Dimitri Linten

Person

Boortmeerbeek, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and a method for forming a semiconductor device
- Patent number 11,362,195
- Issue date Jun 14, 2022
- Imec VZW
- Shih-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET having locally higher fin-to-fin pitch
- Patent number 11,114,435
- Issue date Sep 7, 2021
- Imec VZW
- Geert Hellings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage tolerant LDMOS
- Patent number 10,680,098
- Issue date Jun 9, 2020
- Imec VZW
- Shih-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-step interconnect testing of semiconductor dies
- Patent number 9,678,142
- Issue date Jun 13, 2017
- IMEC
- Julien Ryckaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection
- Patent number 9,391,060
- Issue date Jul 12, 2016
- Imec VZW
- Geert Hellings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device comprising a diode and a method for producing...
- Patent number 9,263,401
- Issue date Feb 16, 2016
- IMEC
- Geert Hellings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection devices
- Patent number 9,087,849
- Issue date Jul 21, 2015
- Imec VZW
- Shih-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for providing wideband electrostatic discharge protection an...
- Patent number 8,508,893
- Issue date Aug 13, 2013
- IMEC
- Steven Thijs
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for calibrating a transmission line pulse test system
- Patent number 8,339,146
- Issue date Dec 25, 2012
- IMEC
- Philippe Roussel
- G01 - MEASURING TESTING
Information Patent Grant
Design methodology for MuGFET ESD protection devices
- Patent number 7,923,266
- Issue date Apr 12, 2011
- IMEC
- Steven Thijs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for calibrating an electrostatic discharge tester
- Patent number 7,821,272
- Issue date Oct 26, 2010
- IMEC
- Mirko Scholz
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic discharge protected circuits
- Patent number 7,649,722
- Issue date Jan 19, 2010
- Interuniversitair Microelektronica Centrum (IMEC)
- Steven Thijs
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Device and a Method for Forming a Semiconductor Device
- Publication number 20200212199
- Publication date Jul 2, 2020
- IMEC vzw
- Shih-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET HAVING LOCALLY HIGHER FIN-TO-FIN PITCH
- Publication number 20170207217
- Publication date Jul 20, 2017
- IMEC vzw
- Geert HELLINGS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE TOLERANT LDMOS
- Publication number 20170194487
- Publication date Jul 6, 2017
- IMEC vzw
- Shih-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO-STEP INTERCONNECT TESTING OF SEMICONDUCTOR DIES
- Publication number 20140300379
- Publication date Oct 9, 2014
- IMEC
- Julien RYCKAERT
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE COMPRISING A DIODE AND A METHOD FOR PRODUCING...
- Publication number 20140124894
- Publication date May 8, 2014
- IMEC
- Geert Hellings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
N-Channel Laterally Diffused Metal-Oxide-Semiconductor Device
- Publication number 20130161750
- Publication date Jun 27, 2013
- Katholieke Universiteit Leuven, K.U.Leuven R&D
- Shih-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Providing Wideband Electrostatic Discharge Protection a...
- Publication number 20110051300
- Publication date Mar 3, 2011
- IMEC
- Steven Thijs
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method for Designing Integrated Electronic Circuits Having Electros...
- Publication number 20110051301
- Publication date Mar 3, 2011
- IMEC
- Steven Thijs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Calibrating a Transmission Line Pulse Test System
- Publication number 20100156447
- Publication date Jun 24, 2010
- IMEC
- Philippe Roussel
- G01 - MEASURING TESTING
Information Patent Application
Bidirectional ESD Power Clamp
- Publication number 20100142105
- Publication date Jun 10, 2010
- IMEC
- Dimitri Linten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Design Methodology for MuGFET ESD Protection Devices
- Publication number 20090280582
- Publication date Nov 12, 2009
- Interuniversitair Microelektronica Centrum
- Steven Thijs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Calibrating an Electrostatic Discharge Tester
- Publication number 20090027063
- Publication date Jan 29, 2009
- Interuniversitair Microelektronica Centrum (IMEC)
- Mirko Scholz
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic discharge protected circuits
- Publication number 20070058308
- Publication date Mar 15, 2007
- Interuniversitair Microelektronica Centrum (IMEC)
- Steven Thijs
- H03 - BASIC ELECTRONIC CIRCUITRY

Dimitri Linten

Person

Patents Grantslast 30 patents

Semiconductor device and a method for forming a semiconductor device

FinFET having locally higher fin-to-fin pitch

High voltage tolerant LDMOS

Two-step interconnect testing of semiconductor dies

Electrostatic discharge protection

Semiconductor device comprising a diode and a method for producing...

Electrostatic discharge protection devices

Method for providing wideband electrostatic discharge protection an...

Method for calibrating a transmission line pulse test system

Design methodology for MuGFET ESD protection devices

Method for calibrating an electrostatic discharge tester

Electrostatic discharge protected circuits

Patents Applicationslast 30 patents

Semiconductor Device and a Method for Forming a Semiconductor Device

FINFET HAVING LOCALLY HIGHER FIN-TO-FIN PITCH

HIGH VOLTAGE TOLERANT LDMOS

TWO-STEP INTERCONNECT TESTING OF SEMICONDUCTOR DIES

SEMICONDUCTOR DEVICE COMPRISING A DIODE AND A METHOD FOR PRODUCING...

N-Channel Laterally Diffused Metal-Oxide-Semiconductor Device

Method for Providing Wideband Electrostatic Discharge Protection a...

Method for Designing Integrated Electronic Circuits Having Electros...

Method for Calibrating a Transmission Line Pulse Test System

Bidirectional ESD Power Clamp

Design Methodology for MuGFET ESD Protection Devices

Method for Calibrating an Electrostatic Discharge Tester

Electrostatic discharge protected circuits