TREA

Donald A. Marx

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  • Olathe, KS, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Series connector
    • Patent number 9,437,954
    • Issue date Sep 6, 2016
    • Interconnect Devices, Inc.
    • Timothy E. Marshall
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Connectors
    • Patent number 9,373,909
    • Issue date Jun 21, 2016
    • Hypertronics Corporation
    • David E. Salomon
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Connector
    • Patent number D743340
    • Issue date Nov 17, 2015
    • Hypertronics Corporation
    • Timothy E. Marshall
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Adjustable test socket
    • Patent number 8,062,039
    • Issue date Nov 22, 2011
    • Interconnect Devices, Inc.
    • Jason W. Farris
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Adjustable test socket
    • Patent number 7,581,962
    • Issue date Sep 1, 2009
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe array wafer
    • Patent number 7,498,826
    • Issue date Mar 3, 2009
    • Interconnect Devices, Inc.
    • Eric L. Bogatin
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Dual tapered spring probe
    • Patent number 7,154,286
    • Issue date Dec 26, 2006
    • Interconnect Devices, Inc.
    • Donald A. Marx
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CONNECTORS
    • Publication number 20150372414
    • Publication date Dec 24, 2015
    • Hypertronics Corporation
    • David E. Salomon
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SERIES CONNECTOR
    • Publication number 20140322988
    • Publication date Oct 30, 2014
    • INTERCONNECT DEVICES, INC.
    • Timothy E. Marshall
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ADJUSTABLE TEST SOCKET
    • Publication number 20090227125
    • Publication date Sep 10, 2009
    • INTERCONNECT DEVICES, INC.
    • Jason W. Farris
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe array wafer
    • Publication number 20080068034
    • Publication date Mar 20, 2008
    • Eric L. Bogatin
    • G01 - MEASURING TESTING
  • Information Patent Application

    Adjustable test socket
    • Publication number 20070285106
    • Publication date Dec 13, 2007
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    DUAL TAPERED SPRING PROBE
    • Publication number 20070001695
    • Publication date Jan 4, 2007
    • Donald A. Marx
    • G01 - MEASURING TESTING