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Dexu Lin
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Beijing, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Ion mobility spectrometer and detecting method using the same
Patent number
8,288,718
Issue date
Oct 16, 2012
Nuctech Company Limited
Yuanjing Li
G01 - MEASURING TESTING
Information
Patent Grant
Double-faced ion source
Patent number
8,217,365
Issue date
Jul 10, 2012
Nuctech Company Limited
Zhiqiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Array-based ion storage system and method therefor
Patent number
8,084,737
Issue date
Dec 27, 2011
Nuctech Company Limited
Yuanjing Li
G01 - MEASURING TESTING
Information
Patent Grant
Ion gate for dual ion mobility spectrometer and method thereof
Patent number
8,013,297
Issue date
Sep 6, 2011
Nuctech Company Limited
Hua Peng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrode structure for drift tube in ion mobility spectrometer
Patent number
7,851,747
Issue date
Dec 14, 2010
Nuctech Company Limited
Zhiqiang Chen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ION MOBILITY SPECTOMETER AND DETECTING METHOD USING THE SAME
Publication number
20110133072
Publication date
Jun 9, 2011
Yuanjing Li
G01 - MEASURING TESTING
Information
Patent Application
ION GATE FOR DUAL ION MOBILITY SPECTROMETER AND METHOD THEREOF
Publication number
20100102219
Publication date
Apr 29, 2010
Hua Peng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Array-based ion storage system and method therefor
Publication number
20100065755
Publication date
Mar 18, 2010
Yuanjing Li
G01 - MEASURING TESTING
Information
Patent Application
Electrode structure for drift tube in ion mobility spectrometer
Publication number
20090309013
Publication date
Dec 17, 2009
Nuctech Company Limited
Zhiqiang Chen
G01 - MEASURING TESTING
Information
Patent Application
DOUBLE-FACED ION SOURCE
Publication number
20090283694
Publication date
Nov 19, 2009
Zhiqiang CHEN
H01 - BASIC ELECTRIC ELEMENTS