Donald E. Davis

Person

Wappingers Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reticle having a number of subfields
- Patent number 5,523,580
- Issue date Jun 4, 1996
- International Business Machines Corporation
- Donald E. Davis
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Registration of patterns formed of multiple fields
- Patent number 5,301,124
- Issue date Apr 5, 1994
- International Business Machines Corporation
- Ken T. Chan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tri-deflection electron beam system
- Patent number 4,945,246
- Issue date Jul 31, 1990
- International Business Machines Corporation
- Donald E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam writing method and system using large range deflectio...
- Patent number 4,818,885
- Issue date Apr 4, 1989
- International Business Machines Corporation
- Donald E. Davis
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-Y Positioning subsystem electronics
- Patent number 4,456,860
- Issue date Jun 26, 1984
- IBM Corporation
- George W. Cann
- G05 - CONTROLLING REGULATING
Information Patent Grant
Pattern inspection tool - method and apparatus
- Patent number 4,365,163
- Issue date Dec 21, 1982
- International Business Machines Corporation
- Donald E. Davis
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automatic overlay measurements using an electronic beam system as a...
- Patent number 4,149,085
- Issue date Apr 10, 1979
- International Business Machines Corporation
- Donald E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detecting registration marks on a target such as a se...
- Patent number 4,056,730
- Issue date Nov 1, 1977
- International Business Machines Corporation
- Donald E. Davis
- H01 - BASIC ELECTRIC ELEMENTS

Donald E. Davis

Person

Patents Grantslast 30 patents

Reticle having a number of subfields

Registration of patterns formed of multiple fields

Tri-deflection electron beam system

Electron beam writing method and system using large range deflectio...

X-Y Positioning subsystem electronics

Pattern inspection tool - method and apparatus

Automatic overlay measurements using an electronic beam system as a...

Apparatus for detecting registration marks on a target such as a se...