Detlef Beckers

Person

Almelo, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Adaptable X-ray analysis apparatus
- Patent number 12,031,925
- Issue date Jul 9, 2024
- Malvern Panalytical B.V.
- Detlef Beckers
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus and method
- Patent number 11,035,805
- Issue date Jun 15, 2021
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 10,900,912
- Issue date Jan 26, 2021
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for X-ray analysis with hybrid control of beam...
- Patent number 10,782,252
- Issue date Sep 22, 2020
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
High resolution X-ray diffraction method and apparatus
- Patent number 10,753,890
- Issue date Aug 25, 2020
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder for X-ray analysis
- Patent number 10,359,376
- Issue date Jul 23, 2019
- Malvern Panalytical B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Grant
Computed tomography
- Patent number 10,352,881
- Issue date Jul 16, 2019
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus
- Patent number 9,640,292
- Issue date May 2, 2017
- PANalytical B.V.
- Detlef Beckers
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Diffraction imaging
- Patent number 9,506,880
- Issue date Nov 29, 2016
- PANalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Microdiffraction
- Patent number 9,110,003
- Issue date Aug 18, 2015
- PANalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND METHOD
- Publication number 20240298400
- Publication date Sep 5, 2024
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...
- Publication number 20230296536
- Publication date Sep 21, 2023
- MALVERN PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20230270394
- Publication date Aug 31, 2023
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS
- Publication number 20230258584
- Publication date Aug 17, 2023
- MALVERN PANALYTICAL B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MOUNTING SYSTEM FOR AN X-RAY ANALYSIS APPARATUS
- Publication number 20220187224
- Publication date Jun 16, 2022
- MALVERN PANALYTICAL B.V.
- Jaap BOKSEM
- G01 - MEASURING TESTING
Information Patent Application
X-Ray beam shaping apparatus and method
- Publication number 20220163466
- Publication date May 26, 2022
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR X-RAY ANALYSIS WITH HYBRID CONTROL OF BEAM...
- Publication number 20190317031
- Publication date Oct 17, 2019
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
X-ray Analysis Apparatus
- Publication number 20190317029
- Publication date Oct 17, 2019
- MALVERN PANALYTICAL B.V.
- Detlef BECKERS
- G01 - MEASURING TESTING
Information Patent Application
X-ray Analysis Apparatus and Method
- Publication number 20190317030
- Publication date Oct 17, 2019
- MALVERN PANALYTICAL B.V.
- Detlef BECKERS
- G01 - MEASURING TESTING
Information Patent Application
High resolution X-ray Diffraction Method and Apparatus
- Publication number 20180259464
- Publication date Sep 13, 2018
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
Computed Tomography
- Publication number 20180180560
- Publication date Jun 28, 2018
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder for X-ray Analysis
- Publication number 20180024081
- Publication date Jan 25, 2018
- PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS
- Publication number 20150200030
- Publication date Jul 16, 2015
- PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
Diffraction Imaging
- Publication number 20150003592
- Publication date Jan 1, 2015
- PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
MICRODIFFRACTION
- Publication number 20130243159
- Publication date Sep 19, 2013
- PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING

Detlef Beckers

Person

Patents Grantslast 30 patents

Adaptable X-ray analysis apparatus

X-ray beam shaping apparatus and method

Sample mounting system for an X-ray analysis apparatus

X-ray analysis apparatus and method

X-ray analysis apparatus

Apparatus and method for X-ray analysis with hybrid control of beam...

High resolution X-ray diffraction method and apparatus

Sample holder for X-ray analysis

Computed tomography

X-ray apparatus

Diffraction imaging

Microdiffraction

Patents Applicationslast 30 patents

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

X-RAY ANALYSIS APPARATUS AND METHOD

PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...

Adaptable X-Ray Analysis Apparatus

SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS

SAMPLE MOUNTING SYSTEM FOR AN X-RAY ANALYSIS APPARATUS

X-Ray beam shaping apparatus and method

APPARATUS AND METHOD FOR X-RAY ANALYSIS WITH HYBRID CONTROL OF BEAM...

X-ray Analysis Apparatus

X-ray Analysis Apparatus and Method

High resolution X-ray Diffraction Method and Apparatus

Computed Tomography

Sample Holder for X-ray Analysis

X-RAY APPARATUS

Diffraction Imaging

MICRODIFFRACTION