Donghun Kang

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Non-volatile memory device employing a deep trench capacitor
- Patent number 10,083,967
- Issue date Sep 25, 2018
- GLOBALFOUNDRIES Inc.
- Eduard A. Cartier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitance monitoring using x-ray diffraction
- Patent number 10,008,421
- Issue date Jun 26, 2018
- International Business Machines Corporation
- Donghun Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer stress control and topography compensation
- Patent number 9,997,348
- Issue date Jun 12, 2018
- International Business Machines Corporation
- Timothy A. Brunner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench metal insulator metal capacitor with oxygen gettering layer
- Patent number 9,911,597
- Issue date Mar 6, 2018
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitance monitoring using X-ray diffraction
- Patent number 9,870,960
- Issue date Jan 16, 2018
- International Business Machines Corporation
- Donghun Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory device employing a deep trench capacitor
- Patent number 9,754,945
- Issue date Sep 5, 2017
- GLOBALFOUNDRIES Inc.
- Eduard A. Cartier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench metal-insulator-metal capacitor with oxygen gettering layer
- Patent number 9,653,534
- Issue date May 16, 2017
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer stress control with backside patterning
- Patent number 9,269,607
- Issue date Feb 23, 2016
- GLOBALFOUNDRIES Inc.
- Edward Engbrecht
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CAPACITANCE MONITORING USING X-RAY DIFFRACTION
- Publication number 20180096904
- Publication date Apr 5, 2018
- International Business Machines Corporation
- Donghun Kang
- G01 - MEASURING TESTING
Information Patent Application
WAFER STRESS CONTROL AND TOPOGRAPHY COMPENSATION
- Publication number 20180090307
- Publication date Mar 29, 2018
- International Business Machines Corporation
- Timothy A. Brunner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-VOLATILE MEMORY DEVICE EMPLOYING A DEEP TRENCH CAPACITOR
- Publication number 20170358581
- Publication date Dec 14, 2017
- GLOBALFOUNDRIES INC.
- Eduard A. Cartier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRENCH METAL INSULATOR METAL CAPACITOR WITH OXYGEN GETTERING LAYER
- Publication number 20170250073
- Publication date Aug 31, 2017
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURES WITH DEEP TRENCH CAPACITOR AND METHODS OF...
- Publication number 20160181249
- Publication date Jun 23, 2016
- International Business Machines Corporation
- Guillaume D. BRIEND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITANCE MONITORING USING X-RAY DIFFRACTION
- Publication number 20160178679
- Publication date Jun 23, 2016
- International Business Machines Corporation
- Donghun Kang
- G01 - MEASURING TESTING
Information Patent Application
TRENCH METAL-INSULATOR-METAL CAPACITOR WITH OXYGEN GETTERING LAYER
- Publication number 20160181353
- Publication date Jun 23, 2016
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-VOLATILE MEMORY DEVICE EMPLOYING A DEEP TRENCH CAPACITOR
- Publication number 20160043088
- Publication date Feb 11, 2016
- International Business Machines Corporation
- Eduard A. Cartier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER STRESS CONTROL WITH BACKSIDE PATTERNING
- Publication number 20150364362
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Edward Engbrecht
- H01 - BASIC ELECTRIC ELEMENTS

Donghun Kang

Person

Patents Grantslast 30 patents

Non-volatile memory device employing a deep trench capacitor

Capacitance monitoring using x-ray diffraction

Wafer stress control and topography compensation

Trench metal insulator metal capacitor with oxygen gettering layer

Capacitance monitoring using X-ray diffraction

Non-volatile memory device employing a deep trench capacitor

Trench metal-insulator-metal capacitor with oxygen gettering layer

Wafer stress control with backside patterning

Patents Applicationslast 30 patents

CAPACITANCE MONITORING USING X-RAY DIFFRACTION

WAFER STRESS CONTROL AND TOPOGRAPHY COMPENSATION

NON-VOLATILE MEMORY DEVICE EMPLOYING A DEEP TRENCH CAPACITOR

TRENCH METAL INSULATOR METAL CAPACITOR WITH OXYGEN GETTERING LAYER

SEMICONDUCTOR STRUCTURES WITH DEEP TRENCH CAPACITOR AND METHODS OF...

CAPACITANCE MONITORING USING X-RAY DIFFRACTION

TRENCH METAL-INSULATOR-METAL CAPACITOR WITH OXYGEN GETTERING LAYER

NON-VOLATILE MEMORY DEVICE EMPLOYING A DEEP TRENCH CAPACITOR

WAFER STRESS CONTROL WITH BACKSIDE PATTERNING