Dmitry E. GRINFELD

Person

Bremen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charge detection mass spectrometry utilizing harmonic oscillation a...
- Patent number 12,051,579
- Issue date Jul 30, 2024
- Thermo Finnigan LLC.
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of gain calibration
- Patent number 11,996,277
- Issue date May 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap
- Patent number 11,990,329
- Issue date May 21, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage supply for a mass analyser
- Patent number 11,972,938
- Issue date Apr 30, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection to an electrostatic trap
- Patent number 11,842,892
- Issue date Dec 12, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail Belov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer and method of mass spectrometry
- Patent number 11,387,094
- Issue date Jul 12, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection to an electrostatic trap
- Patent number 11,328,922
- Issue date May 10, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail Belov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion front tilt correction for time of flight (TOF) mass spectrometer
- Patent number 11,158,494
- Issue date Oct 26, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflection mass spectrometer
- Patent number 10,964,520
- Issue date Mar 30, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for obtaining enhanced mass spectrometric data
- Patent number 10,840,073
- Issue date Nov 17, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Konstantin Aizikov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of producing a mass spectrum
- Patent number 10,755,907
- Issue date Aug 25, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Konstantin Aizikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for time-of-flight mass spectrometry
- Patent number 10,727,039
- Issue date Jul 28, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Stewart Hamish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam mass pre-separator
- Patent number 10,510,525
- Issue date Dec 17, 2019
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry E. Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflection mass spectrometer
- Patent number 10,276,361
- Issue date Apr 30, 2019
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam mass pre-separator
- Patent number 10,199,208
- Issue date Feb 5, 2019
- Thermo Finnigan LLC.
- Dmitry E. Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflection mass spectrometer with deceleration stage
- Patent number 10,141,176
- Issue date Nov 27, 2018
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflection mass spectrometer
- Patent number 9,679,758
- Issue date Jun 13, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflection mass spectrometer
- Patent number 9,673,033
- Issue date Jun 6, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multireflection time-of-flight mass spectrometer
- Patent number 9,620,350
- Issue date Apr 11, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion ejection from a quadrupole ion trap
- Patent number 9,548,195
- Issue date Jan 17, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Christian Albrecht Hock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide
- Patent number 9,536,722
- Issue date Jan 3, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multireflection time-of-flight mass spectrometer
- Patent number 9,324,553
- Issue date Apr 26, 2016
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion ejection from a quadrupole ion trap
- Patent number 9,312,114
- Issue date Apr 12, 2016
- Thermo Fisher Scientific (Bremen) GmbH
- Christian Albrecht Hock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflection mass spectrometer
- Patent number 9,136,101
- Issue date Sep 15, 2015
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflection mass spectrometer
- Patent number 9,136,102
- Issue date Sep 15, 2015
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multireflection time-of-flight mass spectrometer
- Patent number 9,082,605
- Issue date Jul 14, 2015
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multireflection time-of-flight mass spectrometer
- Patent number 8,674,293
- Issue date Mar 18, 2014
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY WITH TEMP...
- Publication number 20240371621
- Publication date Nov 7, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap with Elongated Electrodes
- Publication number 20240331996
- Publication date Oct 3, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Jan-Peter Hauschild
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER
- Publication number 20240312775
- Publication date Sep 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Focusing
- Publication number 20240249930
- Publication date Jul 25, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Voltage Supply for a Mass Analyser
- Publication number 20240249931
- Publication date Jul 25, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE ION GUIDE
- Publication number 20240203718
- Publication date Jun 20, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Ralf Günter HARTMER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL INSTRUMENT WITH ION TRAP COUPLED TO MASS ANALYSER
- Publication number 20240087876
- Publication date Mar 14, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Ion Trap Configuration
- Publication number 20240071741
- Publication date Feb 29, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSER AND METHOD OF TIME OF FLIGHT MASS SPEC...
- Publication number 20240055250
- Publication date Feb 15, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DETECTION FOR ION ACCUMULATION CONTROL
- Publication number 20230360901
- Publication date Nov 9, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Ralf Günter Hartmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Disambiguation of cyclic ion analyser spectra
- Publication number 20230324336
- Publication date Oct 12, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MIRROR
- Publication number 20230326734
- Publication date Oct 12, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry GRINFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analysis of time-of-flight mass spectra
- Publication number 20230317441
- Publication date Oct 5, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Bernd Hagedorn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High resolution multi-reflection time-of-flight mass analyser
- Publication number 20230290629
- Publication date Sep 14, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion accumulation control for analytical instrument
- Publication number 20230282471
- Publication date Sep 7, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Correcting Mass Spectral Data
- Publication number 20230131302
- Publication date Apr 27, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Transport between Ion Optical Devices at Different Gas Pressures
- Publication number 20230118221
- Publication date Apr 20, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS ANALYSERS
- Publication number 20220415640
- Publication date Dec 29, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Christian Hock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Voltage supply for a mass analyser
- Publication number 20220392759
- Publication date Dec 8, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GAIN CALIBRATION
- Publication number 20220367165
- Publication date Nov 17, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP
- Publication number 20220319828
- Publication date Oct 6, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...
- Publication number 20220246414
- Publication date Aug 4, 2022
- Thermo Finnigan LLC
- Michael W. SENKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION INJECTION TO AN ELECTROSTATIC TRAP
- Publication number 20220238321
- Publication date Jul 28, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail BELOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time of Flight Mass Spectrometer and Method Of Mass Spectrometry
- Publication number 20210272790
- Publication date Sep 2, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap with Elongated Electrodes
- Publication number 20200373146
- Publication date Nov 26, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Jan-Peter Hauschild
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20200357625
- Publication date Nov 12, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflection Mass Spectrometer
- Publication number 20200243322
- Publication date Jul 30, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion front tilt correction for Time of Flight (TOF) mass spectrometer
- Publication number 20190362955
- Publication date Nov 28, 2019
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Mass Pre-Separator
- Publication number 20190164738
- Publication date May 30, 2019
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry E. GRINFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20180366312
- Publication date Dec 20, 2018
- Thermo Fisher Scientific (Bremen) GmbH
- Stewart HAMISH
- H01 - BASIC ELECTRIC ELEMENTS

Dmitry E. GRINFELD

Person

Patents Grantslast 30 patents

Charge detection mass spectrometry utilizing harmonic oscillation a...

Method of gain calibration

Ion trap

Voltage supply for a mass analyser

Ion injection to an electrostatic trap

Time of flight mass spectrometer and method of mass spectrometry

Ion injection to an electrostatic trap

Ion front tilt correction for time of flight (TOF) mass spectrometer

Multi-reflection mass spectrometer

Methods and apparatus for obtaining enhanced mass spectrometric data

Method of producing a mass spectrum

Mass spectrometer and method for time-of-flight mass spectrometry

Ion beam mass pre-separator

Multi-reflection mass spectrometer

Ion beam mass pre-separator

Multi-reflection mass spectrometer with deceleration stage

Multi-reflection mass spectrometer

Multi-reflection mass spectrometer

Multireflection time-of-flight mass spectrometer

Ion ejection from a quadrupole ion trap

Ion guide

Multireflection time-of-flight mass spectrometer

Ion ejection from a quadrupole ion trap

Multi-reflection mass spectrometer

Multi-reflection mass spectrometer

Multireflection time-of-flight mass spectrometer

Multireflection time-of-flight mass spectrometer

Patents Applicationslast 30 patents

METHODS FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY WITH TEMP...

Ion Trap with Elongated Electrodes

COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER

Ion Beam Focusing

Voltage Supply for a Mass Analyser

INTERFACE ION GUIDE

ANALYTICAL INSTRUMENT WITH ION TRAP COUPLED TO MASS ANALYSER

Electrostatic Ion Trap Configuration

TIME OF FLIGHT MASS ANALYSER AND METHOD OF TIME OF FLIGHT MASS SPEC...

CHARGE DETECTION FOR ION ACCUMULATION CONTROL

Disambiguation of cyclic ion analyser spectra

ION MIRROR

Analysis of time-of-flight mass spectra

High resolution multi-reflection time-of-flight mass analyser

Ion accumulation control for analytical instrument

Method for Correcting Mass Spectral Data

Ion Transport between Ion Optical Devices at Different Gas Pressures

TIME-OF-FLIGHT MASS ANALYSERS

Voltage supply for a mass analyser

METHOD OF GAIN CALIBRATION

ION TRAP

CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...

ION INJECTION TO AN ELECTROSTATIC TRAP

Time of Flight Mass Spectrometer and Method Of Mass Spectrometry

Ion Trap with Elongated Electrodes

MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY

Multi-Reflection Mass Spectrometer

Ion front tilt correction for Time of Flight (TOF) mass spectrometer

Ion Beam Mass Pre-Separator

MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY