Dirch H. Petersen

Person

Dyssegard, DK

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring temperature-modulated properties of a test sample
- Patent number 11,740,279
- Issue date Aug 29, 2023
- KLA Corporation
- Dirch Hjorth Petersen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position correction method and a system for position correction in...
- Patent number 11,131,700
- Issue date Sep 28, 2021
- CAPRES A/S
- Frederik Westergaard Osterberg
- G01 - MEASURING TESTING
Information Patent Grant
Single-position hall effect measurements
- Patent number 9,644,939
- Issue date May 9, 2017
- Capres A/S
- Fei Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining an electrical property of a test sample
- Patent number 8,907,690
- Issue date Dec 9, 2014
- Capres A/S
- Dirch H. Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing electrical properties of a test sample
- Patent number 8,310,258
- Issue date Nov 13, 2012
- Capres A/S
- Dirch Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Device including a contact detector
- Patent number 8,058,886
- Issue date Nov 15, 2011
- Capres A/S
- Dirch H. Petersen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Micro-Four-Point Metrology of Joule-Heating-Induced Modulation of T...
- Publication number 20210333228
- Publication date Oct 28, 2021
- KLA Corporation
- Dirch Hjorth Petersen
- G01 - MEASURING TESTING
Information Patent Application
Measuring Temperature-Modulated Properties of a Test Sample
- Publication number 20210333316
- Publication date Oct 28, 2021
- KLA Corporation
- Dirch Hjorth Petersen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE FOR TESTING AN ELECTRICAL PROPERTY OF A TEST SAMPLE
- Publication number 20200278380
- Publication date Sep 3, 2020
- Frederik Westergaard Østerberg
- G01 - MEASURING TESTING
Information Patent Application
A POSITION CORRECTION METHOD AND A SYSTEM FOR POSITION CORRECTION I...
- Publication number 20190310295
- Publication date Oct 10, 2019
- CAPRES A/S
- Frederik Westergaard Osterberg
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-POSITION HALL EFFECT MEASUREMENTS
- Publication number 20140015552
- Publication date Jan 16, 2014
- Capres A/S
- Fei Wang
- G01 - MEASURING TESTING
Information Patent Application
MULTI-POINT PROBE FOR TESTING ELECTRICAL PROPERTIES AND A METHOD OF...
- Publication number 20110285416
- Publication date Nov 24, 2011
- Dirch H. Petersen
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING AN ELECTRICAL PROPERTY OF A TEST SAMPLE
- Publication number 20100271059
- Publication date Oct 28, 2010
- Dirch H. Petersen
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INCLUDING A CONTACT DETECTOR
- Publication number 20100141291
- Publication date Jun 10, 2010
- Dirch H. Petersen
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING ELECTRICAL PROPERTIES OF A TEST SAMPLE
- Publication number 20090219047
- Publication date Sep 3, 2009
- CAPRES A/S
- Dirch Petersen
- G01 - MEASURING TESTING

Dirch H. Petersen

Person

Patents Grantslast 30 patents

Measuring temperature-modulated properties of a test sample

Position correction method and a system for position correction in...

Single-position hall effect measurements

Method of determining an electrical property of a test sample

Probe for testing electrical properties of a test sample

Device including a contact detector

Patents Applicationslast 30 patents

Micro-Four-Point Metrology of Joule-Heating-Induced Modulation of T...

Measuring Temperature-Modulated Properties of a Test Sample

PROBE FOR TESTING AN ELECTRICAL PROPERTY OF A TEST SAMPLE

A POSITION CORRECTION METHOD AND A SYSTEM FOR POSITION CORRECTION I...

SINGLE-POSITION HALL EFFECT MEASUREMENTS

MULTI-POINT PROBE FOR TESTING ELECTRICAL PROPERTIES AND A METHOD OF...

METHOD OF DETERMINING AN ELECTRICAL PROPERTY OF A TEST SAMPLE

DEVICE INCLUDING A CONTACT DETECTOR

PROBE FOR TESTING ELECTRICAL PROPERTIES OF A TEST SAMPLE