Do-Hoon Byun

Person

Kyunggi-do, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method of programming one-time programmable (OTP) memory device and...
- Patent number 9,754,678
- Issue date Sep 5, 2017
- Samsung Electronics Co., Ltd.
- Do-Hoon Byun
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems for testing a plurality of circuit devices
- Patent number 6,943,576
- Issue date Sep 13, 2005
- Samsung Electronics Co., Ltd.
- Do-hoon Byun
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatuses for semiconductor integrated circuits
- Patent number 6,753,693
- Issue date Jun 22, 2004
- Samsung Electronics Co., Ltd.
- Ki-Myung Seo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR CHIP AND TEST METHOD OF THE SAME
- Publication number 20230176112
- Publication date Jun 8, 2023
- Samsung Electronics Co., Ltd.
- Yeon Ho Jung
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CI...
- Publication number 20230097976
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Yeon Ho Jung
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD OF PROGRAMMING ONE-TIME PROGRAMMABLE (OTP) MEMORY DEVICE AND...
- Publication number 20170040067
- Publication date Feb 9, 2017
- Samsung Electronics Co., Ltd.
- Do-Hoon Byun
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR TEST SYSTEM CAPABLE OF VIRTUAL TEST AND SEMICONDUCTOR...
- Publication number 20080068036
- Publication date Mar 20, 2008
- Byong-Hui Yun
- G01 - MEASURING TESTING
Information Patent Application
Methods for testing a plurality of semiconductor devices in paralle...
- Publication number 20070061659
- Publication date Mar 15, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Byong-Hui Yun
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for controlling device power supply in semicon...
- Publication number 20060126248
- Publication date Jun 15, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Seung-Chul Choi
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for testing a plurality of circuit devices
- Publication number 20030155941
- Publication date Aug 21, 2003
- Do-Hoon Byun
- G01 - MEASURING TESTING
Information Patent Application
Test apparatuses for semiconductor integrated circuits
- Publication number 20030102882
- Publication date Jun 5, 2003
- Ki-Myung Seo
- G01 - MEASURING TESTING

Do-Hoon Byun

Person

Patents Grantslast 30 patents

Method of programming one-time programmable (OTP) memory device and...

Systems for testing a plurality of circuit devices

Test apparatuses for semiconductor integrated circuits

Patents Applicationslast 30 patents

SEMICONDUCTOR CHIP AND TEST METHOD OF THE SAME

INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CI...

METHOD OF PROGRAMMING ONE-TIME PROGRAMMABLE (OTP) MEMORY DEVICE AND...

SEMICONDUCTOR TEST SYSTEM CAPABLE OF VIRTUAL TEST AND SEMICONDUCTOR...

Methods for testing a plurality of semiconductor devices in paralle...

Method and apparatus for controlling device power supply in semicon...

Systems and methods for testing a plurality of circuit devices

Test apparatuses for semiconductor integrated circuits