- Michael M. Crouse
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Structure to improve adhesion between top CVD low-k dielectric and...
- Publication number 20070148958
- Publication date Jun 28, 2007
- Lawrence A. Clevenger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREVENTING DAMAGE TO INTERLEVEL DIELECTRIC
- Publication number 20070072412
- Publication date Mar 29, 2007
- International Business Machines Corporation
- Derren N. Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOSCALE DEFECT IMAGE DETECTION FOR SEMICONDUCTORS
- Publication number 20060098862
- Publication date May 11, 2006
- International Business Machines Corporation
- James J. Demarest
- G01 - MEASURING TESTING
Information Patent Application
PE-ALD OF TaN DIFFUSION BARRIER REGION ON LOW-K MATERIALS
- Publication number 20050269703
- Publication date Dec 8, 2005
- International Business Machines Corporation
- Derren N. Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure to improve adhesion between top CVD low-k dielectiric and...
- Publication number 20050230831
- Publication date Oct 20, 2005
- International Business Machines Corporation
- Lawrence A. Clevenger
- H01 - BASIC ELECTRIC ELEMENTS

Derren Neylon Dunn

Person

Patents Grantslast 30 patents

Predictive multi-stage modelling for complex process control

Electrical mask validation

Automatic generation of via patterns with coordinate-based recurren...

Semiconductor structure for optical validation

Co-optimization of lithographic and etching processes with compleme...

Mask process aware calibration using mask pattern fidelity inspections

Generative adversarial networks for generating physical design layo...

Generative adversarial networks for generating physical design layo...

Space exploration with Bayesian inference

Modeling post-lithography stochastic critical dimension variation w...

Electrical mask validation

Coordinates-based variational autoencoder for generating synthetic...

Coordinates-based generative adversarial networks for generating sy...

Automatic generation of via patterns with coordinate-based recurren...

Generating synthetic layout patterns by feedforward neural network...

Co-modeling post-lithography critical dimensions and post-etch crit...

Optical mask validation

Pattern improvement in multiprocess patterning

Pattern improvement in multiprocess patterning

MEEF reduction by elongation of square shapes

Structure to improve adhesion between top CVD low-k dielectric and...

PE-ALD of TaN diffusion barrier region on low-k materials

Structure to improve adhesion between top CVD low-k dielectric and...

Patents Applicationslast 30 patents

ENABLING DEVICE SECURITY BY DESIGN ENUMERATION SELECTIVE TARGETING

Predictive Multi-Stage Modelling for Complex Process Control

Process Optimization by Clamped Monte Carlo Distribution

AUTOMATIC GENERATION OF VIA PATTERNS WITH COORDINATE-BASED RECURREN...

MASK PROCESS AWARE CALIBRATION USING MASK PATTERN FIDELITY INSPECTIONS

ELECTRICAL MASK VALIDATION

DESIGN SPACE EXPLORATION WITH BAYESIAN INFERENCE

MODELING POST-LITHOGRAPHY STOCHASTIC CRITICAL DIMENSION VARIATION W...

COORDINATES-BASED VARIATIONAL AUTOENCODER FOR GENERATING SYNTHETIC...

CO-MODELING POST-LITHOGRAPHY CRITICAL DIMENSIONS AND POST-ETCH CRIT...

GENERATIVE ADVERSARIAL NETWORKS FOR GENERATING PHYSICAL DESIGN LAYO...

COORDINATES-BASED GENERATIVE ADVERSARIAL NETWORKS FOR GENERATING SY...

AUTOMATIC GENERATION OF VIA PATTERNS WITH COORDINATE-BASED RECURREN...

GENERATING SYNTHETIC LAYOUT PATTERNS BY FEEDFORWARD NEURAL NETWORK...

GENERATIVE ADVERSARIAL NETWORKS FOR GENERATING PHYSICAL DESIGN LAYO...

CO-OPTIMIZATION OF LITHOGRAPHIC AND ETCHING PROCESSES WITH COMPLEME...

SEMICONDUCTOR STRUCTURE FOR OPTICAL VALIDATION

OPTICAL MASK VALIDATION

ELECTRICAL MASK VALIDATION

Pattern Improvement in Multiprocess Patterning

Pattern Improvement in Multiprocess Patterning

MEEF REDUCTION BY ELONGATION OF SQUARE SHAPES

Contact Level Mask Layouts By Introducing Anisotropic Sub-Resolutio...

Structure to improve adhesion between top CVD low-k dielectric and...

PREVENTING DAMAGE TO INTERLEVEL DIELECTRIC

NANOSCALE DEFECT IMAGE DETECTION FOR SEMICONDUCTORS

PE-ALD OF TaN DIFFUSION BARRIER REGION ON LOW-K MATERIALS

Structure to improve adhesion between top CVD low-k dielectiric and...