Dorian Zahorski

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Vanves, FR

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Patents Grantslast 30 patents

Information Patent Grant
Focused beam spectroscopic ellipsometry method and system
- Patent number 6,734,967
- Issue date May 11, 2004
- KLA-Tencor Technologies Corporation
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Grant
High spatial resolution ellipsometry device
- Patent number 5,991,037
- Issue date Nov 23, 1999
- Societe de Production et de Recherches Appliquees
- Jean-Philippe Piel
- G01 - MEASURING TESTING
Information Patent Grant
Focused beam spectroscopic ellipsometry method and system
- Patent number 5,910,842
- Issue date Jun 8, 1999
- KLA-Tencor Corporation
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Grant
Focused beam spectroscopic ellipsometry method and system
- Patent number 5,608,526
- Issue date Mar 4, 1997
- Tencor Instruments
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Focused beam spectroscopic ellipsometry method and system
- Publication number 20050105090
- Publication date May 19, 2005
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Application
Focused beam spectroscopic ellipsometry method and system
- Publication number 20040100632
- Publication date May 27, 2004
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING