Didier Dutartre

Person

Meylan, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor chip manufacturing method
- Patent number 12,211,754
- Issue date Jan 28, 2025
- STMicroelectronics S.r.l.
- Pierpaolo Monge Roffarello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit comprising a substrate equipped with a trap-rich...
- Patent number 11,978,710
- Issue date May 7, 2024
- STMicroelectronics (Crolles 2) SAS
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated optical sensor with pinned photodiodes
- Patent number 11,757,054
- Issue date Sep 12, 2023
- STMicroelectronics (Crolles 2) SAS
- Didier Dutartre
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming an electrical contact between a semiconductor fi...
- Patent number 11,562,927
- Issue date Jan 24, 2023
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit comprising a substrate equipped with a trap-rich...
- Patent number 11,075,177
- Issue date Jul 27, 2021
- STMicroelectronics (Crolles 2) SAS
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an electrical contact between a semiconductor fi...
- Patent number 10,978,340
- Issue date Apr 13, 2021
- STMicroelectronics (Crolles 2) SAS
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell comprising a phase-change material
- Patent number 10,658,578
- Issue date May 19, 2020
- STMicroelectronics (Crolles 2) SAS
- Pierre Morin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for manufacture of a semiconductor wafer suitable for the ma...
- Patent number 10,535,552
- Issue date Jan 14, 2020
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an electrical contact between a semiconductor fi...
- Patent number 10,262,898
- Issue date Apr 16, 2019
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming strained MOS transistors
- Patent number 10,263,110
- Issue date Apr 16, 2019
- STMicroelectronics (Crolles 2) SAS
- Remy Berthelon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacture of a semiconductor wafer suitable for the ma...
- Patent number 9,929,039
- Issue date Mar 27, 2018
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring thickness variations in a layer of a multilaye...
- Patent number 9,759,546
- Issue date Sep 12, 2017
- Soitec
- Oleg Kononchuk
- G02 - OPTICS
Information Patent Grant
Pinned photodiode with a low dark current
- Patent number 9,711,550
- Issue date Jul 18, 2017
- STMicroelectronics S.A.
- Laurent Favennec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Front-side imager having a reduced dark current on SOI substrate
- Patent number 9,704,903
- Issue date Jul 11, 2017
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imager having a reduced dark current through an increased bulk dopi...
- Patent number 9,312,408
- Issue date Apr 12, 2016
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for producing at least one deep trench isolation
- Patent number 8,975,154
- Issue date Mar 10, 2015
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for protection of a layer of a vertical stack and correspond...
- Patent number 8,975,730
- Issue date Mar 10, 2015
- STMicroelectronics (Crolles 2) SAS
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for depositing a silicon oxide layer of same thickness on si...
- Patent number 8,603,887
- Issue date Dec 10, 2013
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microelectronic device, in particular back side illuminated image s...
- Patent number 8,524,522
- Issue date Sep 3, 2013
- STMicroelectronics S.A.
- Michel Marty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Realization of self-positioned contacts by epitaxy
- Patent number 8,168,536
- Issue date May 1, 2012
- STMicroeletronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for forming a silicon-based single-crystal portion
- Patent number 8,158,495
- Issue date Apr 17, 2012
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for integrating silicon-on-nothing devices with standard CMO...
- Patent number 7,906,381
- Issue date Mar 15, 2011
- STMicroelectronics S.A.
- Nicolas Loubet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor with a channel comprising germanium
- Patent number 7,892,927
- Issue date Feb 22, 2011
- STMicroelectronics S.A.
- Stephane Monfray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for etching silicon-germanium in the presence of silicon
- Patent number 7,776,745
- Issue date Aug 17, 2010
- STMicroelectronics S.A.
- Nicolas Loubet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming silicon wells of different crystallographic orie...
- Patent number 7,776,679
- Issue date Aug 17, 2010
- STMicroelectronics Crolles 2 SAS
- Nicolas Loubet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Forming of a single-crystal semiconductor layer portion separated f...
- Patent number 7,622,368
- Issue date Nov 24, 2009
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vibratory beam electromechanical resonator
- Patent number 6,873,088
- Issue date Mar 29, 2005
- STMicroelectronics S.A.
- Thomas Skotnicki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Emission process for a single photon, corresponding semiconducting...
- Patent number 6,852,993
- Issue date Feb 8, 2005
- STMicroelectronics S.A.
- Stéphane Monfray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of epitaxy on a silicon substrate comprising areas heavily d...
- Patent number 6,776,842
- Issue date Aug 17, 2004
- STMicroelectronics S.A.
- Didier Dutartre
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of manufacturing a bipolar transistor of double-polysilicon,...
- Patent number 6,744,080
- Issue date Jun 1, 2004
- STMicroelectronics S.A.
- Alain Chantre
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT COMPRISING A SUBSTRATE EQUIPPED WITH A TRAP-RICH...
- Publication number 20240274552
- Publication date Aug 15, 2024
- STMicroelectronics (Crolles 2) SAS
- Didier DUTARTRE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING MICROLENSES
- Publication number 20230361151
- Publication date Nov 9, 2023
- STMicroelectronics (Crolles 2) SAS
- Jonathan Fantuz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED OPTICAL SENSOR OF THE SINGLE-PHOTON AVALANCHE PHOTODIODE...
- Publication number 20230197868
- Publication date Jun 22, 2023
- STMicroelectronics (Crolles 2) SAS
- Didier DUTARTRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR CHIP MANUFACTURING METHOD
- Publication number 20220352028
- Publication date Nov 3, 2022
- STMicroelectronics S.r.l
- Pierpaolo MONGE ROFFARELLO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED OPTICAL SENSOR WITH PINNED PHOTODIODES
- Publication number 20210376170
- Publication date Dec 2, 2021
- STMicroelectronics (Crolles 2) SAS
- Didier DUTARTRE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT COMPRISING A SUBSTRATE EQUIPPED WITH A TRAP-RICH...
- Publication number 20210327834
- Publication date Oct 21, 2021
- STMicroelectronics (Crolles 2) SAS
- Didier DUTARTRE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING AN ELECTRICAL CONTACT BETWEEN A SEMICONDUCTOR FI...
- Publication number 20210233811
- Publication date Jul 29, 2021
- STMicroelectronics S.A.
- Didier DUTARTRE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED OPTICAL SENSOR OF THE SINGLE-PHOTON AVALANCHE PHOTODIODE...
- Publication number 20210151616
- Publication date May 20, 2021
- STMicroelectronics (Crolles 2) SAS
- Didier DUTARTRE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT COMPRISING A SUBSTRATE EQUIPPED WITH A TRAP-RICH...
- Publication number 20190267335
- Publication date Aug 29, 2019
- STMicroelectronics (Crolles 2) SAS
- Didier DUTARTRE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING AN ELECTRICAL CONTACT BETWEEN A SEMICONDUCTOR FI...
- Publication number 20190244857
- Publication date Aug 8, 2019
- STMicroelectronics (Crolles 2) SAS
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CELL COMPRISING A PHASE-CHANGE MATERIAL
- Publication number 20190131521
- Publication date May 2, 2019
- STMicroelectronics (Crolles 2) SAS
- Pierre MORIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CELL COMPRISING A PHASE-CHANGE MATERIAL
- Publication number 20190131520
- Publication date May 2, 2019
- STMicroelectronics (Crolles 2) SAS
- Pierre MORIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SPAD CELL
- Publication number 20180374983
- Publication date Dec 27, 2018
- STMicroelectronics (Crolles 2) SAS
- Dominique GOLANSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURE OF A SEMICONDUCTOR WAFER SUITABLE FOR THE MA...
- Publication number 20180166318
- Publication date Jun 14, 2018
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GAS-PHASE DEPOSITION BY EPITAXY
- Publication number 20180096844
- Publication date Apr 5, 2018
- STMicroelectronics S.A.
- Didier Dutartre
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR FORMING AN ELECTRICAL CONTACT BETWEEN A SEMICONDUCTOR FI...
- Publication number 20170294379
- Publication date Oct 12, 2017
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Front-Side Imager Having a Reduced Dark Current on a SOI Substrate
- Publication number 20170271392
- Publication date Sep 21, 2017
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING STRAINED MOS TRANSISTORS
- Publication number 20170194498
- Publication date Jul 6, 2017
- STMicroelectronics (Crolles 2) SAS
- Remy Berthelon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURE OF A SEMICONDUCTOR WAFER SUITABLE FOR THE MA...
- Publication number 20170103913
- Publication date Apr 13, 2017
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING A TRANSISTOR WITH A RAISED SOURCE-DRAIN STRU...
- Publication number 20160181382
- Publication date Jun 23, 2016
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FRONT-SIDE IMAGER HAVING A REDUCED DARK CURRENT ON SOI SUBSTRATE
- Publication number 20160118431
- Publication date Apr 28, 2016
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PINNED PHOTODIODE WITH A LOW DARK CURRENT
- Publication number 20160104729
- Publication date Apr 14, 2016
- STMicroelectronics S.A.
- Laurent Favennec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGER HAVING A REDUCED DARK CURRENT THROUGH AN INCREASED BULK DOPI...
- Publication number 20150364520
- Publication date Dec 17, 2015
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING THICKNESS VARIATIONS IN A LAYER OF A MULTILAYE...
- Publication number 20150300809
- Publication date Oct 22, 2015
- SOITEC
- Oleg Kononchuk
- G02 - OPTICS
Information Patent Application
METHOD FOR FORMING COMPONENTS ON A SILICON-GERMANIUM LAYER
- Publication number 20140363953
- Publication date Dec 11, 2014
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR PRODUCING AT LEAST ONE DEEP TRENCH ISOLATION
- Publication number 20130095636
- Publication date Apr 18, 2013
- STMicroelectronics (Crolles 2) SAS
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROTECTION OF A LAYER OF A VERTICAL STACK AND CORRESPOND...
- Publication number 20130075870
- Publication date Mar 28, 2013
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DEPOSITING A SILICON OXIDE LAYER OF SAME THICKNESS ON SI...
- Publication number 20130072032
- Publication date Mar 21, 2013
- STMicroelectronics S.A.
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR FORMING AN EPITAXIAL LAYER, IN PARTICULAR ON THE SOURCE...
- Publication number 20120252174
- Publication date Oct 4, 2012
- STMICROELECTRONICS (CROLLES 2) SAS
- Didier Dutartre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROELECTRONIC DEVICE, IN PARTICULAR BACK SIDE ILLUMINATED IMAGE S...
- Publication number 20110140220
- Publication date Jun 16, 2011
- STMicroelectronics S.A.
- Michel Marty
- H01 - BASIC ELECTRIC ELEMENTS

Didier Dutartre

Person

Patents Grantslast 30 patents

Semiconductor chip manufacturing method

Integrated circuit comprising a substrate equipped with a trap-rich...

Integrated optical sensor with pinned photodiodes

Method for forming an electrical contact between a semiconductor fi...

Integrated circuit comprising a substrate equipped with a trap-rich...

Method for forming an electrical contact between a semiconductor fi...

Memory cell comprising a phase-change material

Method for manufacture of a semiconductor wafer suitable for the ma...

Method for forming an electrical contact between a semiconductor fi...

Method of forming strained MOS transistors

Method for manufacture of a semiconductor wafer suitable for the ma...

Method for measuring thickness variations in a layer of a multilaye...

Pinned photodiode with a low dark current

Front-side imager having a reduced dark current on SOI substrate

Imager having a reduced dark current through an increased bulk dopi...

Process for producing at least one deep trench isolation

Method for protection of a layer of a vertical stack and correspond...

Method for depositing a silicon oxide layer of same thickness on si...

Microelectronic device, in particular back side illuminated image s...

Realization of self-positioned contacts by epitaxy

Process for forming a silicon-based single-crystal portion

Method for integrating silicon-on-nothing devices with standard CMO...

Transistor with a channel comprising germanium

Method for etching silicon-germanium in the presence of silicon

Method for forming silicon wells of different crystallographic orie...

Forming of a single-crystal semiconductor layer portion separated f...

Vibratory beam electromechanical resonator

Emission process for a single photon, corresponding semiconducting...

Method of epitaxy on a silicon substrate comprising areas heavily d...

Method of manufacturing a bipolar transistor of double-polysilicon,...

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT COMPRISING A SUBSTRATE EQUIPPED WITH A TRAP-RICH...

METHOD FOR MANUFACTURING MICROLENSES

INTEGRATED OPTICAL SENSOR OF THE SINGLE-PHOTON AVALANCHE PHOTODIODE...

SEMICONDUCTOR CHIP MANUFACTURING METHOD

INTEGRATED OPTICAL SENSOR WITH PINNED PHOTODIODES

INTEGRATED CIRCUIT COMPRISING A SUBSTRATE EQUIPPED WITH A TRAP-RICH...

METHOD FOR FORMING AN ELECTRICAL CONTACT BETWEEN A SEMICONDUCTOR FI...

INTEGRATED OPTICAL SENSOR OF THE SINGLE-PHOTON AVALANCHE PHOTODIODE...

INTEGRATED CIRCUIT COMPRISING A SUBSTRATE EQUIPPED WITH A TRAP-RICH...

METHOD FOR FORMING AN ELECTRICAL CONTACT BETWEEN A SEMICONDUCTOR FI...

MEMORY CELL COMPRISING A PHASE-CHANGE MATERIAL

MEMORY CELL COMPRISING A PHASE-CHANGE MATERIAL

METHOD OF MANUFACTURING A SPAD CELL

METHOD FOR MANUFACTURE OF A SEMICONDUCTOR WAFER SUITABLE FOR THE MA...

METHOD OF GAS-PHASE DEPOSITION BY EPITAXY

METHOD FOR FORMING AN ELECTRICAL CONTACT BETWEEN A SEMICONDUCTOR FI...

Front-Side Imager Having a Reduced Dark Current on a SOI Substrate

METHOD OF FORMING STRAINED MOS TRANSISTORS

METHOD FOR MANUFACTURE OF A SEMICONDUCTOR WAFER SUITABLE FOR THE MA...

METHOD FOR FABRICATING A TRANSISTOR WITH A RAISED SOURCE-DRAIN STRU...

FRONT-SIDE IMAGER HAVING A REDUCED DARK CURRENT ON SOI SUBSTRATE

PINNED PHOTODIODE WITH A LOW DARK CURRENT

IMAGER HAVING A REDUCED DARK CURRENT THROUGH AN INCREASED BULK DOPI...

METHOD FOR MEASURING THICKNESS VARIATIONS IN A LAYER OF A MULTILAYE...

METHOD FOR FORMING COMPONENTS ON A SILICON-GERMANIUM LAYER

PROCESS FOR PRODUCING AT LEAST ONE DEEP TRENCH ISOLATION

METHOD FOR PROTECTION OF A LAYER OF A VERTICAL STACK AND CORRESPOND...

METHOD FOR DEPOSITING A SILICON OXIDE LAYER OF SAME THICKNESS ON SI...

PROCESS FOR FORMING AN EPITAXIAL LAYER, IN PARTICULAR ON THE SOURCE...

MICROELECTRONIC DEVICE, IN PARTICULAR BACK SIDE ILLUMINATED IMAGE S...